المؤلفون: Dieci, D., Menozzi, R., Tomasi, T., Sozzi, G., Lanzieri, C., Canali, C.

المصدر: 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual (Cat. No.00CH37059) Reliability physics Reliability Physics Symposium, 2000. Proceedings. 38th Annual 2000 IEEE International. :258-263 2000

Relation: 2000 IEEE International Reliability Physics Symposium Proceedings. 38th Annual

المؤلفون: Fantini, F., Cattani, L., Dieci, D.

المصدر: 2000 22nd International Conference on Microelectronics. Proceedings (Cat. No.00TH8400) Microelectronics Microelectronics, 2000. Proceedings. 2000 22nd International Conference on. 1:299-310 vol.1 2000

Relation: 2000 22nd International Conference on Microelectronics. Proceedings

المؤلفون: Menozzi, R., Sozzi, G., Tediosi, E., Dieci, D., Lanzieri, C., Canali, C.

المصدر: 2000 GaAs Reliability Workshop. Proceedings (IEEE Cat. No.00TH8513) GaAs reliability workshop GaAs Reliability Workshop, 2000. Proceedings. :101-116 2000

Relation: 2000 GaAs Reliabiltiy Workshop. Proceedings

المؤلفون: Dieci, D., Tomasi, T., Buttari, D., Meneghesso, G., Canali, C., Zanoni, E.

المصدر: 1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO (Cat. No.99TH8401) High performance electron devices for microwave and optoelectronic applications High Performance Electron Devices for Microwave and Optoelectronic Applications, 1999. EDMO. 1999 Symposium on. :93-98 1999

Relation: 1999 Symposium on High Performance Electron Devices for Microwave and Optoelectronic Applications. EDMO

المؤلفون: Cova, P., Menozzi, R., Dieci, D., Canali, C., Pavesi, M., Meneghesso, G.

المصدر: 29th European Solid-State Device Research Conference Solid-State Device Research Conference, 1999. Proceeding of the 29th European. 1:544-547 1999

Relation: 29th European Solid-State Device Research Conference

المؤلفون: Gaddi, R., Menozzi, R., Dieci, D., Lanzieri, C., Meneghesso, G., Canali, C., Zanoni, E.

المصدر: 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual (Cat. No.99CH36296) Reliability physics Reliability Physics Symposium Proceedings, 1999. 37th Annual. 1999 IEEE International. :110-115 1999

Relation: 1999 IEEE International Reliability Physics Symposium Proceedings. 37th Annual

المؤلفون: Menozzi, R., Dieci, D., Sozzi, G., Tomasi, T., Lanzieri, C.

المصدر: 1999 GaAs Reliability Workshop. Proceedings (Cat. No.00TH8459) GaAs reliability GaAs Reliability Workshop, 1999. Proceedings. :69-75 1999

Relation: 1999 GaAs Reliability Workshop. Proceedings

المؤلفون: Menozzi, R., Dieci, D., Messori, M., Sozzi, G., Lanzieri, C., Canali, C.

المصدر: GaAs IC Symposium. IEEE Gallium Arsenide Integrated Circuit Symposium. 21st Annual. Technical Digest 1999 (Cat. No.99CH36369) GaAs IC symposium GaAs IC Symposium, 1999. 21st Annual. :171-174 1999

Relation: GaAs IC Symposium. 21st Annual. Technical Digest 1999

المؤلفون: Mitic, G., Sommer, K.-H., Dieci, D., Lefranc, G.

المصدر: Conference Record of 1998 IEEE Industry Applications Conference. Thirty-Third IAS Annual Meeting (Cat. No.98CH36242) Industry applications Industry Applications Conference, 1998. Thirty-Third IAS Annual Meeting. The 1998 IEEE. 2:1026-1030 vol.2 1998

Relation: Conference Record of 1998 IEEE Industry Applications Conference. Thirty-Third IAS Annual Meeting

المؤلفون: Dieci, D., Sozzi, G., Menozzi, R., Tediosi, E., Lanzieri, C., Canali, C.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 48(9):1929-1937 Sep, 2001