يعرض 1 - 10 نتائج من 25,207 نتيجة بحث عن '"Diode Laser"', وقت الاستعلام: 0.89s تنقيح النتائج
  1. 1
    مؤتمر
    On the Importance of Reproducibility of Experimental Results Especially in the Domain of Security

    المؤلفون: Petryk, Dmytro, Kabin, Ievgen, Langendorfer, Peter, Dyka, Zoya

    المصدر: 2024 13th Mediterranean Conference on Embedded Computing (MECO) Embedded Computing (MECO), 2024 13th Mediterranean Conference on. :1-5 Jun, 2024

    Relation: 2024 13th Mediterranean Conference on Embedded Computing (MECO)

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  2. 2
    مؤتمر
    A Phase Noise Immune TDLAS Flow Velocimetry via Using Modulated Waveform Synchronizing

    المؤلفون: Hou, Guangyu, Xu, Lijun, Wang, Yiding, Cao, Zhang

    المصدر: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2024 IEEE International. :1-5 May, 2024

    Relation: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

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  3. 3
    مؤتمر
    A TDLAS Tomographic Forecasting-and-Reconstructing Network for Predictive Temperature Imaging

    المؤلفون: Si, Jingjing, Wang, Zhi, Cheng, Yinbo

    المصدر: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Instrumentation and Measurement Technology Conference (I2MTC), 2024 IEEE International. :1-5 May, 2024

    Relation: 2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)

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  4. 4
    مؤتمر
    Domain Knowledge Assisted Gas Tomography

    المؤلفون: Wiedemann, Thomas, Hinsen, Patrick, Ruiz, Victor Prieto, Shutin, Dmitriy, Lilienthal, Achim J.

    المصدر: 2024 IEEE International Symposium on Olfaction and Electronic Nose (ISOEN) Olfaction and Electronic Nose (ISOEN), 2024 IEEE International Symposium on. :1-3 May, 2024

    Relation: 2024 IEEE International Symposium on Olfaction and Electronic Nose (ISOEN)

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  5. 5
    مؤتمر
    Reliability testing for silicon photonics and optoelectronics (Invited)

    المؤلفون: Herrick, Robert W.

    المصدر: 2024 IEEE International Reliability Physics Symposium (IRPS) International Reliability Physics Symposium (IRPS), 2024 IEEE. :1-10 Apr, 2024

    Relation: 2024 IEEE International Reliability Physics Symposium (IRPS)

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  6. 6
    دورية أكاديمية
    Design and Experimental Study of Wavelength Beam Combining System Using Full-Bar Diode Laser Stacks

    المؤلفون: Lin, C., Lin, J., Tai, P., Wang, T., Feng, B., Chou, C., Han, P.

    المصدر: IEEE Photonics Technology Letters IEEE Photon. Technol. Lett. Photonics Technology Letters, IEEE. 36(8):535-538 Apr, 2024

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  7. 7
    مؤتمر
    Computer-Assisted Laser Treatment of Anorectal Pathology

    المؤلفون: Ivanov, Dmitry, Kolbas, Yury, Kuznetsov, Evgenii, Soloveva, Tatiana

    المصدر: 2023 9th International Conference on Mechanical and Electronics Engineering (ICMEE) Mechanical and Electronics Engineering (ICMEE), 2023 9th International Conference on. :527-531 Nov, 2023

    Relation: 2023 9th International Conference on Mechanical and Electronics Engineering (ICMEE)

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  8. 8
    دورية أكاديمية
    Pressure Detection With Mach–Zehnder Linearized Tunable Diode-Laser Absorption Spectroscopy

    المؤلفون: Lorbeer, R., Bittner, M., Kliebisch, O., Mahnke, P.

    المصدر: IEEE Open Journal of Instrumentation and Measurement IEEE Open J. Instrum. Meas. Instrumentation and Measurement, IEEE Open Journal of. 3:1-10 2024

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  9. 9
    دورية أكاديمية
    Improving the Accuracy Using Second Harmonic Spectral Line Separation Method for Mid-Infrared CO2 Sensing System

    المؤلفون: Dong, W., Chen, C., Li, Z., Wang, Y., Piao, H., Wang, P.

    المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-10 2024

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  10. 10
    دورية أكاديمية
    An Adaptive Beam-Steering-Distortion-Compensated TDLAS Method for Precise and Robust Temperature Measurement

    المؤلفون: Lu, F., Cao, Z., Wu, Y., Zhao, K., Xue, X., Lin, Y., Xu, L.

    المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-10 2024

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