-
1دورية أكاديمية
المؤلفون: Maximilian Lederer, Thomas Kämpfe, Norman Vogel, Dirk Utess, Beate Volkmann, Tarek Ali, Ricardo Olivo, Johannes Müller, Sven Beyer, Martin Trentzsch, Konrad Seidel, Lukas M. Eng
المصدر: Nanomaterials, Vol 10, Iss 2, p 384 (2020)
مصطلحات موضوعية: ferroelectrics, hafnium oxide, electron backscatter diffraction, transmission electron microscopy, ferroelectric field effect transistor, non-volatile memory, Chemistry, QD1-999
وصف الملف: electronic resource
-
2
المؤلفون: Yogadissen Andee, Jan Hoentschel, Irfan Saadat, Florent Ravaux, Amal Al Ghaferi, Dirk Utess, Dominik Kleimaier, Zhixing Zhao, Steffen Lehmann, Karen Sloyan
المصدر: IEEE Transactions on Electron Devices. 68:3230-3237
مصطلحات موضوعية: Materials science, Noise measurement, business.industry, Transistor, Silicon on insulator, Electronic, Optical and Magnetic Materials, law.invention, Silicon-germanium, Stress (mechanics), chemistry.chemical_compound, CMOS, chemistry, Parasitic capacitance, law, Optoelectronics, Radio frequency, Electrical and Electronic Engineering, business
-
3
المؤلفون: Zhixing Zhao, Steffen Lehmann, Wei Lun Oo, Amit Kumar Sahoo, Shafi Syed, Quang Huy Le, Dang Khoa Huynh, Talha Chohan, Dirk Utess, Dominik Kleimaier, Maciej Wiatr, Sabine Kolodinski, Jerome Mazurier, Jan Hoentschel, Andreas Knorr, Ned Cahoon, Stefan Kneitz
المصدر: 2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8bef3e5c3d875db0c12f48ec8f64e10b
https://doi.org/10.1109/bcicts50416.2021.9682480 -
4
المؤلفون: Christian Hobert, Dirk Utess, Travis Mitchell, Frieder H. Baumann
المصدر: Microscopy and Microanalysis. 26:660-662
مصطلحات موضوعية: Materials science, business.industry, Optoelectronics, Tomography, business, Instrumentation, Characterization (materials science)
-
5
المؤلفون: Johannes Müller, Antoine Benoist, Konrad Seidel, Dirk Utess, Andreas Hellmich, Stefan Müller, Menno Mennenga, Ali Pourkeramati, Thomas Kampfe, Halid Mulaosmanovic, Martin Trentzsch, Jan Paul, Thomas Mikolajick, Haidi Zhou, Maximilian Lederer, M. Schuster, Fabio Tassan, J. Ocker, M. Noack, Evelyn T. Breyer, Tarek Ali, Sven Beyer, Dominik Kleimaier, John Pellerin, Stefan Slesazeck, Stefan Dunkel, R. Hoffmann, Franz Muller
المصدر: 2020 IEEE International Memory Workshop (IMW).
مصطلحات موضوعية: business.industry, Computer science, Transistor, law.invention, CMOS, Neuromorphic engineering, law, Optoelectronics, Field-effect transistor, Wafer, Static random-access memory, Data retention, business, Metal gate
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::aad8e14efc2882797806718d2a0b6aeb
https://doi.org/10.1109/imw48823.2020.9108150 -
6
المؤلفون: David Barge, Cyrille Le Royer, Anita Peeva, Thomas Feudel, Jens-Uwe Sachse, Heyne Tobias, Judson R. Holt, Aydin Omur Isil, Timothy J. McArdle, Markus Lenski, Christoph Klein, Laks Vanamurthy, Alexis Divay, Carsten Peters, Mulfinger George R, Elliot John Smith, Dirk Utess, Ralf Gerber, Steffen Lehmann, Sören Jansen
المصدر: ECS Transactions. 86:199-206
مصطلحات موضوعية: Materials science, business.industry, Optoelectronics, Silicon on insulator, business
-
7
المؤلفون: Klaus Hempel, S. Mutas, Kornelia Dittmar, J. K. Schaeffer, V. Jaschke, Dina H. Triyoso, Markus Lenski, Susanne Ohsiek, J. Shu, Dirk Utess
المصدر: ECS Journal of Solid State Science and Technology. 2:N222-N227
مصطلحات موضوعية: chemistry.chemical_compound, Materials science, Silicon nitride, chemistry, Gate oxide, business.industry, Optoelectronics, business, Electronic, Optical and Magnetic Materials, High-κ dielectric
-
8
المؤلفون: Ömür Işıl Aydin, Judson Robert Holt, Laks Vanamurthy, Thomas Feudel, Cyrille Le Royer, Tobias Heyne, Ralf Gerber, Markus Lenski, George Robert Mulfinger, Timothy J McArdle, Sören Jansen, Dirk Utess, Christoph Klein, Anita Peeva, David Barge, Alexis Divay, Steffen Lehmann, Elliot Smith, Carsten Peters, Jens-Uwe Sachse
المصدر: ECS Meeting Abstracts. :1072-1072
-
9
المؤلفون: Eckhard Langer, Moritz Andreas Meyer, Pascal Limbecker, Dirk Utess, Axel Preusse, Oliver Aubel, Steffi Thierbach
المصدر: EDFA Technical Articles. 10:24-29
مصطلحات موضوعية: Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a922ac8751921be4fe2d67f20b6fd91e
https://doi.org/10.31399/asm.edfa.2008-1.p024 -
10
المؤلفون: K. Seidell, Kornelia Dittmar, Mark Gerard Nolan, Dina H. Triyoso, M. Licbau, M. Weisheit, Robert Fox, Patrick Polakowski, Dirk Utess, Wenke Weinreich, Susanne Ohsiek
المصدر: ICICDT
مصطلحات موضوعية: Materials science, business.industry, Doping, High capacitance, Electrical engineering, Low leakage, Hardware_PERFORMANCEANDRELIABILITY, law.invention, Atomic layer deposition, Capacitor, Hardware_GENERAL, Impurity, law, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, business, Decoupling (electronics), High-κ dielectric
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ed9f3aa011476e361ca20f2eef6e5cf8
https://doi.org/10.1109/icicdt.2014.6838595