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1مؤتمر
المؤلفون: Myung, Sanghoon, Kim, Jinwoo, Jeon, Yongwoo, Jang, Wonik, Huh, In, Kim, Jaemin, Han, Songyi, Baek, Kang-hyun, Ryu, Jisu, Kim, Yoon-Suk, Doh, Jiseong, Kim, Jae-ho, Jeong, Changwook, Kim, Dae Sin
المصدر: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) Simulation of Semiconductor Processes and Devices (SISPAD), 2020 International Conference o. :347-350 Sep, 2020
Relation: 2020 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
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2دورية أكاديمية
المؤلفون: Ahn, Byungseong, Lee, Kwangseok, Yang, Jaehun, Doh, Jiseong, Jeong, Jaehoon, Kwag, Taeshin, Kim, Minseok, Kim, Yeonjeong, Kim, Jongchul, Keun Yoo, Hyung, Sin Kim, Dae
المصدر: In Solid State Electronics March 2023 201
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3دورية أكاديمية
المؤلفون: Choi, Hyunsuk, Lee, Kwangseok, Doh, Jiseong, Jeong, Jaehoon, Kwag, Taeshin, Kim, Minseok, Kim, Yeonjeong, Kim, Jongchul, Yoo, Hyung Keun, Kim, Dae Sin
المصدر: In Solid State Electronics February 2023 200
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4دورية
المؤلفون: Sendelbach, Matthew J., Schuch, Nivea G., Cheon, Wooyoung, Moon, Taejin, Kwon, In, Lee, Jinwoo, Lee, Jaeyong, Kwon, Yongjae, Ramu, Ashok, Jin, Seonghoon, Yukihide, Tsuji, Chae, Hyunwoo, Park, Chulwoo, Choi, Hyunsuk, Lee, Kwangseok, Ahn, Byungseong, Yang, Jaehun, Ma, Ami, Kim, Qhwan, Im, Donghyeok, Bae, Jaehyun, Sun, Jongcheon, Lee, Su-Young, Yi, Shinwook, Doh, Jiseong, Chang, Kyu Baik, Han, Songyi, Jeong, Jaehoon, Yang, Yusin, Kim, Dae Sin
المصدر: Proceedings of SPIE; April 2024, Vol. 12955 Issue: 1 p129551J-129551J-7, 1165967p