-
1
المؤلفون: Michael Vai, David Whelihan, Kyle Denney, Robert Lychev, Jeffery Hughes, Donato Kava, Alice Lee, Nick Evancich, Richard Clark, Dave Lide, Kyung Joon Kwak, Jason Li, Douglas Schafer, Michael Lynch, Kyle Tillotson, Wladimir Tirenin
المصدر: MILCOM 2021 - 2021 IEEE Military Communications Conference (MILCOM).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::56a29a90066f517ee103da4f26308517
https://doi.org/10.1109/milcom52596.2021.9653094 -
2
المؤلفون: Kyle Denney, Robert Lychev, Donato Kava, Alice Lee, Michael Vai, Nick Evancich, Richard Clark, David Lide, KJ Kwak, Jason Li, Michael Lynch, Kyle Tillotson, Walt Tirenin, Doug Schafer
المصدر: 2021 IEEE High Performance Extreme Computing Conference (HPEC).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d0ca808031403ac21db9034b949307e2
https://doi.org/10.1109/hpec49654.2021.9622800 -
3
المؤلفون: Michel A. Kinsy, Alan Ehret, Sahan Bandara, Donato Kava
مصطلحات موضوعية: FOS: Computer and information sciences, Source code, Computer science, media_common.quotation_subject, 02 engineering and technology, computer.software_genre, Toolchain, Hardware Architecture (cs.AR), 0202 electrical engineering, electronic engineering, information engineering, Field-programmable gate array, Computer Science - Hardware Architecture, media_common, computer.programming_language, Emulation, Memory hierarchy, business.industry, 05 social sciences, 050301 education, Pipeline (software), 020202 computer hardware & architecture, Embedded system, Verilog, Compiler, business, 0503 education, computer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b455bc984f879920de2dcdb07e03d928
-
4
المؤلفون: Shaimum Shahriar, Deidra Hodges, Jose Galindo, Vanessa Castaneda, Cheik Sana, Manuel Martinez, Donato Kava
المصدر: MRS Advances. 1:3199-3205
مصطلحات موضوعية: Materials science, Scanning electron microscope, Annealing (metallurgy), Mechanical Engineering, Analytical chemistry, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, 01 natural sciences, Grain size, Characterization (materials science), 010309 optics, Mechanics of Materials, Electrical resistivity and conductivity, 0103 physical sciences, General Materials Science, 0210 nano-technology, Deposition (law), Visible spectrum, Diffractometer
-
5
المؤلفون: Yves Morand, Louis Hutin, Donato Kava, Fabrice Nemouchi, Maud Vinet, Magali Gregoire, Emmanuel Dubois, N. Bernier, J. Borrel, Remy Gassilloud
المساهمون: Institut d’Électronique, de Microélectronique et de Nanotechnologie - UMR 8520 (IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), University of Texas [El Paso] (UTEP ), Microélectronique Silicium - IEMN (MICROE SI - IEMN), Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF)-Centrale Lille-Institut supérieur de l'électronique et du numérique (ISEN)-Université de Valenciennes et du Hainaut-Cambrésis (UVHC)-Université de Lille-Centre National de la Recherche Scientifique (CNRS)-Université Polytechnique Hauts-de-France (UPHF), French Public Authority through NANO, French Public Authority through Equipex [FDSOI11], Microélectronique Silicium - IEMN (MICROELEC SI - IEMN)
المصدر: Japanese Journal of Applied Physics
Japanese Journal of Applied Physics, Japan Society of Applied Physics, 2017, 56 (4), 04CB02, 7 p. ⟨10.7567/JJAP.56.04CB02⟩
Japanese Journal of Applied Physics, 2017, 56 (4), 04CB02, 7 p. ⟨10.7567/JJAP.56.04CB02⟩مصطلحات موضوعية: 010302 applied physics, Materials science, Physics and Astronomy (miscellaneous), Applied physics, business.industry, General Engineering, General Physics and Astronomy, Nanotechnology, Insulator (electricity), 02 engineering and technology, Dielectric, 021001 nanoscience & nanotechnology, 01 natural sciences, Engineering physics, [SPI]Engineering Sciences [physics], Semiconductor, CMOS, Electrical resistivity and conductivity, 0103 physical sciences, 0210 nano-technology, business
-
6
المؤلفون: Shaimum Shahriar, Robert Cotta, David Buck, Cheik Sana, Deidra Hodges, Edison Castro, Luis Echegoyen, Jose Galindo, Donato Kava
المصدر: 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC).
مصطلحات موضوعية: Spin coating, Materials science, Band gap, Scanning electron microscope, Analytical chemistry, Direct and indirect band gaps, Crystallite, Thin film, Diffractometer, Perovskite (structure)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fdaf4e49f1935e359c15b034e0239946
https://doi.org/10.1109/pvsc.2015.7355725 -
7
المؤلفون: David Buck, Deidra Hodges, Jose Galindo, Cheik Sana, Shaimum Shahriar, Donato Kava, Robert Cotta, Luis Echegoyen
المصدر: 2015 IEEE 42nd Photovoltaic Specialist Conference (PVSC).
مصطلحات موضوعية: Soda-lime glass, Spin coating, Fabrication, Materials science, Band gap, business.industry, Scanning electron microscope, Analytical chemistry, Optoelectronics, Crystallite, Thin film, business, Perovskite (structure)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::99b502346385b98bfe2d1c4539621a96
https://doi.org/10.1109/pvsc.2015.7355736 -
8دورية أكاديمية
المؤلفون: Julien Borrel, Louis Hutin, Donato Kava, Remy Gassilloud, Nicolas Bernier, Yves Morand, Fabrice Nemouchi, Magali Gregoire, Emmanuel Dubois, Maud Vinet
المصدر: Japanese Journal of Applied Physics; Apr2017, Vol. 56 Issue 4S, p1-1, 1p
Find this article in full text from Springer Verlag. 
Full Text Finder