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1
المؤلفون: Mark S. Rodder, Mong-song Liang, Cheol Kim, Taek-Soo Jeon, Dong-Won Kim, Sunjung Kim, Kittl Jorge A, Jae Hoo Park, Wookje Kim, Jongwook Jeon, Sun-Ghil Lee, Myung-Geun Song, Kab-Jin Nam, Seung-Hun Lee, Yeon-Cheol Heo, Sean Lian, Sang-Woo Lee, Uihui Kwon, Geum-Jong Bae, Dong-il Bae, Kang-ill Seo, Krishna Kumar Bhuwalka, Ki-Hyun Hwang, Yihwan Kim, E. S. Jung, Jae-Young Park
المصدر: 2016 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Electron mobility, Materials science, business.industry, Electrical engineering, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Threshold voltage, Silicon-germanium, chemistry.chemical_compound, CMOS, Stack (abstract data type), chemistry, Logic gate, 0103 physical sciences, Optoelectronics, 0210 nano-technology, business, Common gate, Metal gate
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::10d564c76bd5f4f0442e06af3b149592
https://doi.org/10.1109/iedm.2016.7838496 -
2
المؤلفون: Eun-ae Chung, Geum-Jong Bae, Nakanishi Toshiro, Maria Toledano-Luque, Jin-soak Kim, Guangfan Jiao, Thomas Kauerauf, Ki-Hyun Hwang, Dong-Won Kim, Seung-Hun Lee, Kab-Jin Nam, Dong-il Bae
المصدر: 2016 IEEE International Electron Devices Meeting (IEDM).
مصطلحات موضوعية: 010302 applied physics, Negative-bias temperature instability, Materials science, Silicon, business.industry, Electrical engineering, Oxide, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Acceptor, Silicon-germanium, Stress (mechanics), chemistry.chemical_compound, Reliability (semiconductor), chemistry, Electric field, 0103 physical sciences, Optoelectronics, 0210 nano-technology, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3c82966025039e6ec19c2953dd33bcc1
https://doi.org/10.1109/iedm.2016.7838518 -
3
المؤلفون: Philip J. Oldiges, Dong-il Bae, Andreas Scholze, Huiling Shang, Peter Zeitzoff, Dechao Guo, Bomsoo Kim, Kang-ill Seo, Xin Sun, Theodorus E. Standaert, Neeraj Tripathi
المصدر: IEEE Electron Device Letters. 34:1485-1487
مصطلحات موضوعية: Electron mobility, Materials science, business.industry, Oxide, Electrical engineering, Subthreshold slope, Electronic, Optical and Magnetic Materials, Fin (extended surface), PMOS logic, chemistry.chemical_compound, chemistry, MOSFET, Optoelectronics, Electrical and Electronic Engineering, business, Scaling, NMOS logic
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4
المؤلفون: Sungho Kim, Yang-Kyu Choi, Dong-il Bae
المصدر: IEEE Transactions on Nanotechnology. 8:100-105
مصطلحات موضوعية: Dynamic random-access memory, Engineering, Hardware_MEMORYSTRUCTURES, Temperature control, business.industry, Electrical engineering, Silicon on insulator, Hardware_PERFORMANCEANDRELIABILITY, Integrated circuit, Computer Science Applications, law.invention, Thermal conductivity, law, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, Field-effect transistor, Wafer, Electrical and Electronic Engineering, business, Dram, Hardware_LOGICDESIGN
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5
المؤلفون: Seong-Wan Ryu, Bonsang Gu, Yang-Kyu Choi, Dong-il Bae
المصدر: 2008 IEEE Silicon Nanoelectronics Workshop.
مصطلحات موضوعية: Physics, Hardware_MEMORYSTRUCTURES, business.industry, Silicon on insulator, Capacitance, Flash memory, Threshold voltage, Non-volatile memory, Logic gate, MOSFET, Electronic engineering, business, Computer hardware, Dram
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6cd623b22b3fd489bef752010afbfe31
https://doi.org/10.1109/snw.2008.5418416 -
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المؤلفون: Jae Sub Oh, Jung Jae Yoo, Yang-Kyu Choi, Gi Sung Lee, Hyunjin Lee, Lee-Eim Yu, Jim Mo Yang, Maesoon lm, Seong-Wan Ryu, Eujime Lee, Jin-Woo Han, Dong-il Bae, Kuk-Hwan Kim, Sungho Kim, Hee Mok Lee, Sang Cheol Jeon, Yun Chang Park, Chimgjin Kim, Woo Ho Bae, Ju-Hyun Kim, Kwang Hee Kim
المصدر: 2007 IEEE Symposium on VLSI Technology.
مصطلحات موضوعية: Materials science, Silicon, business.industry, Transistor, Nanowire, chemistry.chemical_element, Nanotechnology, Nitride, law.invention, Non-volatile memory, chemistry, law, Optoelectronics, Field-effect transistor, Terabit, business, NMOS logic
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6f7893e90b1c73120cb3b93c216063e7
https://doi.org/10.1109/vlsit.2007.4339761 -
7
المؤلفون: Wonshik Lee, Seung-Chul Yang, Yang-Keun Park, Byung-Hyuk Roh, Kyu-Hyun Lee, Eun-Cheol Lee, Jin-woo Lee, Yong-Sung Kim, Soo-Ho Shin, Sung-hee Han, Won-suk Yang, Ju-Yong Lee, Dong-il Bae, Bo-Young Song, Jun Han, Joon-Ho Sung, Dong-jun Lee, Kinam Kim, Sang-Hyeon Lee, Tae-Young Chung
المصدر: IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, Silicon, business.industry, Doping, Transistor, Electrical engineering, Copper interconnect, chemistry.chemical_element, Hardware_PERFORMANCEANDRELIABILITY, Threshold voltage, law.invention, chemistry, law, Low-power electronics, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, business, Dram
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::cd4b86c68b50b76ffa5b62d0783d8179
https://doi.org/10.1109/iedm.2005.1609338 -
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المؤلفون: Dong-won Shin, Jun-Sik Bae, Seung-Won Sung, Sang-Uhk Rhie, Kinam Kim, Tae-Young Chung, Dong-il Bae, Ji-Soong Park
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Engineering, Engineering drawing, business.industry, law.invention, Micrometre, Optical proximity correction, law, Margin (machine learning), Electronic engineering, Node (circuits), Process window, Photolithography, business, Lithography, Dram
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a1f73f4dcdf9806f7b5f90795e63a06a
https://doi.org/10.1117/12.435684 -
9مؤتمر
المؤلفون: Yong-Sung Kim, Sang-Hyeon Lee, Soo-Ho Shin, Sung-Hee Han, Ju-Yong Lee, Jin-Woo Lee, Jun Han, Seung-Chul Yang, Joon-Ho Sung, Eun-Cheol Lee, Bo-Young Song, Dong-Jun Lee, Dong-Il Bae, Won-Suk Yang, Yang-Keun Park, Kyu-Hyun Lee, Byung-Hyuk Roh, Tae-Young Chung, Kinam Kim, Wonshik Lee
المصدر: IEEE International Electron Devices Meeting, 2005. IEDM Technical Digest; 2005, p315-318, 4p
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10دورية أكاديمية
المؤلفون: Dong-Il Baek, Hyo-Jae Jo, Min-Jun Lee, Jae-Hwan Lim, Tae-Kyung Lee, Jae-Heui Kim, Tae-Won Oh
المصدر: 한국해양공학회지, Vol 32, Iss 4, Pp 237-243 (2018)
مصطلحات موضوعية: VIV(Vortex induced vibration), Circular cylinder, Drag force, Lateral force, Model test, Ocean engineering, TC1501-1800
وصف الملف: electronic resource