المؤلفون: Cacho, F., Arfaoui, W., Mora, P., Federspiel, X., Huard, V., Dornel, E.

المصدر: 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW) Integrated Reliability Workshop Final Report (IIRW), 2014 IEEE International. :73-78 Oct, 2014

Relation: 2014 IEEE International Integrated Reliability Workshop Final Report (IIRW)

المؤلفون: Rideau, D., Quenette, V., Garetto, D., Dornel, E., Weybright, M., Manceau, J. P, Saxod, O., Tavernier, C., Jaouen, H.

المصدر: 2010 International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2010 IEEE International Conference on. :210-213 Mar, 2010

Relation: 2010 International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Dornel, E., Barbe, J-C., Eymery, J., de Crecy, F.

المصدر: 2007 International Conference on Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems. EuroSime 2007 Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems, 2007. EuroSime 2007. International Conference on. :1-8 Apr, 2007

Relation: 2007 International Conference on Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems

المؤلفون: Zaka, A., Singer, J., Dornel, E., Garetto, D., Rideau, D., Rafhay, Q., Clerc, R., Manceau, J.-P., Degors, N., Boccaccio, C., Tavernier, C., Jaouen, H.

المصدر: In Solid State Electronics 2011 63(1):158-162

المؤلفون: Garetto, D., Zaka, A., Quenette, V., Rideau, D., Dornel, E., F. Clark, W., Minondo, M., Tavernier, C., Rafhay, Q., Clerc, R., Schmid, A., Leblebici, Y., Jaouen, H.

المساهمون: Domenget, Chahla, Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS)

المصدر: NSTI Nanotech 2009, Workshop on Compact Modeling (WCM 2009)
NSTI Nanotech 2009, Workshop on Compact Modeling (WCM 2009), May 2009, Ston, United States. pp.554-557

مصطلحات موضوعية: [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, ComputingMilieux_MISCELLANEOUS

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::05e825227a46593dd725abcba334f015
https://hal.archives-ouvertes.fr/hal-00604191

المؤلفون: Zaka, A., Garetto, D., Rideau, D., Palestri, P., Manceau, J., Dornel, E., Rafhay, Q., Clerc, R., Leblebici, Y., Tavernier, C., Jaouen, H.

المصدر: 2011 IEEE International Conference on Microelectronic Test Structures (ICMTS); 2011, p130-135, 6p

المؤلفون: Garetto, D., Zaka, A., Manceau, J.-P., Rideau, D., Dornel, E., Clark, W.F., Schmid, A., Jaouen, H., Leblebici, Y.

المصدر: 2011 3rd IEEE International Memory Workshop (IMW); 2011, p1-4, 4p

المؤلفون: Garetto, D., Randriamihaja, Y.M., Rideau, D., Dornel, E., William, F.C., Schmid, A., Huard, V., Jaouen, H., Leblebici, Y.

المصدر: 2010 14th International Workshop on Computational Electronics (IWCE); 2010, p1-4, 4p

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المؤلفون: Zaka, A., Palestri, P., Rideau, D., Iellina, M., Dornel, E., Rafhay, Q., Tavernier, C., Jaouen, H.

المصدر: 2010 14th International Workshop on Computational Electronics (IWCE); 2010, p1-3, 3p