المؤلفون: Zhang, Zongyu, Du, ChunLei, Wang, Yong, Liu, Jing

المصدر: 2022 IEEE 2nd International Conference on Electronic Technology, Communication and Information (ICETCI) Electronic Technology, Communication and Information (ICETCI), 2022 IEEE 2nd International Conference on. :1321-1324 May, 2022

Relation: 2022 IEEE 2nd International Conference on Electronic Technology, Communication and Information (ICETCI)

المؤلفون: Yuan, Yin, Wang, Fufu, Sun, Lu, Liu, Wanchen, Du, Chunlei, Wang, Chenyang, Yao, Yang

المصدر: In Journal of Cleaner Production 15 April 2024 450

المؤلفون: Zhou, Xin, Du, Chunlei, Cai, Xiaodong

مصطلحات موضوعية: Computer Science - Machine Learning, Statistics - Methodology, Statistics - Machine Learning

URL الوصول: http://arxiv.org/abs/2006.12592

المؤلفون: Du, Chunlei, Jia, Wenxiao, Wang, Kai

المصدر: In Urban Climate September 2023 51

المؤلفون: Zhang, Xin, Xia, Liangping, Zhang, Ziyin, Zhang, Xinqun, Wei, Dongshan, Nie, Changbin, Cui, Hongliang, Du, Chunlei

المصدر: 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2016 IEEE International Conference on. :335-338 Jul, 2016

Relation: 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

المؤلفون: Zhang, Mingkun, Yang, Zhongbo, Tang, Mingjie, Yan, Shihan, Wei, Dongshan, Cui, Hong-liang, Du, Chunlei

المصدر: 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2016 IEEE International Conference on. :362-365 Jul, 2016

Relation: 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

المؤلفون: Yang, Zheng, Wu, Peng, Rao, Xianhua, Yin, Shaoyun, Du, Chunlei

المصدر: 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2016 IEEE International Conference on. :217-220 Jul, 2016

Relation: 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

المؤلفون: Shi, Changcheng, Wei, Dongshan, Du, Chunlei, Cui, Hongliang, Ma, Yuting

المصدر: 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2016 IEEE International Conference on. :414-417 Jul, 2016

Relation: 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

المؤلفون: Zhang, Weiguo, Liu, Fenglei, Zhu, Guodong, Wang, Deqiang, Xiong, Xin, Du, Chunlei

المصدر: 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2016 IEEE International Conference on. :43-46 Jul, 2016

Relation: 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)

المؤلفون: Yan, Shihan, Li, Zhancheng, Wei, Dongshan, Cui, Hong-Liang, Du, Chunlei

المصدر: 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO), 2016 IEEE International Conference on. :339-342 Jul, 2016

Relation: 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO)