المؤلفون: Uksong Kang, Hoe-Ju Chung, Seongmoo Heo, Soon-Hong Ahn, Hoon Lee, Soo-Ho Cha, Jaesung Ahn, DukMin Kwon, Jin Ho Kim, Jae-Wook Lee, Han-Sung Joo, Woo-Seop Kim, Hyun-Kyung Kim, Eun-Mi Lee, So-Ra Kim, Keum-Hee Ma, Dong-Hyun Jang, Nam-Seog Kim, Man-Sik Choi, Sae-Jang Oh, Jung-Bae Lee, Tae-Kyung Jung, Jei-Hwan Yoo, Changhyun Kim

المصدر: 2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers Solid-State Circuits Conference - Digest of Technical Papers, 2009. ISSCC 2009. IEEE International. :130-131,131a Feb, 2009

Relation: 2009 IEEE International Solid-State Circuits Conference - (ISSCC)

المؤلفون: null Uksong Kang, null Hoe-Ju Chung, null Seongmoo Heo, null Soon-Hong Ahn, null Hoon Lee, null Soo-Ho Cha, null Jaesung Ahn, null DukMin Kwon, null Jin Ho Kim, null Jae-Wook Lee, null Han-Sung Joo, null Woo-Seop Kim, null Hyun-Kyung Kim, null Eun-Mi Lee, null So-Ra Kim, null Keum-Hee Ma, null Dong-Hyun Jang, null Nam-Seog Kim, null Man-Sik Choi, null Sae-Jang Oh, null Jung-Bae Lee, null Tae-Kyung Jung, null Jei-Hwan Yoo, null Changhyun Kim

المصدر: 2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers.

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7e4f34a5587145c53db725a6a887012
https://doi.org/10.1109/isscc.2009.4977342

المؤلفون: Uksong Kang, Hoe-Ju Chung, Seongmoo Heo, Duk-Ha Park, Hoon Lee, Jin Ho Kim, Soon-Hong Ahn, Soo-Ho Cha, Jaesung Ahn, DukMin Kwon, Jae-Wook Lee, Han-Sung Joo, Woo-Seop Kim, Dong Hyeon Jang, Nam Seog Kim, Jung-Hwan Choi, Tae-Gyeong Chung, Jei-Hwan Yoo, Joo Sun Choi, Changhyun Kim

المصدر: IEEE Journal of Solid-State Circuits; Jan2010, Vol. 45 Issue 1, p111-119, 9p

مصطلحات موضوعية: DYNAMIC random access memory, NARROW gap semiconductors, BIT rate, SPEED limits, QUANTITATIVE research

المؤلفون: Hoeju Chung, Byung Hoon Jeong, ByungJun Min, Youngdon Choi, Beak-Hyung Cho, Junho Shin, Jinyoung Kim, Jung Sunwoo, Joon-min Park, Qi Wang, Yong-jun Lee, Sooho Cha, Dukmin Kwon, Sangtae Kim, Sunghoon Kim, Yoohwan Rho, Mu-Hui Park, Jaewhan Kim, Ickhyun Song, Sunghyun Jun

المصدر: 2011 IEEE International Solid-State Circuits Conference Digest of Technical Papers (ISSCC); 2011, p500-502, 3p