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1دورية أكاديمية
المؤلفون: Kuo-Ching Huang, Yean-Kuen Fang, Dun-Nian Yang, Chii-Wen Chen, Hung-Cheng Sung, Di-Son Kuo, Wang, C.S., Mong-Song Liang
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 21(7):359-361 Jul, 2000
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المؤلفون: Di-Son Kuo, Dun-Nian Yang, Chii-Wen Chen, Hung-Cheng Sung, Kuo-Ching Huang, Yean-Kuen Fang, C.S. Wang, Mong-Song Liang
المصدر: IEEE Electron Device Letters. 21:359-361
مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, business.industry, Gate voltage, Flash memory, Electronic, Optical and Magnetic Materials, Gate oxide, Charge trap flash, Electronic engineering, Optoelectronics, Electrical and Electronic Engineering, business, Cycling, Degradation (telecommunications), Voltage