يعرض 1 - 10 نتائج من 47 نتيجة بحث عن '"Dun-Nian Yaung"', وقت الاستعلام: 0.82s تنقيح النتائج
  1. 1
    مؤتمر
    Crosstalk improvement technology applicable to 0.14/spl mu/m CMOS image sensor

    المؤلفون: Chien-Hsien Tseng, Shou-Gwo Wuu, Ho-Ching Chien, Dun-Nian Yaung, Tze-Hsuan Hsu, Jeng-Shyan Lin, Hung-Jen Hsu, Chung-Yi Yu, Chin-Hsin Lo, Wang, C.S.

    المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :997-1000 2004

    Relation: 2004 International Electron Devices Meeting

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  2. 2
    مؤتمر
    Active pixel image sensor scale down in 0.18 /spl mu/m CMOS technology

    المؤلفون: Ho-Ching Chien, Shou-Gwo Wuu, Dun-Nian Yaung, Chien-Hsien Tseng, Jeng-Shyan Lin, Wang, C.S., Chin-Kung Chang, Yu-Kung Hsiao

    المصدر: Digest. International Electron Devices Meeting, Electron devices meeting Electron Devices Meeting, 2002. IEDM '02. International. :813-816 2002

    Relation: IEEE International Electron Devices Meeting

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  3. 3
    مؤتمر
    High performance 0.25-um CMOS color imager technology with non-silicide source/drain pixel

    المؤلفون: Shou-Gwo Wuu, Dun-Nian Yaung, Chien-Hsien Tseng, Ho-Ching Chien, Wang, C.S., Yean-Kuen Hsiao, Chin-Kung Chang, Chang, B.J.

    المصدر: International Electron Devices Meeting 2000. Technical Digest. IEDM (Cat. No.00CH37138) Electron devices meeting Electron Devices Meeting, 2000. IEDM '00. Technical Digest. International. :705-708 2000

    Relation: International Electron Devices Meeting. Technical Digest. IEDM

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  4. 4
    دورية أكاديمية
    Nonsilicide source/drain pixel for 0.25-μm CMOS image sensor

    المؤلفون: Dun-Nian Yaung, Shou-Gwo Wuu, Yean-Kuen Fang, Wang, C.S., Chien-Hsien Tseng, Mon-Song Lian

    المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 22(2):71-73 Feb, 2001

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  5. 5
    دورية أكاديمية
    Effect of substrate bias on the performance and reliability of the split-gate source-side injected flash memory

    المؤلفون: Kuo-Ching Huang, Yean-Kuen Fang, Dun-Nian Yaung, Chii-Wen Chen, Hung-Cheng Sung, Di-Son Kuo, Wang, C.S., Mong-Song Liang

    المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 20(8):412-414 Aug, 1999

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  6. 6
    دورية أكاديمية
    Effects of different tungsten polycide process on the effective channel length and performance of deep submicron CMOS transistors

    المؤلفون: Kuo-Ching Huang, Yean-Kuen Fang, Dun-Nian Yaung, Chii-Wen Chen, Mong-Song Liang, Jang-Cheng Hsieh, Chi-Wen Su, Kuei-Ying Lee

    المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 20(1):36-38 Jan, 1999

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  7. 7
    مؤتمر
    Air-gap guard ring for pixel sensitivity and crosstalk improvement in deep sub-micron CMOS image sensor

    المؤلفون: Dun-Nian Yaung, Shou-Gwo Wuu, Ho-Ching Chien, Tzu-Hsuan Hsu, Chien-Hsien Tseng, Jeng-Shyan Lin, Jieh-Jang Chen, Chin-Hsin Lo, Chung-Yi Yu, Chia-Shiung Tsai, Wang, C.S.

    المصدر: IEEE International Electron Devices Meeting 2003 Electron devices IEDM'03 Electron Devices Meeting, 2003. IEDM '03 Technical Digest. IEEE International. :16.5.1-16.5.4 2003

    Relation: IEEE International Electron Devices Meeting 2003

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  8. 8
    مؤتمر
    A high performance active pixel sensor with 0.18um CMOS color imager technology

    المؤلفون: Shou-Gwo Wuu, Ho-Ching Chien, Dun-Nian Yaung, Chien-Hsien Tseng, Wang, C.S., Chin-Kung Chang, Yu-Kung Hsaio

    المصدر: International Electron Devices Meeting. Technical Digest (Cat. No.01CH37224) Electron devices meeting 2001 Electron Devices Meeting, 2001. IEDM '01. Technical Digest. International. :24.3.1-24.3.4 2001

    Relation: International Electron Devices Meeting. Technical Digest

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  9. 9
    A Modular, Direct Time-of-Flight Depth Sensor in 45/65-nm 3-D-Stacked CMOS Technology

    المؤلفون: Augusto Ronchini Ximenes, Edoardo Charbon, Myung-Jae Lee, Preethi Padmanabhan, Dun-Nian Yaung, Yuichiro Yamashita

    المصدر: IEEE Journal of Solid-State Circuits. 54:3203-3214

    مصطلحات موضوعية: 3-d-stacking, laser signature, interference, interference reduction, light detection and ranging (lidar), single-photon avalanche diode (spad), Optics, Data acquisition, Interference (communication), Depth map, depth sensor, Back-illuminated sensor, Electrical and Electronic Engineering, Physics, cmos technology, Avalanche diode, decision trees, delays, business.industry, Detector, laser radar, Ranging, CMOS, time-of-flight (tof) imaging, distance measurement, ranging imaging, business, camera

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b9315e6b292f5dac65aa7d22665e5be1
    https://doi.org/10.1109/jssc.2019.2938412

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  10. 10
    [Papers] Quantum Efficiency Simulation and Electrical Cross-talk Index Development with Monte-Carlo Simulation Based on Boltzmann Transport Equation

    المؤلفون: Dun-Nian Yaung, Masayuki Uchiyama, Yoshinari Kamakura, Yuichiro Yamashita, N. Minamitani

    المصدر: ITE Transactions on Media Technology and Applications. 6:180-186

    مصطلحات موضوعية: 010302 applied physics, Index (economics), Computer science, Monte Carlo method, 020207 software engineering, 02 engineering and technology, 01 natural sciences, Computer Graphics and Computer-Aided Design, Boltzmann equation, Development (topology), 0103 physical sciences, Signal Processing, 0202 electrical engineering, electronic engineering, information engineering, Media Technology, Quantum efficiency, Statistical physics, Image sensor

    URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e64ffaa5ec00f5f8dab3a892a5371fbd
    https://doi.org/10.3169/mta.6.180

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