المؤلفون: Tsiamis, A., Li, Y., Dunare, C., Marland, J.R.K., Blair, E.O., Smith, S., Terry, J.G., Mitra, S., Underwood, I., Murray, A.F., Walton, A.J.

المصدر: Journal of Microelectromechanical Systems J. Microelectromech. Syst. Microelectromechanical Systems, Journal of. 29(5):1245-1252 Oct, 2020

المؤلفون: Dunare, C., Marland, J.R.K., Blair, E.O., Tsiamis, A., Moorel, F., Terry, J.G., Walton, A.J., Smith, S.

المصدر: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2019 IEEE 32nd International Conference on. :58-63 Mar, 2019

Relation: 2019 IEEE 32nd International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Marland, J.R.K., Moore, F., Dunare, C., Tsiamis, A., Gonzalez-Fernandez, E., Blair, E.O., Smith, S., Terry, J.G., Murray, A.F., Walton, A.J.

المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 33(2):196-201 May, 2020

المؤلفون: Blair, E.O., Buchoux, A., Tsiamis, A., Dunare, C., Marland, J.R.K., Gray, M.E., Terry, J.G., Smith, S., Walton, A.J.

المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 33(2):224-231 May, 2020

المؤلفون: Blair, E. O., Basanta, L. Parga, Schmueser, I., Marland, J. R. K., Buchoux, A., Tsiamis, A., Dunare, C., Normand, M., Stokes, A.A., Walton, A.J., Smith, S.

المصدر: 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2018 IEEE International Conference on. :179-184 Mar, 2018

Relation: 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)

المؤلفون: Blair, E.O., Buchoux, A., Tsiamis, A., Dunare, C., Marland, J.R.K., Terry, J.G., Smith, S., Walton, A.J.

المصدر: 2017 International Conference of Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2017 International Conference of. :1-6 Mar, 2017

Relation: 2017 International Conference of Microelectronic Test Structures (ICMTS)

المؤلفون: Marland, J.R.K., Dunare, C., Tsiamis, A., Gonzalez-Fernandez, E., Blair, E.O., Smith, S., Terry, J.G., Murray, A.F., Walton, A.J.

المصدر: 2017 International Conference of Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2017 International Conference of. :1-5 Mar, 2017

Relation: 2017 International Conference of Microelectronic Test Structures (ICMTS)

المؤلفون: Jiang, Y., Demore, C.E.M., Meggs, C., Dunare, C., Stevenson, T., Bamber, J., Cochran, S., Button, T.W.

المصدر: 2012 IEEE International Ultrasonics Symposium Ultrasonics Symposium (IUS), 2012 IEEE International. :1-4 Oct, 2012

Relation: 2012 IEEE International Ultrasonics Symposium

المؤلفون: Dunare, C., Parkes, W., Stevenson, T., Michette, A., Pfauntsch, S., Shand, M., Button, T., Rodriguez Sanmartin, D., Zhang, D., Feldman, C., Willingale, R., Doel, P., Wang, H., Smith, A., James, A.

المصدر: CAS 2010 Proceedings (International Semiconductor Conference) Semiconductor Conference (CAS), 2010 International. 01:155-158 Oct, 2010

Relation: 2010 International Semiconductor Conference (CAS 2010)

المؤلفون: Babarada, F., Profirescu, M.D., Dunare, C.

المصدر: 2004 International Semiconductor Conference. CAS 2004 Proceedings (IEEE Cat. No.04TH8748) Semiconductor conference Semiconductor Conference, 2004. CAS 2004 Proceedings. 2004 International. 2:307-310 vol.2 2004

Relation: 2004 International Semiconductor Conference. CAS 2004 Proceedings