المؤلفون: Meihar, P., Srinu, R., Lashkare, S., Singh, A.K., Mulaosmanovic, H., Deshpande, V., Dunkel, S., Beyer, S., Ganguly, U.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(5):2957-2962 May, 2024

المؤلفون: Meihar, P., Srinu, R., Saraswat, V., Lashkare, S., Mulaosmanovic, H., Singh, A.K., Dunkel, S., Beyer, S., Ganguly, U.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(4):2380-2385 Apr, 2024

المؤلفون: Muller, F., De, S., Olivo, R., Lederer, M., Altawil, A., Hoffmann, R., Kampfe, T., Ali, T., Dunkel, S., Mulaosmanovic, H., Muller, J., Beyer, S., Seidel, K., Gerlach, G.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 44(5):757-760 May, 2023

المؤلفون: De, S., Muller, F., Laleni, N., Lederer, M., Raffel, Y., Mojumder, S., Vardar, A., Abdulazhanov, S., Ali, T., Dunkel, S., Beyer, S., Seidel, K., Kampfe, T.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 43(12):2081-2084 Dec, 2022

المؤلفون: De, S., Muller, F., Thunder, S., Abdulazhanov, S., Laleni, N., Lederer, M., Ali, T., Raffel, Y., Dunkel, S., Mojumder, S., Vardar, A., Beyer, S., Seidel, K., Kampfe, T.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(12):7194-7198 Dec, 2022

المؤلفون: Kleimaier, D., Mulaosmanovic, H., Dunkel, S., Beyer, S., Soss, S., Slesazeck, S., Mikolajick, T.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 42(12):1774-1777 Dec, 2021

المؤلفون: Mulaosmanovic, H., Dunkel, S., Kleimaier, D., Kacimi, A.e., Beyer, S., Breyer, E.T., Mikolajick, T., Slesazeck, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 68(9):4773-4779 Sep, 2021

المؤلفون: Jourba, S., Bollon, N., Decobert, C., Festes, G., Bertello, B., Zhou, F., Markov, V., Tkachev, Y., Kim, J., Ghazav, P., Liu, X., Do, N., Richter, R., Dunkel, S., Trentzsch, M., Zaka, A., Herrmann, T., Melde, T., Muller, B., Mauersberger, F., Bayha, B., Wittek, S., Duggan, M., Beyer, S.

المصدر: 2020 IEEE International Memory Workshop (IMW) Memory Workshop (IMW), 2020 IEEE International. :1-4 May, 2020

Relation: 2020 IEEE International Memory Workshop (IMW)

المؤلفون: Lederer, M., Muller, F., Kuhnel, K., Olivo, R., Mertens, K., Trentzsch, M., Dunkel, S., Muller, J., Beyer, S., Seidel, K., Kampfe, T., Eng, L.M.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 41(12):1762-1765 Dec, 2020

المؤلفون: Mulaosmanovic, H., Dunkel, S., Trentzsch, M., Beyer, S., Breyer, E.T., Mikolajick, T., Slesazeck, S.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(12):5804-5809 Dec, 2020