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1دورية أكاديمية
المؤلفون: Veloso, A., Jourdain, A., Radisic, D., Chen, R., Arutchelvan, G., O'Sullivan, B., Arimura, H., Stucchi, M., De Keersgieter, A., Hosseini, M., Hopf, T., D'have, K., Wang, S., Dupuy, E., Mannaert, G., Vandersmissen, K., Iacovo, S., Marien, P., Choudhury, S., Schleicher, F., Sebaai, F., Oniki, Y., Zhou, X., Gupta, A., Schram, T., Briggs, B., Lorant, C., Rosseel, E., Hikavyy, A., Loo, R., Geypen, J., Batuk, D., Martinez, G.T., Soulie, J.P., Devriendt, K., Chan, B.T., Demuynck, S., Hiblot, G., Van der Plas, G., Ryckaert, J., Beyer, G., Litta, E.D., Beyne, E., Horiguchi, N.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 69(12):7173-7179 Dec, 2022
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2مؤتمر
المؤلفون: Mertens, H., Hosseini, M., Chiarella, T., Zhou, D., Wang, S., Mannaert, G., Dupuy, E., Radisic, D., Tao, Z., Oniki, Y., Hikavyy, A., Rosseel, R., Mingardi, A., Choudhury, S., Gowda, P. Puttarame, Sebaai, F., Peter, A., Vandersmissen, K., Soulie, J.P., Keersgieter, A. De, Lima, L. Petersen Barbosa, Cavalcante, C., Batuk, D., Martinez, G.T., Geypen, J., Seidel, F., Paulussen, K., Favia, P., Boemmels, J., Loo, R., Wong, P., Marquez, A. Sepulveda, Chan, B.T., Mitard, J., Subramanian, S., Demuynck, S., Litta, E. Dentoni, Horiguchi, N., Samavedam, S., Biesemans, S.
المصدر: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2023 IEEE Symposium on. :1-2 Jun, 2023
Relation: 2023 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
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3مؤتمر
المؤلفون: Capogreco, E., Arimura, H., Ritzenthaler, R., Brus, S., Oniki, Y., Dupuy, E., Sebaai, F., Radisic, D., Chan, B. T., Zhou, D., Machkaoutsan, V., Yoon, S., Itokawa, H., Yamaguchi, M., Gao, Z., Fazan, P., Chen, Y., Subramanian, S., Ragnarsson, L.-A., Spessot, A., Litta, E. Dentoni, Horiguchi, N.
المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :26.2.1-26.2.4 Dec, 2022
Relation: 2022 IEEE International Electron Devices Meeting (IEDM)
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4مؤتمر
المؤلفون: Mertens, H., Ritzenthaler, R., Oniki, Y., Gowda, P. Puttarame, Mannaert, G., Sebaai, F., Hikavyy, A., Rosseel, E., Dupuy, E., Peter, A., Vandersmissen, K., Radisic, D., Briggs, B., Batuk, D., Geypen, J., Martinez-Alanis, G., Seidel, F., Richard, O., Chan, B.T., Mitard, J., Litta, E. Dentoni, Horiguchi, N.
المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :23.1.1-23.1.4 Dec, 2022
Relation: 2022 IEEE International Electron Devices Meeting (IEDM)
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5مؤتمر
المؤلفون: Ritzenthaler, R., Capogreco, E., Dupuy, E., Arimura, H., Bastos, J. P., Favia, P., Sebaai, F., Radisic, D., Nguyen, V. T. H., Mannaert, G., Chan, B. T., Machkaoutsan, V., Yoon, Y., Itokawa, H., Yamaguchi, M., Chen, Y., Fazan, P., Subramanian, S., Spessot, A., Dentoni Litta, E., Samavedam, S., Horiguchi, N.
المصدر: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits) VLSI Technology and Circuits (VLSI Technology and Circuits), 2022 IEEE Symposium on. :306-307 Jun, 2022
Relation: 2022 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits)
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6دورية أكاديمية
المؤلفون: Hiblot, G., Parihar, N., Dupuy, E., Mannaert, G., Baudot, S., Kaczer, B., Franco, J., Vandooren, A., De Heyn, V., Mercha, A.
المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 21(2):192-198 Jun, 2021
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7مؤتمر
المؤلفون: Boubaaya, M., O'Sullivan, B. J., Franco, J., Litta, E. D., Ritzenthaler, R., Dupuy, E., Machkaoutsan, V., Fazan, P., Kim, C., Benaceur-Doumaz, D., Ferhat Hamida, A., Djezzar, B., Spessot, A., Linten, D., Horiguchi, N.
المصدر: 2019 IEEE International Integrated Reliability Workshop (IIRW) Integrated Reliability Workshop (IIRW), 2019 IEEE International. :1-5 Oct, 2019
Relation: 2019 IEEE International Integrated Reliability Workshop (IIRW)
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8دورية أكاديمية
المؤلفون: Gupta, A., Pedreira, O.V., Arutchelvan, G., Zahedmanesh, H., Devriendt, K., Mertens, H., Tao, Z., Ritzenthaler, R., Wang, S., Radisic, D., Kenis, K., Teugels, L., Sebai, F., Lorant, C., Jourdan, N., Chan, B.T., Subramanian, S., Schleicher, F., Hopf, T., Peter, A.P., Rassoul, N., Debruyn, H., Demonie, I., Siew, Y.K., Chiarella, T., Briggs, B., Zhou, X., Rosseel, E., De Keersgieter, A., Capogreco, E., Litta, E.D., Boccardi, G., Baudot, S., Mannaert, G., Bontemps, N., Sepulveda, A., Mertens, S., Kim, M., Dupuy, E., Vandersmissen, K., Paolillo, S., Yakimets, D., Chehab, B., Favia, P., Drijbooms, C., Cousserier, J., Jaysankar, M., Lazzarino, F., Morin, P., Altamirano, E., Mitard, J., Wilson, C.J., Holsteyns, F., Boemmels, J., Demuynck, S., Tokei, Z., Horiguchi, N.
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 67(12):5349-5354 Dec, 2020
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9دورية أكاديمية
المؤلفون: Boubaaya, M., O'Sullivan, B.J., Djezzar, B., Franco, J., Litta, E.D., Ritzenthaler, R., Dupuy, E., Machkaoutsan, V., Fazan, P., Kim, C., Bennaceur-Doumaz, D., Hamida, A.F., Spessot, A., Linten, D., Horiguchi, N.
المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 20(2):269-277 Jun, 2020
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10مؤتمر
المؤلفون: Mertens, H., Ritzenthaler, R., Oniki, Y., Briggs, B., Chan, B.T., Hikavyy, A., Hopf, T., Mannaert, G., Tao, Z., Sebaai, F., Peter, A., Vandersmissen, K., Dupuy, E., Rosseel, E., Batuk, D., Geypen, J., Martinez, G. T., Abigail, D., Grieten, E., Dehave, K., Mitard, J., Subramanian, S., Ragnarsson, L.-A., Weckx, P., Jang, D., Chehab, B., Hellings, G., Ryckaert, J., Litta, E. Dentoni, Horiguchi, N.
المصدر: 2021 Symposium on VLSI Technology VLSI Technology, 2021 Symposium on. :1-2 Jun, 2021
Relation: 2021 Symposium on VLSI Technology