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1مؤتمرFull Wafer Process Control Through Object Detection Using Region-Based Convolutional Neural Networks
المؤلفون: Alcaire, Thomas, Le Cunff, Delphine, Tortai, Jean-Herve, Soulan, Sebastien, Brouzet, Virginie, Duru, Romain, Euvrard, Christophe
المصدر: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2022 33rd Annual. :1-5 May, 2022
Relation: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
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2مؤتمر
المؤلفون: Duru, Romain, Mica, Isabella, Frascaroli, Jacopo, Bellanger, Pierre
المصدر: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2022 33rd Annual. :1-6 May, 2022
Relation: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
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3مؤتمر
المؤلفون: Nassiet, Thomas, Duru, Romain, Le-Cunff, Delphine, Arnaud, Arthur, Bluet, Jean-Marie, Bremond, Georges
المصدر: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2020 31st Annual. :1-6 Aug, 2020
Relation: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
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4مؤتمر
المؤلفون: Joblot, Sylvain, Duru, Romain, Guitard, Nicolas, Lu, Vincent, Nassiet, Thomas, Beneyton, Remi, Cristiano, Fuccio, Dabertrand, Karen, Borrel, Julien, Juhel, Marc, Arevalo, Edwin, Monsieur, Frederic, Borowiak, Celine, Ghegin, Elodie, Clement, Laurent, Oudot, Evan, Rideau, Denis, Zou, Wei, Pinzelli, Luc
المصدر: 2018 22nd International Conference on Ion Implantation Technology (IIT) Ion Implantation Technology (IIT), 2018 22nd International Conference on. :121-124 Sep, 2018
Relation: 2018 22nd International Conference on Ion Implantation Technology (IIT)
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5دورية أكاديمية
المؤلفون: Bordignon, Thomas, Duriez, Blandine, Guitard, Nicolas, Duru, Romain, Pribat, Clément, Richy, Jérôme, Reboh, Shay, Dhar, Siddhartha, Monsieur, Frédéric, Fache, Thibaud, Chalupa, Zdenek, Hartmann, Jean-Michel, Chevalier, Pascal, Roelens, Yannick, Danneville, François, Crémer, Sébastien
المصدر: In Solid State Electronics December 2023 210
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6مؤتمر
المؤلفون: Duru, Romain, Le-Cunff, Delphine, Cannac, Maxime, Laurent, Nicolas, Dudas, Laszlo, Kiss, Zoltan, Cseh, David, Lajtos, Imre, Jay, Frederic, Nadudvari, Gyorgy
المصدر: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2017 28th Annual SEMI. :262-266 May, 2017
Relation: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)
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7دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
8دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
9دورية أكاديمية
المصدر: Physica Status Solidi. A: Applications & Materials Science; May2022, Vol. 219 Issue 9, p1-7, 7p
مصطلحات موضوعية: COPPER, SURFACE recombination, CORONA discharge, VOLTAGE, SILICON, IRON, FERROSILICON
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10دورية أكاديمية
المؤلفون: Rozé, Fabien, Gourhant, Olivier, Blanquet, Elisabeth, Bertin, François, Juhel, Marc, Abbate, Francesco, Pribat, Clément, Duru, Romain
المصدر: Journal of Applied Physics; 2017, Vol. 121 Issue 24, p1-10, 10p