يعرض 1 - 10 نتائج من 32 نتيجة بحث عن '"Duru, Romain"', وقت الاستعلام: 1.04s تنقيح النتائج
  1. 1
    مؤتمر
    Full Wafer Process Control Through Object Detection Using Region-Based Convolutional Neural Networks

    المؤلفون: Alcaire, Thomas, Le Cunff, Delphine, Tortai, Jean-Herve, Soulan, Sebastien, Brouzet, Virginie, Duru, Romain, Euvrard, Christophe

    المصدر: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2022 33rd Annual. :1-5 May, 2022

    Relation: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

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  2. 2
    مؤتمر
    Photoluminescence imaging for slip line detection and characterization in silicon substrates

    المؤلفون: Duru, Romain, Mica, Isabella, Frascaroli, Jacopo, Bellanger, Pierre

    المصدر: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2022 33rd Annual. :1-6 May, 2022

    Relation: 2022 33rd Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

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  3. 3
    مؤتمر
    Investigation of Photoluminescence Voltage PL-V Measurement: Correlation to Capacitance Voltage C-V for Si/Dielectric Interface Characterization

    المؤلفون: Nassiet, Thomas, Duru, Romain, Le-Cunff, Delphine, Arnaud, Arthur, Bluet, Jean-Marie, Bremond, Georges

    المصدر: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) SEMI Advanced Semiconductor Manufacturing Conference (ASMC), 2020 31st Annual. :1-6 Aug, 2020

    Relation: 2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

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  4. 4
    مؤتمر
    Characterization of Heated Ion Implantation for non Amorphizing Conditions and Correlation with Kinetic Monte Carlo Simulations

    المؤلفون: Joblot, Sylvain, Duru, Romain, Guitard, Nicolas, Lu, Vincent, Nassiet, Thomas, Beneyton, Remi, Cristiano, Fuccio, Dabertrand, Karen, Borrel, Julien, Juhel, Marc, Arevalo, Edwin, Monsieur, Frederic, Borowiak, Celine, Ghegin, Elodie, Clement, Laurent, Oudot, Evan, Rideau, Denis, Zou, Wei, Pinzelli, Luc

    المصدر: 2018 22nd International Conference on Ion Implantation Technology (IIT) Ion Implantation Technology (IIT), 2018 22nd International Conference on. :121-124 Sep, 2018

    Relation: 2018 22nd International Conference on Ion Implantation Technology (IIT)

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  5. 5
    دورية أكاديمية
    Computational model for predicting structural stability and stress transfer of a new SiGe stressor technique for NMOS devices

    المؤلفون: Bordignon, Thomas, Duriez, Blandine, Guitard, Nicolas, Duru, Romain, Pribat, Clément, Richy, Jérôme, Reboh, Shay, Dhar, Siddhartha, Monsieur, Frédéric, Fache, Thibaud, Chalupa, Zdenek, Hartmann, Jean-Michel, Chevalier, Pascal, Roelens, Yannick, Danneville, François, Crémer, Sébastien

    المصدر: In Solid State Electronics December 2023 210

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  6. 6
    مؤتمر
    Photoluminescence for in-line buried defects detection in silicon devices

    المؤلفون: Duru, Romain, Le-Cunff, Delphine, Cannac, Maxime, Laurent, Nicolas, Dudas, Laszlo, Kiss, Zoltan, Cseh, David, Lajtos, Imre, Jay, Frederic, Nadudvari, Gyorgy

    المصدر: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) Advanced Semiconductor Manufacturing Conference (ASMC), 2017 28th Annual SEMI. :262-266 May, 2017

    Relation: 2017 28th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC)

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  7. 7
    دورية أكاديمية

    لا يتم عرض هذه النتيجة على الضيوف.

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  8. 8
    دورية أكاديمية

    لا يتم عرض هذه النتيجة على الضيوف.

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  9. 9
    دورية أكاديمية
    The Impact of Surface Voltage on Photoluminescence Response for the Detection of Copper and Iron Contamination in Silicon.

    المؤلفون: Nassiet, Thomas, Duru, Romain, Le-Cunff, Delphine, Bremond, Georges, Bluet, Jean-Marie

    المصدر: Physica Status Solidi. A: Applications & Materials Science; May2022, Vol. 219 Issue 9, p1-7, 7p

    مصطلحات موضوعية: COPPER, SURFACE recombination, CORONA discharge, VOLTAGE, SILICON, IRON, FERROSILICON

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  10. 10
    دورية أكاديمية
    Oxidation kinetics of Si and SiGe by dry rapid thermal oxidation, in-situ steam generation oxidation and dry furnace oxidation.

    المؤلفون: Rozé, Fabien, Gourhant, Olivier, Blanquet, Elisabeth, Bertin, François, Juhel, Marc, Abbate, Francesco, Pribat, Clément, Duru, Romain

    المصدر: Journal of Applied Physics; 2017, Vol. 121 Issue 24, p1-10, 10p

    مصطلحات موضوعية: OXIDATION kinetics, ELECTRIC insulators & insulation, CHEMICAL kinetics, CONDENSATION kinetics, REACTIVITY (Chemistry)

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