المؤلفون: Thonnart, Yvain, Bernabe, Stephane, Charbonnier, Jean, Bernard, Christian, Coriat, David, Fuguet, Cesar, Tissier, Pierre, Charbonnier, Benoit, Malhouitre, Stephane, Saint-Patrice, Damien, Assous, Myriam, Narayan, Aditya, Coskun, Ayse, Dutoit, D., Vivet, P.

المصدر: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE). :1456-1461 Mar, 2020

Relation: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)

المؤلفون: Vivet, P., Guthmuller, E., Thonnart, Y., Pillonnet, G., Fuguet, C., Miro-Panades, I., Moritz, G., Durupt, J., Bernard, C., Varreau, D., Pontes, J., Thuries, S., Coriat, D., Harrand, M., Dutoit, D., Lattard, D., Arnaud, L., Charbonnier, J., Coudrain, P., Garnier, A., Berger, F., Gueugnot, A., Greiner, A., Meunier, Q.L., Farcy, A., Arriordaz, A., Cheramy, S., Clermidy, F.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 56(1):79-97 Jan, 2021

المؤلفون: Coudrain, Perceval, Charbonnier, J., Garnier, A., Vivet, P., Velard, R., Vinci, A., Ponthenier, F., Farcy, A., Segaud, R., Chausse, P., Arnaud, L., Lattard, D., Guthmuller, E., Romano, G., Gueugnot, A., Berger, F., Beltritti, J., Mourier, T., Gottardi, M., Minoret, S., Ribiere, C., Romero, G., Philip, P.-E., Exbrayat, Y., Scevola, D., Campos, D., Argoud, M., Allouti, N., Eleouet, R., Fuguet Tortolero, C., Aumont, C., Dutoit, D., Legalland, C., Michailos, J., Cheramy, S., Simon, G.

المصدر: 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) Electronic Components and Technology Conference (ECTC), 2019 IEEE 69th. :569-578 May, 2019

Relation: 2019 IEEE 69th Electronic Components and Technology Conference (ECTC)

المؤلفون: Rigo, A., Pinto, C., Pouget, K., Raho, D., Dutoit, D., Martinez, P.-Y., Doran, C., Benini, L., Mavroidis, I., Marazakis, M., Bartsch, V., Lonsdale, G., Pop, A., Goodacre, J., Colliot, A., Carpenter, P., Radojkovic, P., Pleiter, D., Drouin, D., Dupont de Dinechin, B.

المصدر: 2017 Euromicro Conference on Digital System Design (DSD) DSD Digital System Design (DSD), 2017 Euromicro Conference on. :486-493 Aug, 2017

Relation: 2017 Euromicro Conference on Digital System Design (DSD)

المؤلفون: Martinez, P. Y., Beilliard, Y., Godard, M., Danovitch, D., Drouin, D., Charbonnier, J., Coudrain, P., Garnier, A., Lattard, D., Vivet, P., Cheramy, S., Guthmuller, E., Tortolero, C. Fuguet, Mengue, V., Durupt, J., Philippe, A., Dutoit, D.

المصدر: 2020 IEEE Symposium on VLSI Technology VLSI Technology, 2020 IEEE Symposium on. :1-2 Jun, 2020

Relation: 2020 IEEE Symposium on VLSI Technology

المؤلفون: Dutoit, D., Coudrain, P., Martinez, P.-Y., Vivet, P., Charbonnier, J., Garnier, A., Lattard, D., Cheramy, S., Guthmuller, E., Philippe, A., Thonnart, Y., Clermidy, F.

المصدر: 2020 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2020 IEEE International. :15.3.1-15.3.4 Dec, 2020

Relation: 2020 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Vivet, P., Thonnart, Y., Lemaire, R., Santos, C., Beigne, E., Bernard, C., Darve, F., Lattard, D., Miro-Panades, I., Dutoit, D., Clermidy, F., Cheramy, S., Sheibanyrad, A., Petrot, F., Flamand, E., Michailos, J., Arriordaz, A., Wang, L., Schloeffel, J.

المصدر: IEEE Journal of Solid-State Circuits IEEE J. Solid-State Circuits Solid-State Circuits, IEEE Journal of. 52(1):33-49 Jan, 2017

المؤلفون: Clermidy, F., Dutoit, D., Guthmuller, E., Miro-Panades, I., Vivet, P.

المصدر: 2013 IEEE International Symposium on Circuits and Systems (ISCAS) Circuits and Systems (ISCAS), 2013 IEEE International Symposium on. :537-540 May, 2013

Relation: 2013 IEEE International Symposium on Circuits and Systems (ISCAS)

المؤلفون: Dutoit, D., Guthmuller, E., Miro-Panades, I.

المصدر: 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013. :779-784 Mar, 2013

Relation: 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE 2013)

المؤلفون: Clermidy, F., Vivet, P., Dutoit, D., Thonnart, Y., Gonzales, J. L., Noel, J. P, Giraud, B., Levisse, A., Billoint, O., Thuries, S.

المصدر: 2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :35.1.1-35.1.4 Dec, 2016

Relation: 2016 IEEE International Electron Devices Meeting (IEDM)