المؤلفون: Filippo Giannazzo, Salvo Mirabella, D. Goghero, E Napolitane, F. Priolo, Vito Raineri

المصدر: Scopus-Elsevier
Microscopy of Semiconducting Materials 2003 ISBN: 9781351074636
Microscopy of Semiconducting Materials 2003
Conference on Microscopy of Semiconducting Materials, pp. 363–372, Univ Cambridge, Cambridge, ENGLAND, MAR 31, 2003
info:cnr-pdr/source/autori:Raineri V, Goghero D, Giannazzo F, Mirabella S, Priolo F, Napolitani E/congresso_nome:Conference on Microscopy of Semiconducting Materials/congresso_luogo:Univ Cambridge, Cambridge, ENGLAND/congresso_data:MAR 31, 2003/anno:2003/pagina_da:363/pagina_a:372/intervallo_pagine:363–372

مصطلحات موضوعية: Materials science, Semiconductor, business.industry, Scientific method, Optoelectronics, Scanning capacitance microscopy, SILICON, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f6bb5a2add4a547bfccbf0dd52b40d6e
http://hdl.handle.net/20.500.11769/76395