-
1
المؤلفون: Denis V. Shilin, Nru Mpei, Dmitriy A. Shestov, E. Ganin
المصدر: Vestnik MEI. 3:116-123
مصطلحات موضوعية: Stream flow, Metre, Environmental science, Strain gauge, Marine engineering
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::678e769b4d4e8a2d82b27f0b1885bd5a
https://doi.org/10.24160/1993-6982-2019-3-116-123 -
2
المؤلفون: V. F. Golovko, M. E. Ganin, N. G. Kodochigov
المصدر: Atomic Energy. 114:108-114
مصطلحات موضوعية: Nuclear Energy and Engineering, Rotor (electric), law, Nuclear engineering, Centrifugal compressor, Turbomachinery, Frequency grid, Energy transformation, Environmental science, Rotational speed, Freewheel, Gas compressor, law.invention
-
3
المؤلفون: V. F. Golovko, V. V. Petrunin, N. G. Abrosimov, A. V. Vasyaev, D. L. Zverev, M. E. Ganin, N. G. Kodochigov, N. N. Ponomarev-Stepnoi
المصدر: Atomic Energy. 108:89-96
مصطلحات موضوعية: Nuclear fission product, Dry cask storage, Nuclear fuel, business.industry, Nuclear engineering, Nuclear reactor, Nuclear power, law.invention, Nuclear physics, Energy development, Nuclear Energy and Engineering, law, Reactor system, Nuclear power plant, Environmental science, business
-
4
المؤلفون: Andrew J. Steckl, E. Ganin, H.C. Mogul
المصدر: IEEE Transactions on Electron Devices. 40:1823-1829
مصطلحات موضوعية: Materials science, Silicon, Doping, Analytical chemistry, chemistry.chemical_element, Semiconductor device, Focused ion beam, Electronic, Optical and Magnetic Materials, Ion implantation, chemistry, CMOS, Electrical and Electronic Engineering, Gallium, Diode
-
5
المؤلفون: M.R. Wordeman, George Anthony Sai-Halasz, R.H. Dennard, E. Ganin, Tai-Hon Philip Chang, S. A. Rishton, Dieter P. Kern
المصدر: IBM Journal of Research and Development. 34:452-465
مصطلحات موضوعية: Materials science, General Computer Science, Silicon, business.industry, Transconductance, Electrical engineering, chemistry.chemical_element, Liquid nitrogen, chemistry, Velocity overshoot, Optoelectronics, Field-effect transistor, business, Lithography, Electron-beam lithography, Voltage
-
6
المؤلفون: Emmanuel F. Crabbe, S.S. Iyer, Bernard S. Meyerson, David L. Harame, E. Ganin, J.M.C. Stork, Gary L. Patton
المصدر: Proceedings of the Bipolar Circuits and Technology Meeting.
مصطلحات موضوعية: Materials science, business.industry, Transistor, Bipolar junction transistor, Heterojunction, law.invention, Silicon-germanium, chemistry.chemical_compound, chemistry, law, Electronic engineering, Optoelectronics, Homojunction, business, Current density, Sheet resistance, Common emitter
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ea3f60f873fe3f357dfb6b7bee58b4cb
https://doi.org/10.1109/bipol.1989.69460 -
7
المؤلفون: S.S. Iyer, Emmanuel F. Crabbe, E. Ganin, J.M.C. Stork, G. J. Scilla, Bernard S. Meyerson, Gary L. Patton, David L. Harame
المصدر: Technical Digest., International Electron Devices Meeting.
مصطلحات موضوعية: Materials science, business.industry, Heterojunction bipolar transistor, Transistor, Bipolar junction transistor, Heterojunction, Epitaxy, law.invention, Secondary ion mass spectrometry, law, Optoelectronics, business, Common emitter, Molecular beam epitaxy
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::dd0447224396b4feec533a031c353919
https://doi.org/10.1109/iedm.1988.32954 -
8
المؤلفون: E. Beyer, Ronald A. DellaGuardia, M. McCord, R. Schulz, S. Wu, E. Ganin, P.A. McFarland, A. Acovic, B. Martin, Asit Kumar Ray, Stephen E. Greco, Emmanuel F. Crabbe, Jonathan Z. Sun, James H. Comfort, Paul D. Agnello, H. Ng, S. Subbanna, A. Lamberti, R. Gehres, J. Snare, Thomas Harold Newman, Lars W. Liebmann
المصدر: Proceedings of 1994 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Materials science, business.industry, X-ray, law.invention, CMOS, law, Shallow trench isolation, Process integration, Optoelectronics, X-ray lithography, Photolithography, business, Lithography, Communication channel
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::683073600d0d28918180f89aefcda71c
https://doi.org/10.1109/iedm.1994.383318 -
9
المؤلفون: Paul Ronsheim, M.J. Saccamango, J.Y.-C. Sun, James H. Comfort, S. Verdonckt-Vandebroek, S. Ratanaphanyarat, Jeffrey B. Johnson, Phillip J. Restle, David L. Harame, A. Acovic, E. Ganin, S.A. Furkay, Stephan A. Cohen
المصدر: International Electron Devices Meeting 1991 [Technical Digest].
مصطلحات موضوعية: Very-large-scale integration, Materials science, business.industry, Phosphorus, Electrical engineering, chemistry.chemical_element, Ion implantation, chemistry, Antimony, CMOS, Thermal, Optoelectronics, business, NMOS logic
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::44d6557b50fa57dc38688a002b41321f
https://doi.org/10.1109/iedm.1991.235389 -
10
المؤلفون: James H. Comfort, Lars W. Liebmann, D. Sunderland, Paul D. Agnello, Emmanuel F. Crabbe, S. Subbanna, Thomas Harold Newman, E. Ganin
المصدر: 1995 Symposium on VLSI Technology. Digest of Technical Papers.
مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Phase (waves), Edge (geometry), law.invention, Resist, CMOS, law, Optoelectronics, X-ray lithography, Stepper, Photolithography, business, Lithography
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::acd959af38650a629a74d4a77d891f68
https://doi.org/10.1109/vlsit.1995.520867