مصطلحات موضوعية: METIS-200759, EWI-15639, Hardware_GENERAL, antenna structure, Hardware_INTEGRATEDCIRCUITS, metaloxide-semiconductor (MOS), metal-insulator-metalcapacitor(MIMC), Hardware_PERFORMANCEANDRELIABILITY, IR-67786, charging-induced damage (CID), Computer Science::Information Theory

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dris___00893::2cf6b03adadf4d3d0fb3af206d1517eb
http://eprints.eemcs.utwente.nl/secure2/15639/01/wang_z.pdf

المؤلفون: Wang, Zhichun, Ackaert, Jan, Salm, Cora, Kuper, F.G.

المصدر: Proceedings of the 4th annual workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2001, 220-223
STARTPAGE=220;ENDPAGE=223;TITLE=Proceedings of the 4th annual workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2001

مصطلحات موضوعية: METIS-200759, EWI-15639, Hardware_GENERAL, antenna structure, Hardware_INTEGRATEDCIRCUITS, metaloxide-semiconductor (MOS), metal-insulator-metalcapacitor(MIMC), Hardware_PERFORMANCEANDRELIABILITY, IR-67786, charging-induced damage (CID), Computer Science::Information Theory

URL الوصول: https://explore.openaire.eu/search/publication?articleId=narcis______::0b62b853d10925590ae1ebb68f30d0f5
https://research.utwente.nl/en/publications/charging-induced-damage-on-complexantenna-test-structures(223d2c06-e7e9-4119-8151-0c9d8a25b6a9).html