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المؤلفون: Roger Julian, Ming Liang, David Sprayberry, Gary Muller, Jian Ge, Ed Heileman, Chris Packham, Dick Joyce, Neil Gaughan, Jim French, Stephen S. Eikenberry, Kenneth H. Hinkle
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Diffraction, Physics, Radial velocity, Optics, Infrared, business.industry, Near-infrared spectroscopy, Systems engineering, High resolution, Spectroscopy, business, Spectrograph
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d52fa3a17913d0b91b64827c34880cd4
https://doi.org/10.1117/12.672368