المؤلفون: Nirschl, T., Schaper, U., Einfeld, J., Henzler, S., Sterkel, M., Singer, J., Fulde, M., Hansch, W., Georgakos, G., Schmitt-Landsiedell, D.

المصدر: Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :43-46 2005

Relation: ICMTS 2005. Proceedings of the 2005 International Conference on Microelectronic Test Structures

المؤلفون: Schaper, U., Einfeld, J., Sauerbrey, A.

المصدر: Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :155-158 2005

Relation: ICMTS 2005. Proceedings of the 2005 International Conference on Microelectronic Test Structures

المؤلفون: Nirschl, T., Henzler, St., Fischer, J., Bargagli-Stoffi, A., Fulde, M., Sterkel, M., Teichmann, P., Schaper, U., Einfeld, J., Linnenbank, C., Sedlmeir, J., Weber, C., Heinrich, R., Ostermayr, N., Olbrich, A., Dobler, B., Ruderer, E., Kakoschke, R., Schrufert, K., Georgakos, G., Hansch, W., Schmitt-Landsiedel, D.

المصدر: Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Solid-State Device Research Conference Solid-State Device Research Conference, 2005. ESSDERC 2005. Proceedings of 35th European. :173-176 2005

Relation: Proceedings of ESSDERC 2005. 31st European Solid-State Device Research Conference

المؤلفون: Einfeld, J., Schaper, U., Kollmer, U., Nelle, P., Englisch, J., Stecher, M.

المصدر: Proceedings of the 2004 International Conference on Microelectronic Test Structures (IEEE Cat. No.04CH37516) Microelectronic test structures Microelectronic Test Structures, 2004. Proceedings. ICMTS '04. The International Conference on. :127-131 2004

Relation: Proceedings of the 2004 International Conference on Microelectronic Test Structures

المؤلفون: Schaper, U., Einfeld, J.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 32(7):859-861 Jul, 2011

المؤلفون: Wordenweber, R., Lahl, P., Einfeld, J.

المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 11(1):2812-2815 Mar, 2001

المؤلفون: Wordenweber, R., Einfeld, J., Kutzner, R., Zaitsev, A.G., Hein, M.A., Kaiser, T., Muller, G.

المصدر: IEEE Transactions on Applied Superconductivity IEEE Trans. Appl. Supercond. Applied Superconductivity, IEEE Transactions on. 9(2):2486-2491 Jun, 1999

المؤلفون: Einfeld, J., Lahl, P., Kutzner, R., Zaitsev, A. G., Kruger, U., Wordenweber, R.

المصدر: 1999 29th European Microwave Conference Microwave Conference, 1999. 29th European. 3:219-222 Oct, 1999

Relation: 1999 29th European Microwave Conference

المؤلفون: Nirschl, Th., Henzler, St., Fischer, J., Fulde, M., Bargagli-Stoffi, A., Sterkel, M., Sedlmeir, J., Weber, C., Heinrich, R., Schaper, U., Einfeld, J., Neubert, R., Feldmann, U., Stahrenberg, K., Ruderer, E., Georgakos, G., Huber, A., Kakoschke, R., Hansch, W., Schmitt-Landsiedel, D.

المصدر: In Solid State Electronics 2006 50(1):44-51

المؤلفون: Einfeld, J, Lahl, P, Kutzner, R, Wördenweber, R, Kästner, G

المصدر: In Physica C: Superconductivity and its applications 2001 351(2):103-117