-
1
المؤلفون: Zihao Ding, M. De Graef, Elena Pascal
المصدر: Acta Materialia. 199:370-382
مصطلحات موضوعية: 010302 applied physics, Diffraction, Materials science, Polymers and Plastics, business.industry, Search engine indexing, Metals and Alloys, Pattern recognition, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Convolutional neural network, Electronic, Optical and Magnetic Materials, Visualization, Backscatter X-ray, Robustness (computer science), 0103 physical sciences, Data_FILES, Ceramics and Composites, Artificial intelligence, 0210 nano-technology, business
-
2
المؤلفون: Benjamin H. Williams, Richard J. Gildea, James Beilsten-Edmands, Gwyndaf Evans, David McDonagh, David G. Waterman, Elena Pascal, Graeme Winter, Markus Gerstel, Nicholas E. Devenish
المصدر: Protein Science : A Publication of the Protein Society
مصطلحات موضوعية: methods development, Data processing, Engineering drawing, Electronic Data Processing, Tools for Protein Science, business.industry, Computer science, software, Suite, X‐ray crystallography, Crystallography, X-Ray, Biochemistry, Open source, Software, open source, business, Molecular Biology, Bespoke
-
3
المؤلفون: F. Mehnke, A. Alasmari, T. Wernicke, Aimo Winkelmann, Elena Pascal, L. Jiu, S. Hagedorn, Philip A. Shields, B.M. Jablon, W. Avis, Paul R. Edwards, Peter J. Parbrook, M. Nouf-Allehiani, Y. Gong, C. Kuhn, Yonghao Zhang, Gunnar Kusch, Robert W. Martin, Michael Kneissl, Jochen Bruckbauer, Benjamin Hourahine, S. Vespucci, Tao Wang, S. Kraeusel, J. Enslin, R. McDermott, P. M. Coulon, G. Naresh-Kumar, Carol Trager-Cowan, M. D. Smith, Sebastian Walde, R. M. Smith, Markus Weyers, Roy L. Johnston, Arne Knauer, Ken Mingard, David M. Thomson
مصطلحات موضوعية: Diffraction, Crystal, Materials science, Misorientation, Scanning electron microscope, business.industry, Optoelectronics, Grain boundary, Thin film, Channelling, business, QC, Electron backscatter diffraction
وصف الملف: application/pdf
-
4
المؤلفون: Jochen Bruckbauer, Ben Hourahine, William Avis, Angus J. Wilkinson, M. Nouf-Allehiani, Ken Mingard, David J. Thomson, Albes Kotzai, Ryan McDermott, Gunnar Kusch, Robert W. Martin, Dale Waters, Arantxa Vilalta-Clemente, Paul R. Edwards, Aeshah Alasamari, Aimo Winkelmann, Peter J. Parbrook, Carol Trager-Cowan, G. Naresh-Kumar, Elena Pascal
المصدر: Gallium Nitride Materials and Devices XV.
مصطلحات موضوعية: Presentation, Materials science, business.industry, Scanning electron microscope, media_common.quotation_subject, Optoelectronics, Electron, Nitride semiconductors, business, Visualization, media_common
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ac4804a723551139bd5e9c577f72eac0
https://doi.org/10.1117/12.2544228 -
5
المؤلفون: Arne Knauer, Christian Kuhn, Marcus Weyers, M. D. Smith, Benjamin Hourahine, S. Hagedorn, M. Nouf-Allehiani, G. Naresh-Kumar, Elena Pascal, David M. Thomson, Peter J. Parbrook, Y. Gong, Sebastian Walde, A Kotzai, S. Kraeusel, R. M. Smith, W. Avis, Tim Wernicke, Gunnar Kusch, Robert W. Martin, Tao Wang, L. Jiu, Aimo Winkelmann, Johannes Enslin, R. McDermott, A. Alasmari, Yonghao Zhang, Frank Mehnke, Michael Kneissl, Jochen Bruckbauer, Jie Bai, Paul R. Edwards, Philip A. Shields, Gergely Ferenczi, S. Vespucci, P. M. Coulon, Carol Trager-Cowan
المصدر: Semiconductor Science and Technology. 35:054001
مصطلحات موضوعية: 010302 applied physics, Materials science, Scanning electron microscope, business.industry, Cathodoluminescence, 02 engineering and technology, 021001 nanoscience & nanotechnology, Condensed Matter Physics, Channelling, 01 natural sciences, Electronic, Optical and Magnetic Materials, Crystal, Semiconductor, 0103 physical sciences, Materials Chemistry, Optoelectronics, ddc:530, Light emission, Electrical and Electronic Engineering, 0210 nano-technology, Luminescence, business, QC, Electron backscatter diffraction
وصف الملف: application/pdf
-
6
المؤلفون: M. Nouf-Allehiani, S. Vespucci, R. M. Smith, A. Alasmari, Y. Gong, Yonghao Zhang, W. Avis, Carol Trager-Cowan, Frank Mehnke, Tim Wernicke, Tao Wang, David M. Thomson, Aimo Winkelmann, L. Jiu, Philip A. Shields, M. D. Smith, Benjamin Hourahine, Gunnar Kusch, V. Kueller, Christian Kuhn, Robert W. Martin, Lucia Spasevski, Johannes Enslin, S. Hagedorn, G. Naresh-Kumar, Paul R. Edwards, Sebastian Walde, S. Kraeusel, Michael Kneissl, Marcus Weyers, Roy L. Johnston, Peter J. Parbrook, Jochen Bruckbauer, Pierre-Marie Coulon, Elena Pascal, Arne Knauer
المصدر: Photonics Research
مصطلحات موضوعية: Materials science, Scanning electron microscope, Physics::Optics, Cathodoluminescence, 02 engineering and technology, 01 natural sciences, law.invention, 010309 optics, Condensed Matter::Materials Science, law, 0103 physical sciences, Electron microscopy, QC, X-ray spectroscopy, business.industry, Doping, Semiconductor, 021001 nanoscience & nanotechnology, UV-emitting nitride, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Optoelectronics, Light emission, Electron microscope, 0210 nano-technology, business, Electron backscatter diffraction
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2de63e87decea2c17bba84400892fe5d
https://doi.org/10.1364/prj.7.000b73 -
7
المؤلفون: Carol Trager-Cowan, Marc De Graef, Elena Pascal, Ben Hourahine
المصدر: Microscopy and Microanalysis
مصطلحات موضوعية: 010302 applied physics, Diffraction, Toy model, Materials science, Condensed matter physics, Bragg's law, 02 engineering and technology, 021001 nanoscience & nanotechnology, Curvature, Channelling, 01 natural sciences, Condensed Matter::Materials Science, 0103 physical sciences, Displacement field, Dislocation, 0210 nano-technology, Instrumentation, QC, Bloch wave
وصف الملف: application/pdf
-
8
المؤلفون: Elena, Pascal, Saransh, Singh, Patrick G, Callahan, Ben, Hourahine, Carol, Trager-Cowan, Marc De, Graef
المصدر: Ultramicroscopy. 187
-
9
المؤلفون: Elena Pascal, Marc De Graef, Saransh Singh, Ben Hourahine, Carol Trager-Cowan
المصدر: Microscopy and Microanalysis. 23:540-541
مصطلحات موضوعية: 010302 applied physics, Diffraction, Materials science, business.industry, 02 engineering and technology, Electron, 021001 nanoscience & nanotechnology, 01 natural sciences, Characterization (materials science), Optics, Transmission (telecommunications), Transmission electron microscopy, 0103 physical sciences, 0210 nano-technology, business, Instrumentation, Image resolution, QC, FOIL method, Electron backscatter diffraction
وصف الملف: application/pdf
-
10
المؤلفون: Elena Pascal, Patrick G. Callahan, Carol Trager-Cowan, Ben Hourahine, Saransh Singh, Marc De Graef
المصدر: Ultramicroscopy. 188:101
مصطلحات موضوعية: 010302 applied physics, Materials science, Scanning electron microscope, Scattering, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Molecular physics, Atomic and Molecular Physics, and Optics, Electronic, Optical and Magnetic Materials, Electron diffraction, 0103 physical sciences, 0210 nano-technology, Instrumentation, Energy (signal processing)