يعرض 1 - 10 نتائج من 216 نتيجة بحث عن '"Elger, G."', وقت الاستعلام: 1.04s تنقيح النتائج
  1. 1
    دورية أكاديمية
  2. 2
    دورية أكاديمية

    المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 23(18):21493-21505 Sep, 2023

  3. 3
    دورية أكاديمية

    المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 23(3):419-429 Sep, 2023

  4. 4
    دورية أكاديمية

    المؤلفون: Kettelgerdes, M., Elger, G.

    المصدر: IEEE Journal of Radio Frequency Identification IEEE J. Radio Freq. Identif. Radio Frequency Identification, IEEE Journal of. 7:192-202 2023

  5. 5
    مؤتمر

    المصدر: 2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2022 23rd International Conference on. :1-7 Apr, 2022

    Relation: 2022 23rd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)

  6. 6
    دورية أكاديمية

    المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 22(2):175-186 Jun, 2022

  7. 7
    مؤتمر

    المصدر: 2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE), 2021 22nd International Conference on. :1-9 Apr, 2021

    Relation: 2021 22nd International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)

  8. 8
    دورية أكاديمية

    المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 70:1-9 2021

  9. 9
  10. 10
    مؤتمر

    المؤلفون: Hanss, A., Schmid, M., Elger, G.

    المصدر: 2016 6th Electronic System-Integration Technology Conference (ESTC) Electronic System-Integration Technology Conference (ESTC), 2016 6th. :1-6 Sep, 2016

    Relation: 2016 6th Electronic System-Integration Technology Conference (ESTC)