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المؤلفون: Alaeddin Aydiner, Jin Yan, Ellen Yan Fu, Yunhui Chu, Friar Robert J, Oleg Mikulchenko
المصدر: 2017 IEEE 26th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS).
مصطلحات موضوعية: Computer science, Histogram, Hardware_INTEGRATEDCIRCUITS, Bit error rate, Skew, Extrapolation, Topology (electrical circuits), Signal integrity, Algorithm, Jitter, Communication channel
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::0b22fae6fe32eeb50f88308f95b014df
https://doi.org/10.1109/epeps.2017.8329722