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المؤلفون: Ruchil Jain, Felix Holzmueller, Peter Baars, Alban Zaka, Elodie Ebrard, Ketankumar Tailor, Tom Herrmann, Damien Angot
المصدر: 2022 IEEE 34th International Symposium on Power Semiconductor Devices and ICs (ISPSD).
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7ae6e905ed20f151dfc98f0724948e5b
https://doi.org/10.1109/ispsd49238.2022.9813636 -
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المؤلفون: Philippe Candelier, P. Waltz, Elodie Ebrard, Bruno Allard
المصدر: Microelectronics Journal. 40:1755-1765
مصطلحات موضوعية: Polyfuse, Engineering, business.industry, General Engineering, Integrated circuit, law.invention, Reliability engineering, Non-volatile memory, CMOS, law, Physical phenomena, Electronic engineering, Antifuse, business, Cmos process
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المؤلفون: Elodie Ebrard, P. Waltz, Bruno Allard, Philippe Candelier
المصدر: 2009 Proceedings of the European Solid State Device Research Conference.
مصطلحات موضوعية: Engineering, business.industry, Transistor, Integrated circuit design, law.invention, Capacitor, Reliability (semiconductor), CMOS, law, Electronic engineering, Fuse (electrical), Antifuse, Cascode, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6626e70de84042a499e364174d3f9724
https://doi.org/10.1109/essderc.2009.5331487