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1مؤتمر
المؤلفون: Gao, R., Mehedi, M., Chen, H., Wang, X., Zhang, J. F., Lin, X. L., He, Z. Y., Chen, Y. Q., Lei, D. Y., Huang, Y., En, Y. F., Ji, Z., Wang, R.
المصدر: 2020 IEEE International Reliability Physics Symposium (IRPS) Reliability Physics Symposium (IRPS), 2020 IEEE International. :1-5 Apr, 2020
Relation: 2020 IEEE International Reliability Physics Symposium (IRPS)
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2مؤتمر
المؤلفون: Wang, J. L., Chen, Y. Q., He, Z. Y., En, Y. F., Xu, X. B., Huang, Y., Geng, K. W.
المصدر: 2019 IEEE 26th International Symposium on Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2019 IEEE 26th International Symposium on. :1-4 Jul, 2019
Relation: 2019 IEEE 26th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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3مؤتمر
المؤلفون: Yin, T., Li, S. J., Chen, Y. Q., Liao, X. Y., Li, R. G., En, Y. F., Huang, Y.
المصدر: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2017 IEEE 24th International Symposium on the. :1-4 Jul, 2017
Relation: 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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4مؤتمر
المؤلفون: Chen, Y. Q., Wang, B., Zhang, Y. F., En, Y. F., Huang, Y., Lu, Y. D., Liu, L. X., Wang, X. H.
المصدر: Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2013 20th IEEE International Symposium on the. :353-356 Jul, 2013
Relation: 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)
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5مؤتمر
المؤلفون: Lu, G.-G., Lei, Z.-F., Huang, Y., En, Y.-F.
المصدر: 2012 13th International Conference on Electronic Packaging Technology & High Density Packaging Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on. :1106-1109 Aug, 2012
Relation: 2012 13th International Conference on Electronic Packaging Technology & High Density Packaging (ICEPT-HDP)
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6مؤتمر
المصدر: 2012 13th International Conference on Electronic Packaging Technology & High Density Packaging Electronic Packaging Technology and High Density Packaging (ICEPT-HDP), 2012 13th International Conference on. :1317-1319 Aug, 2012
Relation: 2012 13th International Conference on Electronic Packaging Technology & High Density Packaging (ICEPT-HDP)
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7دورية أكاديمية
المؤلفون: Liu, Y., Wu, W.-J., En, Y.-F., Wang, L., Lei, Z.-F., Wang, X.-H.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 35(3):369-371 Mar, 2014
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8دورية أكاديمية
المؤلفون: Chen, Y. Q., En, Y. F., Huang, Y., Kong, X. D., Fang, W. X., Zheng, X. J.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 33(1):110-112 Jan, 2012
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9دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
10دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.