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1دورية أكاديمية
المؤلفون: De Silva, D., Hewawasam, L.
المصدر: IEEE Access Access, IEEE. 12:51086-51099 2024
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2مؤتمر
المؤلفون: Augusto, Cristian
المصدر: 2023 IEEE 34th International Symposium on Software Reliability Engineering Workshops (ISSREW) ISSREW Software Reliability Engineering Workshops (ISSREW), 2023 IEEE 34th International Symposium on. :26-29 Oct, 2023
Relation: 2023 IEEE 34th International Symposium on Software Reliability Engineering Workshops (ISSREW)
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3مؤتمر
المؤلفون: de la Torre, Jose Antonio, Rincon, Fernando, Zennaro, Marco, Caba, Julian, Barba, Jesus, Lopez, Juan Carlos
المصدر: 2023 26th Euromicro Conference on Digital System Design (DSD) DSD Digital System Design (DSD), 2023 26th Euromicro Conference on. :610-617 Sep, 2023
Relation: 2023 26th Euromicro Conference on Digital System Design (DSD)
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4مؤتمر
المصدر: 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE) ICSE Software Engineering (ICSE), 2023 IEEE/ACM 45th International Conference on. :1971-1982 May, 2023
Relation: 2023 IEEE/ACM 45th International Conference on Software Engineering (ICSE)
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5مؤتمر
المؤلفون: Leotta, Maurizio, Garcia, Boni, Ricca, Filippo, Whitehead, Jim
المصدر: 2023 IEEE Conference on Software Testing, Verification and Validation (ICST) ICST Software Testing, Verification and Validation (ICST), 2023 IEEE Conference on. :339-350 Apr, 2023
Relation: 2023 IEEE Conference on Software Testing, Verification and Validation (ICST)
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6مؤتمر
المصدر: 2022 IEEE/ACM International Conference on Automation of Software Test (AST) AST Automation of Software Test (AST), 2022 IEEE/ACM International Conference on. :1-5 May, 2022
Relation: 2022 IEEE/ACM International Conference on Automation of Software Test (AST)
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7مؤتمر
المؤلفون: Leotta, Maurizio, Molinari, Antonio, Ricca, Filippo
المصدر: 2022 IEEE Conference on Software Testing, Verification and Validation (ICST) ICST Software Testing, Verification and Validation (ICST), 2022 IEEE Conference on. :389-399 Apr, 2022
Relation: 2022 IEEE Conference on Software Testing, Verification and Validation (ICST)
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8مؤتمر
المؤلفون: Yandrapally, Rahulkrishna, Mesbah, Ali
المصدر: 2021 IEEE International Conference on Software Maintenance and Evolution (ICSME) ICSME Software Maintenance and Evolution (ICSME), 2021 IEEE International Conference on. :183-194 Sep, 2021
Relation: 2021 IEEE International Conference on Software Maintenance and Evolution (ICSME)
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9مؤتمر
المصدر: 2021 14th IEEE Conference on Software Testing, Verification and Validation (ICST) ICST Software Testing, Verification and Validation (ICST), 2021 14th IEEE Conference on. :460-465 Apr, 2021
Relation: 2021 14th IEEE Conference on Software Testing, Verification and Validation (ICST)
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10دورية أكاديمية
المؤلفون: Dilshan De Silva, Lakindu Hewawasam
المصدر: IEEE Access, Vol 12, Pp 51086-51099 (2024)
مصطلحات موضوعية: End-to-end testing, influential factors, integration testing, serverless applications, serverless testing, shift-left approach, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
وصف الملف: electronic resource