المؤلفون: Enderling, S., Brown, C.L., III, Balakrishnan, M., Hedley, J., Stevenson, J.T.M., Bond, S., Dunare, C.C., Harris, A.J., Burdess, J.S., Mitkova, M., Kozicki, M.N., Walton, A.J.

المصدر: 18th IEEE International Conference on Micro Electro Mechanical Systems, 2005. MEMS 2005. Micro electro mechanical systems Micro Electro Mechanical Systems, 2005. MEMS 2005. 18th IEEE International Conference on. :159-162 2005

Relation: 18th IEEE International Conference on Micro Electro Mechanical Systems

المؤلفون: Enderling, S., Brown, C.L., III, Smith, S., Dicks, M.H., Stevenson, J.T.M., Ross, A.W.S., Mitkova, M., Kozicki, M.N., Walton, A.J.

المصدر: Proceedings of the 2005 International Conference on Microelectronic Test Structures, 2005. ICMTS 2005. Microelectronic Test Structures Microelectronic Test Structures, 2005. ICMTS 2005. Proceedings of the 2005 International Conference on. :1-4 2005

Relation: ICMTS 2005. Proceedings of the 2005 International Conference on Microelectronic Test Structures

المؤلفون: Enderling, S., Dicks, M.H., Smith, S., Stevenson, J.T.M., Walton, A.J.

المصدر: International Conference on Microelectronic Test Structures, 2003. Microelectronic test structures Microelectronic Test Structures, 2003. International Conference on. :8-13 2003

Relation: ICMTS 2002. Proceedings of the 2003 International Conference on Microelectronic Test Structures

المؤلفون: Enderling, S., Brown, C.L., III, Smith, S., Dicks, M.H., Stevenson, J.T.M., Mitkova, M., Kozicki, M.N., Walton, A.J.

المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 19(1):2-9 Feb, 2006

المؤلفون: Enderling, S., Dicks, M.H., Smith, S., Stevenson, J.T.M., Walton, A.J.

المصدر: IEEE Transactions on Semiconductor Manufacturing IEEE Trans. Semicond. Manufact. Semiconductor Manufacturing, IEEE Transactions on. 17(2):84-90 May, 2004

المؤلفون: Smith, S., Tsiamis, A., McCallum, M., Hourd, A.C., Stevenson, J.T.M., Walton, A.J., Enderling, S.

المصدر: 2008 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures, 2008. ICMTS 2008. IEEE International Conference on. :228-232 Mar, 2008

Relation: 2008 IEEE International Conference on Microelectronic Test Structure (ICMTS)

المؤلفون: Enderling, S., Smith, S., Stevenson, J.T.M., Walton, A.J.

المصدر: 2007 IEEE International Conference on Microelectronic Test Structures Microelectronic Test Structures, 2007. ICMTS '07. IEEE International Conference on. :218-221 Mar, 2007

Relation: 2007 IEEE International Conference on Microelectronic Test Structures

المؤلفون: Enderling, S., Lin, H., Stevenson, J. T. M., Bunting, A. S., Walton, A. J.

المصدر: Proceedings of SPIE; Nov2006 Part 2, Issue 1, p64150G-64150G-8, 8p

المؤلفون: Enderling, S., Jiang, L., Ross, A. W. S., Bond, S., John Hedley, Harris, A. J., Burdens, J. S., Cheung, R., Zorman, C. A., Mehregany, M., Walton, A. J.

المصدر: Scopus-Elsevier
ResearcherID

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::088d8efc2b548da56740048984c0921d
http://www.scopus.com/inward/record.url?eid=2-s2.0-6344237146&partnerID=MN8TOARS

المؤلفون: Enderling, S., Brown Iii, C. L., Balakrishnan, M., Hedley, J., Stevenson, J. T. M., Bond, S., Dunare, C. C., Harris, A. J., Burdess, J. S., Maria Mitkova, Kozicki, M. N., Walton, A. J.

المصدر: Scopus-Elsevier

URL الوصول: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::6fb0cc031ea3800816c5b5b7e07a664c
http://www.scopus.com/inward/record.url?eid=2-s2.0-26944477011&partnerID=MN8TOARS