المؤلفون: Chendong Zhu, Grens, C., Enhai Zhao, Ahmed, A., Cressler, J.D., Joseph, A.J.

المصدر: Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Biopolar/BiCMOS Circuits and Technology Bipolar/BiCMOS Circuits and Technology Meeting, 2005. Proceedings of the. :41-44 2005

Relation: Proceedings of the 2005 Biopolar/BiCMOS Circuits and Technology Meeting

المؤلفون: Banerjee, B., Venkataraman, S., Enhai Zhao, Chang-Ho Lee, Cressler, J.D., Laskar, J., El-Kareh, B., Balster, S., Yasuda, H.

المصدر: 2005 IEEE Radio Frequency integrated Circuits (RFIC) Symposium - Digest of Papers Radio frequency integrated circuits Radio Frequency integrated Circuits (RFIC) Symposium, 2005. Digest of Papers. 2005 IEEE. :553-556 2005

Relation: 2005 IEEE Radio Frequency Integrated Circuits (RFIC) Symposium

المؤلفون: Tianbing Chen, Kuo, W.-M.L., Enhai Zhao, Qingqing Liang, Zhenrong Jin, Cressler, J.D., Joseph, A.J.

المصدر: Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting Bipolar/BiCMOS circuits and technology Bipolar/BiCMOS Circuits and Technology, 2004. Proceedings of the 2004 Meeting. :217-220 2004

Relation: Proceedings of the 2004 Bipolar/BiCMOS Circuits and Technology Meeting

المؤلفون: Enhai Zhao, Krithivasan, R., Sutton, A.K., Zhenrong Jin, Cressler, J.D., El-Kareh, B., Balster, S., Yasuda, H.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 53(2):329-338 Feb, 2006

المؤلفون: Enhai Zhao, Sutton, A.K., Haugerud, B.M., Cressler, J.D., Marshall, P.W., Reed, R.A., El-Kareh, B., Balster, S., Yasuda, H.

المصدر: IEEE Transactions on Nuclear Science IEEE Trans. Nucl. Sci. Nuclear Science, IEEE Transactions on. 51(6):3243-3249 Dec, 2004

المؤلفون: Tianbing Chen, Wei-Min Lance Kuo, Enhai Zhao, Qingqing Liang, Zhenrong Jin, Cressler, J.D., Joseph, A.J.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 51(11):1825-1832 Nov, 2004

المؤلفون: Enhai Zhao, Celik-Butler, Z., Thiel, F., Dutta, R.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 49(12):2230-2236 Dec, 2002

المؤلفون: Xiaobin Yuan, Jae-Eun Park, Jing Wang, Enhai Zhao, Ahlgren, David, Hook, Terence, Jun Yuan, Chan, Victor, Huiling Shang, Chu-Hsin Liang, Lindsay, Richard, Sungjoon Park, Hyotae Choo

المصدر: 2007 IEEE International Integrated Reliability Workshop Final Report Integrated Reliability Workshop Final Report, 2007. IRW 2007. IEEE International. :70-73 Oct, 2007

Relation: 2007 IEEE International Integrated Reliability Workshop Final Report

المؤلفون: David C. Ahlgren, Chu-Hsin Liang, Hyotae Choo, Victor Chan, Jun Yuan, Jae-Eun Park, Enhai Zhao, Xiaobin Yuan, R. Lindsay, Huiling Shang, Jing Wang, Terence B. Hook, Sung-Joon Park

المصدر: IEEE Transactions on Device and Materials Reliability. 8:501-508

مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Electron, Electronic, Optical and Magnetic Materials, CMOS, Electric field, MOSFET, Node (physics), Optoelectronics, Electrical and Electronic Engineering, Current (fluid), Safety, Risk, Reliability and Quality, business, Quantum tunnelling, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f341c6381cfab32417c8d74655f50c01
https://doi.org/10.1109/tdmr.2008.2002350

المؤلفون: A.P.G. Prakash, Daniel M. Fleetwood, A. Phan, Jonathan A. Pellish, Robert A. Reed, Marco Bellini, Akil K. Sutton, Cheryl J. Marshall, Ronald D. Schrimpf, Bongim Jun, John D. Cressler, Paul W. Marshall, M.A. Carts, Raymond L. Ladbury, Enhai Zhao, R.M. Diestelhorst

المصدر: IEEE Transactions on Nuclear Science. 53:3166-3174

مصطلحات موضوعية: Nuclear and High Energy Physics, Materials science, Proton, business.industry, Infrasound, Heterojunction bipolar transistor, Oxide, Noise (electronics), chemistry.chemical_compound, Nuclear Energy and Engineering, chemistry, Absorbed dose, Shallow trench isolation, Dosimetry, Optoelectronics, Electrical and Electronic Engineering, business

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a7cebffe3b444341d96afd180ca83a90
https://doi.org/10.1109/tns.2006.885382