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1دورية أكاديمية
المؤلفون: Jaqueline Stauffenberg, Ingo Ortlepp, Johannes Belkner, Denis Dontsov, Enrico Langlotz, Steffen Hesse, Ivo Rangelow, Eberhard Manske
المصدر: Applied Sciences, Vol 12, Iss 15, p 7843 (2022)
مصطلحات موضوعية: nanopositioning machine, planar direct drive, sub-nanometre precision, macroscopic working range, high speed, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999
وصف الملف: electronic resource
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2
المؤلفون: Michael Kühnel, Ilko Rahneberg, Denis Dontsov, Christoph Braig, Alexei Erko, Jürgen Probst, Thomas Krist, Enrico Langlotz
المصدر: Eighth European Seminar on Precision Optics Manufacturing.
مصطلحات موضوعية: Materials science, Optics, business.industry, Free form, Profilometer, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ec1761e37dee1d8c9563de394dd1330e
https://doi.org/10.1117/12.2593700 -
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المؤلفون: Ilko Rahneberg, Thomas Zeschke, Enrico Langlotz, Frank Siewert, Christoph Braig, Alexei Erko, Michael Kühnel, Jürgen Probst, Thomas Krist
مصطلحات موضوعية: Wavefront, Physics, Diffraction, X-ray spectroscopy, business.industry, X-ray optics, Spectral density, 01 natural sciences, Atomic and Molecular Physics, and Optics, 010309 optics, Optics, 0103 physical sciences, no topic specified, Electrical and Electronic Engineering, Atomic physics, business, Spectroscopy, Engineering (miscellaneous), Realization (systems), Energy (signal processing)
وصف الملف: application/pdf
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c3bf913647e34cdc0ce52e22182dfa04
http://www.helmholtz-berlin.de/pubbin/oai_publication?VT=1&ID=103230 -
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المؤلفون: Enrico Langlotz, Jürgen Probst, Christian Seifert, Thomas Krist, Alexei Erko, Ilko Rahneberg, Christoph Braig, Michael Kühnel
المصدر: Advances in Metrology for X-Ray and EUV Optics VIII.
مصطلحات موضوعية: Diffraction, Wavelength, Fabrication, Materials science, Optics, Spectrometer, business.industry, Nanophotonics, Grating, business, Diffraction grating, Metrology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::d3b9c1699102be9ca65c97dbc3fe2d35
https://doi.org/10.1117/12.2550336 -
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المؤلفون: Rudolf Meeß, Enrico Langlotz, Dennis Dontsov
المصدر: Measurement Science and Technology. 32:074004
مصطلحات موضوعية: Interferometry, Materials science, Optics, business.industry, Applied Mathematics, SPHERES, Variation (astronomy), business, Instrumentation, Engineering (miscellaneous)
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المؤلفون: Denis Dontsov, Enrico Langlotz, Walter Schott
المصدر: SPIE Proceedings.
مصطلحات موضوعية: Physics, business.industry, Laser, Ray, law.invention, Lens (optics), Interferometry, symbols.namesake, Optics, law, Measuring principle, Astronomical interferometer, symbols, Heterodyne detection, business, Doppler effect
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a704d9c82744e600412e73699be60989
https://doi.org/10.1117/12.2235860 -
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المؤلفون: Denis Dontsov, Enrico Langlotz, Walter Schott
المصدر: Fringe 2013 ISBN: 9783642363580
مصطلحات موضوعية: Computer science, Process measurement, Flatness (systems theory), Technical university, Mechanical engineering, Surface finish, Metrology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e9f7d18ea014d062d3b4280ecf1d1cf6
https://doi.org/10.1007/978-3-642-36359-7_102 -
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المؤلفون: Reinhard Maier, Wolfgang Engl, Jörg Diebel, Enrico Langlotz, Denis Dontsov, Thomas Sulzbach, Walter Schott
المصدر: Procedia Engineering. :621-624
مصطلحات موضوعية: Cantilever, Materials science, Silicon, business.industry, Physics::Instrumentation and Detectors, Surface scanning, Bimorph, chemistry.chemical_element, Nanotechnology, General Medicine, Piezoresistive effect, Computer Science::Other, chemistry, Deflection (engineering), Thermal, Optoelectronics, business, Actuator, Engineering(all)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::895e8a8ab25d8224fdebcdc8e7900019