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المؤلفون: Oleg Fedoroyov, Anatoly Komissar, Dalia Yablon, Hisham Taha, A. Ignatov, Aaron Lewis, Eran Maayan
المصدر: Microscopy Today. 21:26-31
مصطلحات موضوعية: Materials science, General Computer Science, Ion beam, Scanning electron microscope, Atomic force microscopy, Basic research, Nanotechnology, Nanoscopic scale