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المؤلفون: Denis Rideau, Raphael Clerc, Alban Zaka, Herve Jaouen, Quentin Rafhay, J. P. Manceau, Davide Garetto, J. Singer, Erwan Dornel, Clement Tavernier, Nicolas Degors, C. Boccaccio
المساهمون: STMicroelectronics [Crolles] (ST-CROLLES), Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS)
المصدر: Solid-State Electronics
Solid-State Electronics, Elsevier, 2011, 63 (1), pp.158-162. ⟨10.1016/j.sse.2011.05.017⟩مصطلحات موضوعية: 010302 applied physics, Engineering, business.industry, Emphasis (telecommunications), 02 engineering and technology, Condensed Matter Physics, 01 natural sciences, 020202 computer hardware & architecture, Electronic, Optical and Magnetic Materials, Characterization (materials science), Non-volatile memory, Flash (photography), Memory cell, Shallow trench isolation, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Materials Chemistry, Electronic engineering, Calibration, Transient (oscillation), Electrical and Electronic Engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, business
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المؤلفون: Alban Zaka, Erwan Dornel, Yusuf Leblebici, Denis Rideau, Herve Jaouen, Raphael Clerc, J. P. Manceau, Pierpaolo Palestri, Davide Garetto, Clement Tavernier, Quentin Rafhay
المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS), STMicroelectronics [Crolles] (ST-CROLLES), Università degli Studi di Udine - University of Udine [Italie], Ecole Polytechnique Fédérale de Lausanne (EPFL), CIFRE ST
المصدر: 2011 IEEE ICMTS International Conference on Microelectronic Test Structures
2011 IEEE ICMTS International Conference on Microelectronic Test Structures, Apr 2011, Amsterdam, Netherlands. ⟨10.1109/ICMTS.2011.5976874⟩مصطلحات موضوعية: 010302 applied physics, Engineering, business.industry, 02 engineering and technology, Hardware_PERFORMANCEANDRELIABILITY, 021001 nanoscience & nanotechnology, 01 natural sciences, Flash memory, Flash (photography), 0103 physical sciences, Charge trap flash, Electronic engineering, Transient (oscillation), Current (fluid), [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, business, AND gate, Communication channel, Hot-carrier injection
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c26f9c23f7b5a9140a1f6c884a95158d
https://hal.archives-ouvertes.fr/hal-01959411 -
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المؤلفون: Julien Singer, Alban Zaka, Davide Garetto, Raphael Clerc, Matteo Iellina, Herve Jaouen, Denis Rideau, G. Pananakakis, Quentin Rafhay, Erwan Dornel, Clement Tavernier, Pierpaolo Palestri
المساهمون: Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS), Domenget, Chahla
المصدر: Solid-State Electronics
Solid-State Electronics, Elsevier, 2010, 54 (12), pp.1669-1674مصطلحات موضوعية: Engineering, Computer simulation, business.industry, [SPI.NANO] Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, Monte Carlo method, Context (language use), Integrated circuit, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Computational physics, law.invention, Nanoelectronics, law, [PHYS.COND.CM-GEN] Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other], [PHYS.COND.CM-GEN]Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other], Materials Chemistry, Electronic engineering, Electrical and Electronic Engineering, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, business, Frequency modulation, AND gate, ComputingMilieux_MISCELLANEOUS, Hot-carrier injection
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المؤلفون: Quentin Rafhay, Denis Rideau, Matteo Iellina, Clement Tavernier, Pierpaolo Palestri, Erwan Dornel, Alban Zaka, Herve Jaouen
المساهمون: Institut Laue-Langevin (ILL), ILL, Institut de Microélectronique, Electromagnétisme et Photonique - Laboratoire d'Hyperfréquences et Caractérisation (IMEP-LAHC), Université Joseph Fourier - Grenoble 1 (UJF)-Institut polytechnique de Grenoble - Grenoble Institute of Technology (Grenoble INP )-Université Savoie Mont Blanc (USMB [Université de Savoie] [Université de Chambéry])-Institut National Polytechnique de Grenoble (INPG)-Centre National de la Recherche Scientifique (CNRS), Thales Communications [Colombes], THALES, Domenget, Chahla
المصدر: 14th International Workshop on Computational Electronics
14th International Workshop on Computational Electronics, Oct 2010, Pisa, Italyمصطلحات موضوعية: 010302 applied physics, Physics, business.industry, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Non-volatile memory, [PHYS.COND.CM-GEN] Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other], Logic gate, [PHYS.COND.CM-GEN]Physics [physics]/Condensed Matter [cond-mat]/Other [cond-mat.other], 0103 physical sciences, Figure of merit, Optoelectronics, 0210 nano-technology, business, Scaling, Gate current, ComputingMilieux_MISCELLANEOUS
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b94a9e3455e0f769a6695fef9e2e49f4
https://hal.archives-ouvertes.fr/hal-00604566 -
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المؤلفون: Erwan Dornel, F. Clark William, Yusuf Leblebici, Vincent Huard, Yoann Mamy Randriamihaja, Herve Jaouen, Davide Garetto, Alexandre Schmid, Denis Rideau
المصدر: 2010 14th International Workshop on Computational Electronics.
مصطلحات موضوعية: Physics, business.industry, Electron, Stress (mechanics), Semiconductor, Semiconductors, CMOS, Logic gate, MOSFET, Optoelectronics, Electrical measurements, business, Quantum tunnelling, Induced Leakage Current
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6ff4a436a31dce30fe32217417723958
https://doi.org/10.1109/iwce.2010.5677950 -
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المؤلفون: Denis Rideau, V. Quenette, Erwan Dornel, O. Saxod, M. Weybright, J. P. Manceau, Davide Garetto, Clement Tavernier, Herve Jaouen
المصدر: 2010 International Conference on Microelectronic Test Structures (ICMTS).
مصطلحات موضوعية: Materials science, business.industry, Logic gate, Electric field, MOSFET, Hardware_INTEGRATEDCIRCUITS, Optoelectronics, High voltage, Hardware_PERFORMANCEANDRELIABILITY, Electric potential, business, Quantum tunnelling, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9d9a90222de0b3d41fd24a646992e9f4
https://doi.org/10.1109/icmts.2010.5466816 -
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المؤلفون: Jean Charles Barbe, Erwan Dornel, Joël Eymery, F. de Crecy
المصدر: 2007 International Conference on Thermal, Mechanical and Multi-Physics Simulation Experiments in Microelectronics and Micro-Systems. EuroSime 2007.
مصطلحات موضوعية: Surface diffusion, Wavelength, Amplitude, Materials science, Computational chemistry, Time evolution, Perturbation (astronomy), Mechanics, Lateral expansion, Curvature, Finite element method
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b9e8958ec487407ed7b3d380f118d56c
https://doi.org/10.1109/esime.2007.359946 -
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المؤلفون: Thomas Ernst, Simon Deleonibus, Sébastien Barnola, Erwan Dornel, Cecilia Dupre, Jean-Charles Barbe, S. Becu, Francois Andrieu, C. Vizioz, O. Faynot, Vincent Delaye, J-M. Hartmann, Gerard Ghibaudo, Thierry Poiroux
المصدر: Extended Abstracts of the 2007 International Conference on Solid State Devices and Materials.
مصطلحات موضوعية: Materials science, CMOS, Copper interconnect, Nanowire, Process (computing), Nanotechnology
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ac6c60e4a8c4f4579c2ee49a42673414
https://doi.org/10.7567/ssdm.2007.i-1-1 -
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المؤلفون: Erwan Dornel, G. Lacolle, F. de Crecy, Joël Eymery, Jean-Charles Barbe
المصدر: Physical Review B. 73
مصطلحات موضوعية: Surface diffusion, Materials science, Condensed matter physics, business.industry, Annealing (metallurgy), Isotropy, Condensed Matter Physics, Curvature, Surface energy, Electronic, Optical and Magnetic Materials, Optics, Agglomerate, Dewetting, Anisotropy, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::49d5455ccb5dc5eb582bca4457d14210
https://doi.org/10.1103/physrevb.73.115427 -
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المؤلفون: Erwan Dornel, J-C. Barbé, Joël Eymery, F. de Crécy
المصدر: MRS Proceedings. 910
مصطلحات موضوعية: Faceting, Materials science, Condensed matter physics, Scanning electron microscope, Annealing (metallurgy), Silicon on insulator, Dewetting, Anisotropy, Instability, Surface energy
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