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1مؤتمر
المؤلفون: Castagnet, Nicolas, Boyer, Alexandre, Escudie, Fabien
المصدر: 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa) Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa), 2024 IEEE Joint International Symposium on. :413-416 May, 2024
Relation: 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa)
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2مؤتمر
المؤلفون: Ruffat, Francois, Caignet, Fabrice, Boyer, Alexandre, Escudie, Fabien, Mejecaze, Guillaume, Puybaret, Frederic
المصدر: 2022 International Symposium on Electromagnetic Compatibility – EMC Europe Electromagnetic Compatibility – EMC Europe, 2022 International Symposium on. :262-267 Sep, 2022
Relation: 2022 International Symposium on Electromagnetic Compatibility – EMC Europe
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3مؤتمر
المؤلفون: Escudie, Fabien, Caignet, Fabrice, Nolhier, Nicolas
المصدر: 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE Electromagnetic Compatibility - EMC EUROPE, 2017 International Symposium on. :1-6 Sep, 2017
Relation: 2017 International Symposium on Electromagnetic Compatibility - EMC EUROPE
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4مؤتمر
المؤلفون: Escudie, Fabien, Caignet, Fabrice, Nolhier, Nicolas, Bafleur, Marise
المصدر: 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD) Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2016 38th. :1-10 Sep, 2016
Relation: 2016 38th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD)
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5دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
6دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
7دورية أكاديمية
المؤلفون: Escudie, Fabien, Caignet, Fabrice, Nolhier, Nicolas, Boyer, Alexandre
المصدر: IEEE Transactions on Electromagnetic Compatibility; Feb2022, Vol. 64 Issue 1, p47-57, 11p
مصطلحات موضوعية: ELECTROSTATIC discharges, DYNAMIC models, ELECTRIC lines, DELAY lines, RELIABILITY in engineering, CINNAMON