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1مؤتمر
المؤلفون: Gherman, Valentin, Evain, Samuel, Giraud, Bastien
المصدر: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE). :298-301 Mar, 2020
Relation: 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE)
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2مؤتمر
المؤلفون: Incarbone, Luca, Evain, Samuel, Ben Hassen, Wafa, Auzanneau, Fabrice, Dupret, Antoine, Bonhomme, Yannick, Morel, Freddy, Gabet, Romain, Solange, Ludovic, Zanchetta, Armando
المصدر: 2015 IEEE 10th Conference on Industrial Electronics and Applications (ICIEA) Industrial Electronics and Applications (ICIEA), 2015 IEEE 10th Conference on. :1761-1765 Jun, 2015
Relation: 2015 IEEE 10th Conference on Industrial Electronics and Applications (ICIEA)
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3دورية أكاديمية
المصدر: In Microelectronics Reliability September 2022 136
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4مؤتمر
المؤلفون: Sarrazin, Sebastien, Evain, Samuel, Miro-Panades, Ivan, de Barros Naviner, Lirida Alves, Gherman, Valentin
المصدر: 2014 IEEE 20th International On-Line Testing Symposium (IOLTS) On-Line Testing Symposium (IOLTS), 2014 IEEE 20th International. :160-163 Jul, 2014
Relation: 2014 IEEE 20th International On-Line Testing Symposium (IOLTS)
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5مؤتمر
المؤلفون: Sarrazin, Sebastien, Evain, Samuel, Miro-Panades, Ivan, Valentian, Alexandre, Pajaniradja, Suresh, de Barros Naviner, Lirida Alves, Gherman, Valentin
المصدر: 2014 19th IEEE European Test Symposium (ETS) Test Symposium (ETS), 2014 19th IEEE European. :1-6 May, 2014
Relation: 2014 19th IEEE European Test Symposium (ETS)
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6مؤتمر
المؤلفون: Evain, Samuel, Gherman, Valentin
المصدر: 2013 18th IEEE European Test Symposium (ETS) Test Symposium (ETS), 2013 18th IEEE European. :1-6 May, 2013
Relation: 2013 18th IEEE European Test Symposium (ETS)
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7مؤتمرScan design with shadow flip-flops for low performance overhead and concurrent delay fault detection
المؤلفون: Sarrazin, Sebastien, Evain, Samuel, de Barros Naviner, Lirida Alves, Bonhomme, Yannick, Gherman, Valentin
المصدر: 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE) Design, Automation & Test in Europe Conference & Exhibition (DATE), 2013. :1077-1082 Mar, 2013
Relation: 2013 Design, Automation & Test in Europe Conference & Exhibition (DATE 2013)
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8مؤتمر
المؤلفون: Gherman, Valentin, Evain, Samuel, Bonhomme, Yannick
المصدر: 2012 17th IEEE European Test Symposium (ETS) Test Symposium (ETS), 2012 17th IEEE European. :1-6 May, 2012
Relation: 2012 17th IEEE European Test Symposium (ETS)
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9مؤتمر
المصدر: 2011 IEEE 17th International On-Line Testing Symposium On-Line Testing Symposium (IOLTS), 2011 IEEE 17th International. :198-201 Jul, 2011
Relation: 2011 IEEE 17th International On-Line Testing Symposium (IOLTS 2011)
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10مؤتمر
المصدر: 29th VLSI Test Symposium VLSI Test Symposium (VTS), 2011 IEEE 29th. :140-145 May, 2011
Relation: 2011 IEEE VLSI Test Symposium (VTS)
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