المؤلفون: Porret, C., Everaert, J.-L., Schaekers, M., Ragnarsson, L.-A., Hikavyy, A., Rosseel, E., Rengo, G., Loo, R., Khazaka, R., Givens, M., Piao, X., Mertens, S., Heylen, N., Mertens, H., De Carvalho Cavalcante, C. Toledo, Sterckx, G., Brus, S., Mehta, A. Nalin, Korytov, M., Batuk, D., Favia, P., Langer, R., Pourtois, G., Swerts, J., Litta, E. Dentoni, Horiguchi, N.

المصدر: 2022 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2022 International. :34.1.1-34.1.4 Dec, 2022

Relation: 2022 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Everaert, J-L., Schaekers, M., Yu, H., Wang, L.-L., Hikavyy, A., Date, L., del Agua Borniquel, J., Hollar, K., Khaja, F. A., Aderhold, W., Mayur, A. J., Lee, J. Y., van Meer, H., Jiang, Y.-L., De Meyer, K., Mocuta, D., Horiguchi, N.

المصدر: 2017 Symposium on VLSI Technology VLSI Technology, 2017 Symposium on. :T214-T215 Jun, 2017

Relation: 2017 Symposium on VLSI Technology

المؤلفون: Wang, Lin-Lin, Yu, Hao, Schaekers, M., Everaert, J.-L., Franquet, A., Douhard, B., Date, L., del Agua Borniquel, J., Hollar, K., Khaja, F. A., Aderhold, W., Mayur, A. J., Lee, J. Y., van Meer, H., Mocuta, D., Horiguchi, N., Collaert, N., De Meyer, K., Jiang, Yu-Long

المصدر: 2017 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2017 IEEE International. :22.4.1-22.4.4 Dec, 2017

Relation: 2017 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: Everaert, J.-L., Conard, T., Schaekers, M.

المصدر: 2005 13th International Conference on Advanced Thermal Processing of Semiconductors Advanced Thermal Processing of Semiconductors Advanced Thermal Processing of Semiconductors, 2005. RTP 2005. 13th IEEE International Conference on. :135-138 2005

Relation: 13th IEEE International Conference on Advanced Thermal Processing of Semiconductors

المؤلفون: Henson, K., Lander, R.J.P., Demand, M., Dachs, C.J.J., Kaczer, B., Deweerd, W., Schram, T., Tokei, Z., Hooker, J.C., Cubaynes, F.N., Beckx, S., Boullart, W., Coenegrachts, B., Vertommen, J., Richard, O., Bender, H., Vandervorst, W., Kaiser, M., Everaert, J.-L., Jurczak, M., Biesemans, S.

المصدر: IEDM Technical Digest. IEEE International Electron Devices Meeting, 2004. Electron devices meeting Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International. :851-854 2004

Relation: 2004 International Electron Devices Meeting

المؤلفون: Yu, Hao, Schaekers, M., Rosseel, E., Everaert, J.-L., Eyben, P., Chiarella, T., Merckling, C., Agarwal, T. K., Pourtois, G., Hikavyy, A., Kubicek, S., Witters, L., Sibaja-Hernandez, A., Mitard, J., Waldron, N., Chew, S. A., Demuynck, S., Horiguchi, N., Barla, K., Thean, A. V.-Y., Mocuta, A., Mocuta, D., Collaert, N., De Meyer, K.

المصدر: 2016 IEEE International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2016 IEEE International. :25.1.1-25.1.4 Dec, 2016

Relation: 2016 IEEE International Electron Devices Meeting (IEDM)

المؤلفون: O'Sullivan, B. J., Kaushik, V. S., Everaert, J.-L., Trojman, L., Ragnarsson, L.-A., Pantisano, L., Rohr, E., DeGendt, S., Heyns, M.

المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 54(7):1771-1775 Jul, 2007

المؤلفون: Nguyen, N. D., Rosseel, E., Takeuchi, S., Everaert, J.-L., Loo, R., Goossens, J., Moussa, A., Clarysse, T., Caymax, M., Vandervorst, W.

المصدر: 2009 International Semiconductor Device Research Symposium Semiconductor Device Research Symposium, 2009. ISDRS '09. International. :1-2 Dec, 2009

Relation: 2009 International Semiconductor Device Research Symposium (ISDRS)

المؤلفون: Ortolland, C., Ragnarsson, L.-A., Favia, P., Richard, O., Kerner, C., Chiarella, T., Rosseel, E., Okuno, Y., Akheyar, A., Tseng, J., Everaert, J.-L., Schram, T., Kubicek, S., Aoulaiche, M., Cho, M.J., Absil, P.P., Biesemans, S., Hoffmann, T.

المصدر: 2009 Symposium on VLSI Technology VLSI Technology, 2009 Symposium on. :38-39 Jun, 2009

Relation: 2009 Symposium on VLSI Technology

المؤلفون: Ortolland, C., Ragnarsson, L.-A., Kerner, C., Chiarella, T., Rosseel, E., Okuno, Y., Favia, P., Richard, O., Everaert, J.-L., Schram, T., Kubicek, S., Absil, P.P., Biesemans, S., Schreutelkamp, R., Hoffmann, T.

المصدر: 2009 International Workshop on Junction Technology Junction Technology, 2009. IWJT 2009. International Workshop on. :54-57 Jun, 2009

Relation: 2009 International Workshop on Junction Technology (IWJT)