المؤلفون: Ching-lung Cheung, Ernest H Y Ng, Shui Fan Lai, Jennifer K Y Ko, Sofie S F Yung, Rebecca S F Wan, Catherine K Y Wong, Keedon Wong, Raymond H W Li

المصدر: BMJ Open, Vol 14, Iss 4 (2024)

مصطلحات موضوعية: Medicine

وصف الملف: electronic resource

Relation: https://bmjopen.bmj.com/content/14/4/e070801.full; https://doaj.org/toc/2044-6055

URL الوصول: https://doaj.org/article/a92d9a84277742f399080e80e93a2eff

المؤلفون: Kazeem, A.^Aff6, Awwal, H. N.^Aff7, Hassan, N. Z.^Aff8, Badarulzaman, N. A.^Aff8, Jikan, S. S.^Aff9, Ali, W. F. F. Wan^Aff10

المساهمون: Jawaid, Mohammad, Series Editor^Aff1, Ariffin, Ahmad Hamdan, editor^Aff2, Latif, Noradila Abdul, editor^Aff3, Mahmod, Muhammad Faisal bin, editor^Aff4, Mohamad, Zaleha Binti, editor^Aff5

المصدر: Structural Integrity and Monitoring for Composite Materials. :73-85

المؤلفون: Othman, N. A. F., Azhari, F. N. N., Hatta, S. F. Wan Muhammad, Soin, N.

المصدر: 2016 IEEE International Conference on Semiconductor Electronics (ICSE) Semiconductor Electronics (ICSE), 2016 IEEE International Conference on. :141-144 Aug, 2016

Relation: 2016 IEEE International Conference on Semiconductor Electronics (ICSE)

المؤلفون: Ali, Muslihah, Noorakma, Abdullah C. W., Yusof, Norliana, Mohamad, W. N. F., Soin, N., Hatta, S. F. Wan Muhamad

المصدر: 2016 IEEE International Conference on Semiconductor Electronics (ICSE) Semiconductor Electronics (ICSE), 2016 IEEE International Conference on. :173-176 Aug, 2016

Relation: 2016 IEEE International Conference on Semiconductor Electronics (ICSE)

المؤلفون: Alimin, A. F. Muhammad, Hatta, S. F. Wan Muhamad, Soin, N.

المصدر: 2016 IEEE International Conference on Semiconductor Electronics (ICSE) Semiconductor Electronics (ICSE), 2016 IEEE International Conference on. :272-275 Aug, 2016

Relation: 2016 IEEE International Conference on Semiconductor Electronics (ICSE)

المؤلفون: Othman, N. A. F., Hatta, S. F. Wan Muhammad, Soin, N.

المصدر: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2016 IEEE 23rd International Symposium on the. :267-271 Jul, 2016

Relation: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA)

المؤلفون: Wei Kang, Jessica J. P. Shami, Vincent K. C. Yan, Xuxiao Ye, Joseph E. Blais, Xue Li, Victor H. F. Lee, Celine S. L. Chui, Francisco T. T. Lai, Eric Y. F. Wan, Carlos K. H. Wong, Ian C. K. Wong, Esther W. Chan

المصدر: Journal of Hematology & Oncology, Vol 15, Iss 1, Pp 1-6 (2022)

مصطلحات موضوعية: COVID-19, Vaccine, Safety, Adverse events of special interest (AESI), BNT162b2, CoronaVac, Diseases of the blood and blood-forming organs, RC633-647.5, Neoplasms. Tumors. Oncology. Including cancer and carcinogens, RC254-282

وصف الملف: electronic resource

Relation: https://doaj.org/toc/1756-8722

URL الوصول: https://doaj.org/article/8d7ea4c350b54c8db57f62bfd32e0143

المؤلفون: Buba, S. D., Ahmad, W. F. Wan, Kadir, M. Z. A. Ab, Gomes, C., Jasni, J., Osman, M.

المصدر: 2014 IEEE 8th International Power Engineering and Optimization Conference (PEOCO2014) Power Engineering and Optimization Conference (PEOCO), 2014 IEEE 8th International. :508-513 Mar, 2014

Relation: 2014 IEEE 8th International Power Engineering and Optimization Conference (PEOCO)

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