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المؤلفون: C. Laguna, M. Bernard, J. Garrione, F. Fillot, F. Aussenac, D. Rouchon, G. Lima, L. Militaru, A. Souifi, G. Navarro

المصدر: Journal of Applied Physics. 133:074501

مصطلحات موضوعية: General Physics and Astronomy

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::38ad2cc880599bcab06372d1519d24da
https://doi.org/10.1063/5.0134947

المؤلفون: Anne-Sophie Royet, Claire Fenouillet-Beranger, Laurent Brunet, Pablo Acosta-Alba, Sebastien Kerdiles, Cédric Perrot, F. Aussenac, Jessica Lassarre

المصدر: ECS Transactions. 93:19-22

مصطلحات موضوعية: Materials science, business.industry, Annealing (metallurgy), medicine, Gate stack, Optoelectronics, Nanosecond laser, business, medicine.disease_cause, Ultraviolet

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b8b128c52174d674cc5cc28633710e99
https://doi.org/10.1149/09301.0019ecst

المؤلفون: X. Mescot, F. Tcheme Wakam, C. Vizioz, F. Aussenac, J.M. Hartmann, Kyung Hwa Lee, Joris Lacord, M. Bawedin, L. Brevard, Pascal Besson, Zdenek Chalupa, Virginie Loup

المصدر: 2021 Joint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS).

مصطلحات موضوعية: Hardware_MEMORYSTRUCTURES, Materials science, Fabrication, business.industry, Logic gate, Hardware_INTEGRATEDCIRCUITS, Nanowire, Optoelectronics, Heterojunction, business, Memory performance, Dram, Characterization (materials science)

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3d0be30c878ea61bbaac30aefc29fc6b
https://doi.org/10.1109/eurosoi-ulis53016.2021.9560676

المؤلفون: J. Lacord, F. Tcheme Wakam, Z. Chalupa, J.-M. Hartmann, P. Besson, V. Loup, C. Vizioz, L. Brevard, F. Aussenac, X. Mescot, K. Lee, M. Bawedin

المصدر: Solid-State Electronics. 193:108294

مصطلحات موضوعية: Materials Chemistry, Electrical and Electronic Engineering, Condensed Matter Physics, Electronic, Optical and Magnetic Materials

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7e6d72453949fa662f5d50ac49cac541
https://doi.org/10.1016/j.sse.2022.108294

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المؤلفون: P. Chiquet, T. Francois, Jean Coignus, Uwe Schroeder, F. Gaillard, Nicolas Vaxelaire, Etienne Nowak, S. Chevalliez, Stefan Slesazeck, Marc Bocquet, Laurent Grenouillet, Thomas Mikolajick, F. Aussenac, C. Carabasse, Claudia Richter

المساهمون: Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), NaMLab gGmbH

المصدر: Applied Physics Letters
Applied Physics Letters, 2021, 118 (6), pp.062904. ⟨10.1063/5.0035650⟩

مصطلحات موضوعية: 010302 applied physics, Materials science, Physics and Astronomy (miscellaneous), business.industry, Orders of magnitude (temperature), chemistry.chemical_element, 02 engineering and technology, Dielectric, 021001 nanoscience & nanotechnology, 01 natural sciences, Ferroelectricity, law.invention, Back end of line, Capacitor, chemistry, law, 0103 physical sciences, Optoelectronics, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, Tin, business, Polarization (electrochemistry), Scaling

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::51892e1fc906f8179fd078e0727b99e1

المؤلفون: Laurent Grenouillet, P. Chiquet, C. Carabasse, Evelyn T. Breyer, Uwe Schroeder, F. Aussenac, T. Francois, P. Blaise, Marc Bocquet, Claudia Richter, Stefan Slesazeck, Nicolas Vaxelaire, Virginie Loup, A. Makosiej, Monica Materano, Bastien Giraud, F. Gaillard, J. Coignus, Viktor Havel, Etienne Nowak, T. Magis, C. Pellissier

المساهمون: Commissariat à l'énergie atomique et aux énergies alternatives - Laboratoire d'Electronique et de Technologie de l'Information (CEA-LETI), Direction de Recherche Technologique (CEA) (DRT (CEA)), Commissariat à l'énergie atomique et aux énergies alternatives (CEA)-Commissariat à l'énergie atomique et aux énergies alternatives (CEA), Institut des Matériaux, de Microélectronique et des Nanosciences de Provence (IM2NP), Aix Marseille Université (AMU)-Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS), NaMLab gGmbH, Université de Toulon (UTLN)-Centre National de la Recherche Scientifique (CNRS)-Aix Marseille Université (AMU)

المصدر: 2019 IEEE International Electron Devices Meeting (IEDM)
2019 IEEE International Electron Devices Meeting (IEDM), Dec 2019, San Francisco, United States. ⟨10.1109/IEDM19573.2019.8993485⟩

مصطلحات موضوعية: 010302 applied physics, Materials science, business.industry, chemistry.chemical_element, 02 engineering and technology, 021001 nanoscience & nanotechnology, 7. Clean energy, 01 natural sciences, Ferroelectricity, law.invention, Capacitor, CMOS, chemistry, law, 0103 physical sciences, Ferroelectric RAM, Scalability, Optoelectronics, Data retention, [SPI.NANO]Engineering Sciences [physics]/Micro and nanotechnologies/Microelectronics, 0210 nano-technology, Tin, business, Voltage

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::beac895454f5d4cd552dee42b9cf2e5d
https://hal.science/hal-02399654

المؤلفون: F. Aussenac, Paola Trotti, Mathieu Bernard, Sami Oukassi, Gael Pillonnet, Gabriel Molas

المصدر: Advanced Electronic Materials. 7:2100297

مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, business, Energy (signal processing), Electronic, Optical and Magnetic Materials, Resistive random-access memory

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2a9103e0544685700a94ab104e011df4
https://doi.org/10.1002/aelm.202100297

المؤلفون: Pablo Acosta-Alba, F. Aussenac, Marc Veillerot, Karim Huet, Hervé Denis, Laurent Brunet, Fulvio Mazzamuto, Bernard Previtali, Perrine Batude, B. Mathieu, Claire Fenouillet-Beranger, I. Toque-Tresonne, Marie-Pierre Samson, Sebastien Kerdiles

المصدر: ECS Transactions. 80:215-225

مصطلحات موضوعية: Laser annealing, Engineering, Temperature treatment, business.industry, Annealing (metallurgy), Process integration, Electrical engineering, Optoelectronics, Silicon on insulator, Dopant Activation, Nanosecond laser, business, Lower temperature

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::a453e7c7c5b55175c95835d5284a9b6a
https://doi.org/10.1149/08004.0215ecst