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1دورية أكاديمية
المصدر: European Psychiatry, Vol 67, Pp S487-S488 (2024)
مصطلحات موضوعية: Psychiatry, RC435-571
وصف الملف: electronic resource
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2دورية أكاديمية
المصدر: European Psychiatry, Vol 67, Pp S769-S769 (2024)
مصطلحات موضوعية: Psychiatry, RC435-571
وصف الملف: electronic resource
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3دورية أكاديمية
المصدر: European Psychiatry, Vol 67, Pp S769-S769 (2024)
مصطلحات موضوعية: Psychiatry, RC435-571
وصف الملف: electronic resource
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المؤلفون: Stephane Azzopardi, L. Theolier, F. Baccar, Houssam Arbess, Eric Woirgard
المصدر: Microelectronics Reliability. 55:1981-1987
مصطلحات موضوعية: Materials science, Scanning electron microscope, Delamination, Temperature cycling, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Finite element method, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Reliability (semiconductor), Trench, Electronic engineering, Breakdown voltage, Electrical and Electronic Engineering, Composite material, Safety, Risk, Reliability and Quality, Diode
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المؤلفون: Eric Woirgard, K. El Boubkari, Stephane Azzopardi, F. Baccar, L. Theolier, Jean-Yves Deletage
المساهمون: Woirgard, Eric
المصدر: HAL
مصطلحات موضوعية: Materials science, PIN diode, Mechanical engineering, Biasing, Condensed Matter Physics, [SPI.TRON] Engineering Sciences [physics]/Electronics, Atomic and Molecular Physics, and Optics, Finite element method, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Characterization (materials science), law.invention, Power (physics), law, Electronic engineering, Power semiconductor device, Wafer, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, ComputingMilieux_MISCELLANEOUS, Diode
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المؤلفون: L. Theolier, Houssam Arbess, Eric Woirgard, S. Azzopardi, F. Baccar
المصدر: 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems.
مصطلحات موضوعية: Engineering, business.industry, Computation, Deep trench, Convergence (routing), Electronic engineering, business, Mixed mode, Diode
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6d203a23209173c748bc0147c9258edc
https://doi.org/10.1109/eurosime.2015.7103122 -
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المؤلفون: Eric Woirgard, Jean-Yves Deletage, Stephane Azzopardi, L. Theolier, Francois Le Henaff, F. Baccar
المساهمون: Fiabilité / Puissance, Laboratoire de l'intégration, du matériau au système (IMS), Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1-Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1, ANR 2011 BS09 033,ANR 2011 BS09 033
المصدر: The 26th International Symposium on Power Semiconductor Devices and ICs (ISPSD'14)
The 26th International Symposium on Power Semiconductor Devices and ICs (ISPSD'14), Jun 2014, Waikoloa, United States. pp.143-146, ⟨10.1109/ISPSD.2014.6855996⟩مصطلحات موضوعية: 010302 applied physics, Materials science, Silicon, business.industry, [SPI.NRJ]Engineering Sciences [physics]/Electric power, 020208 electrical & electronic engineering, dBc, Sintering, chemistry.chemical_element, Nanotechnology, 02 engineering and technology, Chip, 01 natural sciences, Reliability (semiconductor), chemistry, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Breakdown voltage, Electrical measurements, business, Diode
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::991eefee1c74f7354efd8c3d400f57e6
https://doi.org/10.1109/ispsd.2014.6855996 -
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المؤلفون: Eric Woirgard, F. Le Henaff, S. Azzopardi, L. Theolier, F. Baccar
المساهمون: Fiabilité / Puissance, Laboratoire de l'intégration, du matériau au système (IMS), Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1-Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1, ANR 2011 BS09 033,ANR 2011 BS09 033
المصدر: EuroSimE
EuroSimE, Apr 2014, Ghent, Belgium. pp.1-7, ⟨10.1109/EuroSimE.2014.6813814⟩مصطلحات موضوعية: Work (thermodynamics), Materials science, Silicon, business.industry, [SPI.NRJ]Engineering Sciences [physics]/Electric power, Electrical engineering, chemistry.chemical_element, Finite element method, Reliability (semiconductor), chemistry, Void (composites), Optoelectronics, Cyclotene, Power semiconductor device, business, Diode
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c30c27e3bc2edef6ff463ecf2617db99
https://doi.org/10.1109/eurosime.2014.6813814 -
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10دورية أكاديمية
المؤلفون: S. Mazzucchelli, M. Truffi, F. Baccarini, M. Beretta, L. Sorrentino, M. Bellini, M. A. Rizzuto, R. Ottria, A. Ravelli, P. Ciuffreda, D. Prosperi, F. Corsi
المصدر: Scientific Reports, Vol 7, Iss 1, Pp 1-15 (2017)
وصف الملف: electronic resource
Relation: https://doaj.org/toc/2045-2322