المؤلفون: B. Abassi, F. Fekih-Romdhane, F. Baccar, M. Cheour, R. Damak, S. Ellini

المصدر: European Psychiatry, Vol 67, Pp S487-S488 (2024)

مصطلحات موضوعية: Psychiatry, RC435-571

وصف الملف: electronic resource

Relation: https://www.cambridge.org/core/product/identifier/S0924933824010137/type/journal_article; https://doaj.org/toc/0924-9338; https://doaj.org/toc/1778-3585

URL الوصول: https://doaj.org/article/2b4b4c0c5bc3451ba67eaf67d8e879b9

المؤلفون: F. Baccar, B. Abassi, B. Amamou

المصدر: European Psychiatry, Vol 67, Pp S769-S769 (2024)

مصطلحات موضوعية: Psychiatry, RC435-571

وصف الملف: electronic resource

Relation: https://www.cambridge.org/core/product/identifier/S0924933824016018/type/journal_article; https://doaj.org/toc/0924-9338; https://doaj.org/toc/1778-3585

URL الوصول: https://doaj.org/article/f733dca6d36d4cc69b1c408b585c33f3

المؤلفون: B. Abassi, F. Fekih-Romdhane, F. Baccar, M. Cheour, E. Sana, R. Damak

المصدر: European Psychiatry, Vol 67, Pp S769-S769 (2024)

مصطلحات موضوعية: Psychiatry, RC435-571

وصف الملف: electronic resource

Relation: https://www.cambridge.org/core/product/identifier/S0924933824016006/type/journal_article; https://doaj.org/toc/0924-9338; https://doaj.org/toc/1778-3585

URL الوصول: https://doaj.org/article/7d2620bb84cd4cc6a65d10623a304af8

المؤلفون: Stephane Azzopardi, L. Theolier, F. Baccar, Houssam Arbess, Eric Woirgard

المصدر: Microelectronics Reliability. 55:1981-1987

مصطلحات موضوعية: Materials science, Scanning electron microscope, Delamination, Temperature cycling, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Finite element method, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Reliability (semiconductor), Trench, Electronic engineering, Breakdown voltage, Electrical and Electronic Engineering, Composite material, Safety, Risk, Reliability and Quality, Diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b82b9a2a2e23e93ab30c3a38a24a6030
https://doi.org/10.1016/j.microrel.2015.06.132

المؤلفون: Eric Woirgard, K. El Boubkari, Stephane Azzopardi, F. Baccar, L. Theolier, Jean-Yves Deletage

المساهمون: Woirgard, Eric

المصدر: HAL

مصطلحات موضوعية: Materials science, PIN diode, Mechanical engineering, Biasing, Condensed Matter Physics, [SPI.TRON] Engineering Sciences [physics]/Electronics, Atomic and Molecular Physics, and Optics, Finite element method, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Characterization (materials science), law.invention, Power (physics), law, Electronic engineering, Power semiconductor device, Wafer, Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, ComputingMilieux_MISCELLANEOUS, Diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::489e79d429f197633b151917a63f8e2b
https://doi.org/10.1016/j.microrel.2013.07.076

المؤلفون: L. Theolier, Houssam Arbess, Eric Woirgard, S. Azzopardi, F. Baccar

المصدر: 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems.

مصطلحات موضوعية: Engineering, business.industry, Computation, Deep trench, Convergence (routing), Electronic engineering, business, Mixed mode, Diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6d203a23209173c748bc0147c9258edc
https://doi.org/10.1109/eurosime.2015.7103122

المؤلفون: Eric Woirgard, Jean-Yves Deletage, Stephane Azzopardi, L. Theolier, Francois Le Henaff, F. Baccar

المساهمون: Fiabilité / Puissance, Laboratoire de l'intégration, du matériau au système (IMS), Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1-Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1, ANR 2011 BS09 033,ANR 2011 BS09 033

المصدر: The 26th International Symposium on Power Semiconductor Devices and ICs (ISPSD'14)
The 26th International Symposium on Power Semiconductor Devices and ICs (ISPSD'14), Jun 2014, Waikoloa, United States. pp.143-146, ⟨10.1109/ISPSD.2014.6855996⟩

مصطلحات موضوعية: 010302 applied physics, Materials science, Silicon, business.industry, [SPI.NRJ]Engineering Sciences [physics]/Electric power, 020208 electrical & electronic engineering, dBc, Sintering, chemistry.chemical_element, Nanotechnology, 02 engineering and technology, Chip, 01 natural sciences, Reliability (semiconductor), chemistry, 0103 physical sciences, 0202 electrical engineering, electronic engineering, information engineering, Optoelectronics, Breakdown voltage, Electrical measurements, business, Diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::991eefee1c74f7354efd8c3d400f57e6
https://doi.org/10.1109/ispsd.2014.6855996

المؤلفون: Eric Woirgard, F. Le Henaff, S. Azzopardi, L. Theolier, F. Baccar

المساهمون: Fiabilité / Puissance, Laboratoire de l'intégration, du matériau au système (IMS), Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1-Centre National de la Recherche Scientifique (CNRS)-Institut Polytechnique de Bordeaux-Université Sciences et Technologies - Bordeaux 1, ANR 2011 BS09 033,ANR 2011 BS09 033

المصدر: EuroSimE
EuroSimE, Apr 2014, Ghent, Belgium. pp.1-7, ⟨10.1109/EuroSimE.2014.6813814⟩

مصطلحات موضوعية: Work (thermodynamics), Materials science, Silicon, business.industry, [SPI.NRJ]Engineering Sciences [physics]/Electric power, Electrical engineering, chemistry.chemical_element, Finite element method, Reliability (semiconductor), chemistry, Void (composites), Optoelectronics, Cyclotene, Power semiconductor device, business, Diode

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c30c27e3bc2edef6ff463ecf2617db99
https://doi.org/10.1109/eurosime.2014.6813814

المؤلفون: E. Dutrieux, S. Guellouz, G.F. Frissoni, F. Baccar, A. Bouajina, M. Belhssen, M. M'Hatti, A.A. Ramos-Espla

URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::938dc3e46228fbdccc266942c692be4a

المؤلفون: S. Mazzucchelli, M. Truffi, F. Baccarini, M. Beretta, L. Sorrentino, M. Bellini, M. A. Rizzuto, R. Ottria, A. Ravelli, P. Ciuffreda, D. Prosperi, F. Corsi

المصدر: Scientific Reports, Vol 7, Iss 1, Pp 1-15 (2017)

مصطلحات موضوعية: Medicine, Science

وصف الملف: electronic resource

Relation: https://doaj.org/toc/2045-2322

URL الوصول: https://doaj.org/article/461d775565f14fa88350002a8cc0ece9