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المؤلفون: C. Malaquin, D Parissi, C Michau, Walter Schwarzenbach, Bich-Yen Nguyen, C. Le Royer, C. Bertrand-Giuliani, L. Grenouillet, F. Boedt, Frederic Allibert, S. Loubriat
المصدر: 2016 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
مصطلحات موضوعية: 010302 applied physics, Engineering, business.industry, Electric breakdown, Electrical engineering, Silicon on insulator, 02 engineering and technology, 021001 nanoscience & nanotechnology, 01 natural sciences, Buried oxide, Planar, Logic gate, 0103 physical sciences, Wafer, Node (circuits), 0210 nano-technology, business, Scaling
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المؤلفون: Loan Pham-Nguyen, Stephane Denorme, P. Gros, Pascal Gouraud, Pierre Perreau, Sébastien Barnola, Sebastien Haendler, A. Margain, Y. Campidelli, F. Boedt, Olivier Weber, Christian Arvet, Daniel Delprat, J. Vetier, Francois Leverd, Remi Beneyton, C. Fenouillet-Beranger, C. Perrot, Tomasz Skotnicki, Stephane Monfray, Bich-Yen Nguyen, O. Faynot, F. Baron, Konstantin Bourdelle, C. de Buttet, A. Torres, Francois Andrieu, L. Pinzelli, L. Tosti, C. Borowiak, C. Laviron, F. Abbate
المصدر: Solid-State Electronics. 54:849-854
مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Silicon on insulator, Condensed Matter Physics, Subthreshold slope, Electronic, Optical and Magnetic Materials, PMOS logic, Threshold voltage, Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, business, Metal gate, NMOS logic, High-κ dielectric, Ground plane
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المؤلفون: Frederic Allibert, F. Boedt, Oleg Kononchuk
المصدر: Solid State Phenomena. :113-118
مصطلحات موضوعية: Atmosphere, Materials science, Etching (microfabrication), Oxygen transport, Evaporation, Silicon on insulator, General Materials Science, Wafer, Composite material, Condensed Matter Physics, Layer (electronics), Dissolution, Atomic and Molecular Physics, and Optics
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::7d5833c48de267dc5c290e6e73e93625
https://doi.org/10.4028/www.scientific.net/ssp.131-133.113 -
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المؤلفون: P. Perreau, C. Fenouillet-Beranger, Frederic Boeuf, C. Perrot, Sébastien Barnola, C. de Buttet, F. Boedt, Konstantin Bourdelle, O. Faynot, Olivier Weber, Francois Andrieu, F. Abbate, Tomasz Skotnicki, S. Peru, L. Pinzelli, Thierry Poiroux, Pascal Gouraud, P. Boulenc, Y. Campidelli, L. Tosti, Remi Beneyton, A. Margain, Bich-Yen Nguyen
المصدر: 2011 Proceedings of the European Solid-State Device Research Conference (ESSDERC).
مصطلحات موضوعية: Materials science, business.industry, Bipolar junction transistor, Electrical engineering, Silicon on insulator, Biasing, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Gate oxide, MOSFET, Materials Chemistry, Optoelectronics, Breakdown voltage, sense organs, Electrical and Electronic Engineering, business, Metal gate, High-κ dielectric, Communication channel, Ground plane
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fb4c010aab7814a296036ee1e69c503a
https://doi.org/10.1109/essderc.2011.6044222 -
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المؤلفون: O. Bonnin, Walter Schwarzenbach, Carlos Mazure, Christophe Girard, X. Cauchy, Christophe Maleville, Bich-Yen Nguyen, E. Butaud, F. Boedt
المصدر: 2011 IEEE International Conference on IC Design & Technology.
مصطلحات موضوعية: Planar, Materials science, Silicon, chemistry, CMOS, business.industry, Electronic engineering, Silicon on insulator, chemistry.chemical_element, Optoelectronics, business, Layer thickness, Total thickness
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::de657f2483ce42fb2c3db52bcf1fbec3
https://doi.org/10.1109/icicdt.2011.5783188 -
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المؤلفون: Pierre Perreau, T. Benoist, Olivier Weber, L. Tosti, O. Faynot, Konstantin Bourdelle, A. Bajolet, Sebastien Haendler, F. Bouf, Claire Fenouillet-Beranger, X. Garros, Francois Andrieu, M. Casse, Olivier P. Thomas, J.-P. Noel, F. Boedt
المصدر: 2011 IEEE International Conference on IC Design & Technology.
مصطلحات موضوعية: Materials science, business.industry, Electrical engineering, Silicon on insulator, Biasing, Hardware_PERFORMANCEANDRELIABILITY, Logic gate, Low-power electronics, Hardware_INTEGRATEDCIRCUITS, Node (circuits), System on a chip, Static random-access memory, business, Metal gate
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::2ee3d692da83028f81e5a93ffea2de99
https://doi.org/10.1109/icicdt.2011.5783186 -
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المؤلفون: Frederic Boeuf, Sébastien Barnola, J.-L. Huguenin, Francois Andrieu, F. Martin, C. Perrot, F. Abbate, Olivier Weber, Stephane Denorme, L. Clement, M. Casse, Remi Beneyton, Konstantin Bourdelle, F. Boedt, A. Bajolet, L. Pinzelli, P. Perreau, O. Faynot, Charles Leroux, Pascal Gouraud, C. de Buttet, L. Tosti, C. Borowiak, Bich-Yen Nguyen, R. Gassilloud, C. Fenouillet-Beranger, X. Garros, Thomas Skotnicki, B. Pernet, Y. Campidelli, S. Peru, Roland Pantel
المصدر: Proceedings of 2011 International Symposium on VLSI Technology, Systems and Applications.
مصطلحات موضوعية: Materials science, CMOS, business.industry, Gate oxide, Electrical engineering, Optoelectronics, NAND gate, Time-dependent gate oxide breakdown, business, Metal gate, AND gate, NMOS logic, PMOS logic
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::31de5a868e19fe106912a406873a24d3
https://doi.org/10.1109/vtsa.2011.5872254 -
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المؤلفون: Abdelkarim Mercha, Daniel Delprat, B. De Wachter, Nadine Collaert, F. Boedt, Laith Altimime, Bich-Yen Nguyen, Marc Aoulaiche, Konstantin Bourdelle, Eddy Simoen, Malgorzata Jurczak
المصدر: 2010 IEEE International SOI Conference (SOI).
مصطلحات موضوعية: Capacitor, Materials science, law, business.industry, Reliability study, MOSFET, Electrical engineering, Silicon on insulator, Optoelectronics, Sense (electronics), business, Degradation (telecommunications), law.invention
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::c20bd3f691a0dd0562008f50c4951d0a
https://doi.org/10.1109/soi.2010.5641377 -
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المؤلفون: F. Abbate, L. Tosti, C. Borowiak, C. Perrot, Sébastien Barnola, A. Bajolet, Francois Andrieu, F. Baron, Pascal Gouraud, Konstantin Bourdelle, C. de Buttet, C. Fenouillet-Beranger, Remi Beneyton, Olivier P. Thomas, B. Pernet, Thomas Skotnicki, Stephane Denorme, Olivier Weber, Bich-Yen Nguyen, Y. Campidelli, J.-P. Noel, M. Casse, Frederic Boeuf, O. Faynot, L. Pinzelli, F. Boedt, Sebastien Haendler, P. Perreau
المصدر: 2010 Symposium on VLSI Technology.
مصطلحات موضوعية: Engineering, business.industry, Low-power electronics, Logic gate, Circuit design, Electrical engineering, Electronic engineering, Silicon on insulator, Biasing, Static random-access memory, Integrated circuit design, business, Leakage (electronics)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7dd0787eeb44a38951b5d2a38f76d10
https://doi.org/10.1109/vlsit.2010.5556118 -
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المؤلفون: Olivier P. Thomas, C. Fenouillet-Beranger, J.-P. Noel, F. Boedt, J. Dura, Bich-Yen Nguyen, Daniel Delprat, A. Amara, F. Andrieu, Konstantin Bourdelle, M.-A. Jaud, Frederic Boeuf, Andrei Vladimirescu, P. Perreau
المصدر: ISCAS
مصطلحات موضوعية: Digital electronics, Engineering, business.industry, Logic gate, Electrical engineering, Silicon on insulator, Network synthesis filters, Physical design, business, Capacitance, Threshold voltage, Communication channel
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::24f93d9a7de9e5934f7b45d1b3cd9395
https://doi.org/10.1109/iscas.2010.5537517