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المؤلفون: Tatiana Novikova, A. De Martino, Clément Fallet, Cyril Vannuffel, F. Ferrieu, S. Ben Hatit
المصدر: Thin Solid Films. 519:2608-2612
مصطلحات موضوعية: Birefringence, Materials science, business.industry, Metals and Alloys, Polarimetry, Surfaces and Interfaces, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Nanometrology, Optics, Ellipsometry, Materials Chemistry, Microelectronics, Angular resolution, Mueller calculus, business, Anisotropy
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2
المؤلفون: F. Ferrieu, J.L. Stehlé, J.P. Piel
المصدر: Applied Surface Science. 256:S96-S100
مصطلحات موضوعية: Materials science, Analytical chemistry, General Physics and Astronomy, Surfaces and Interfaces, General Chemistry, Condensed Matter Physics, Fractal analysis, Surface energy, Surfaces, Coatings and Films, Fractal, Adsorption, Chemical physics, Ellipsometry, Desorption, Molecule, Thin film
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3
المؤلفون: P Ribot, F. Ferrieu, J.L. Regolini
المصدر: Thin Solid Films. 373:211-215
مصطلحات موضوعية: Dummy load, Materials science, Silicon, business.industry, Heterojunction bipolar transistor, Alloy, Metals and Alloys, Analytical chemistry, chemistry.chemical_element, Heterojunction, Surfaces and Interfaces, engineering.material, Epitaxy, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry, Materials Chemistry, engineering, Microelectronics, Optoelectronics, Wafer, business
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4
المؤلفون: F. Ferrieu, C. Morin, J.L. Regolini
المصدر: Thin Solid Films. 315:316-321
مصطلحات موضوعية: Materials science, Metals and Alloys, Analytical chemistry, Surfaces and Interfaces, Microstructure, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Characterization (materials science), Amorphous solid, CMOS, Electrode, Materials Chemistry, Crystallite, Chemical composition, Layer (electronics)
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5
المؤلفون: F. Ferrieu, Olivier Joubert, Bernard Drevillon, L. Vallier, S. Vallon, N. Blayo
المصدر: Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 15:865-870
مصطلحات موضوعية: Materials science, business.industry, Surfaces and Interfaces, Plasma, Integrated circuit, Condensed Matter Physics, medicine.disease_cause, Signature (logic), Surfaces, Coatings and Films, law.invention, Optics, Etching (microfabrication), Ellipsometry, law, medicine, Optoelectronics, Plasma diagnostics, business, Layer (electronics), Ultraviolet
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6
المؤلفون: A. Perio, A. Larré, D. Bensahel, F. Glowacki, Philippe Boucaud, F. Ferrieu
المصدر: Thin Solid Films. 248:1-5
مصطلحات موضوعية: In situ, Materials science, Metals and Alloys, Oxide, Analytical chemistry, Heterojunction, Surfaces and Interfaces, Silane, Chemical beam epitaxy, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Germane, Ellipsometry, Desorption, Materials Chemistry
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7
المؤلفون: F. Ferrieu, Y. Campidelli, F. Glowacki, A. Larré, Philippe Boucaud, D. Bensahel
المصدر: Journal of Electronic Materials. 23:565-568
مصطلحات موضوعية: Superlattice, Analytical chemistry, Mineralogy, chemistry.chemical_element, Germanium, Substrate (electronics), Condensed Matter Physics, Epitaxy, Silane, Chemical beam epitaxy, Electronic, Optical and Magnetic Materials, chemistry.chemical_compound, chemistry, Germane, Ellipsometry, Materials Chemistry, Electrical and Electronic Engineering
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8
المؤلفون: F. Ferrieu.
المصدر: EPJ Web of Conferences, Vol 5, p 04001 (2010)
مصطلحات موضوعية: Physics, business.industry, QC1-999, Polarimetry, Surface finish, Grating, law.invention, Optics, law, Surface roughness, Multiple patterning, Radar, Photonics, business, Lithography
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e3834d4ce2c835600f137c08a8a1f2a9
https://doaj.org/article/0ce2c8af6d3046c5bedf30d459c320a1 -
9
المؤلفون: A. Halimaoui, F. Ferrieu, D. Bensahel
المصدر: Solid State Communications. 84:293-296
مصطلحات موضوعية: Range (particle radiation), Materials science, Morphology (linguistics), Silicon, Analytical chemistry, chemistry.chemical_element, General Chemistry, Condensed Matter Physics, Porous silicon, chemistry, Ellipsometry, Materials Chemistry, Spectroscopic ellipsometry, Porosity, Anisotropy
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10
المؤلفون: F. Beck, D. Dutartre, F. Ferrieu
المصدر: Solid State Communications. 82:427-430
مصطلحات موضوعية: Chemistry, Materials Chemistry, Analytical chemistry, Spectroscopic ellipsometry, General Chemistry, Photon energy, Condensed Matter Physics, Electronic band structure