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1دورية أكاديمية
المؤلفون: B. COUDURIER, J.L. PEYRAUD, E. BLESBOIS, F. JEULAND, N. URRUTY, C. HUYGHE, H. GUYOMARD
المصدر: INRAE Productions Animales, Vol 28, Iss 1 (2015)
مصطلحات موضوعية: Animal culture, SF1-1100, Aquaculture. Fisheries. Angling, SH1-691
وصف الملف: electronic resource
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2
المؤلفون: L. Morancho, P. Canet, R. Bouchakour, F. Lalande, F. Jeuland, Jérémy Postel-Pellerin
المصدر: Microelectronics Reliability. 49:1060-1063
مصطلحات موضوعية: Arrhenius equation, Physics, Charge loss, Charge (physics), T-model, Variation (game tree), Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Displacement (vector), Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Computational physics, Flash (photography), symbols.namesake, symbols, Electronic engineering, Electrical and Electronic Engineering, Data retention, Safety, Risk, Reliability and Quality
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3
المؤلفون: Jérémy Postel-Pellerin, B. Villard, R. Bouchakour, B. Bertello, F. Lalande, F. Jeuland, P. Canet
المصدر: Microelectronics Reliability. 49:1056-1059
مصطلحات موضوعية: Engineering, Specific test, business.industry, Extraction (chemistry), NAND gate, Condensed Matter Physics, Atomic and Molecular Physics, and Optics, Surfaces, Coatings and Films, Electronic, Optical and Magnetic Materials, Cell size, Flash (photography), Electronic engineering, Node (circuits), Electrical and Electronic Engineering, Safety, Risk, Reliability and Quality, business
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4
المؤلفون: Ph. Normandon, G. Lormand, F. Jeuland, A. Boudou
المصدر: Quality and Reliability Engineering. 8:247-251
مصطلحات موضوعية: Temperature control, Materials science, Acceleration factor, Acceleration coefficient, Electronic engineering, Wafer, Activation energy, Management Science and Operations Research, Safety, Risk, Reliability and Quality, Electromigration, Current density, Standard deviation, Computational physics
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5
المؤلفون: F. Lalande, F. Jeuland, P. Canet, Jérémy Postel-Pellerin, B. Villard, B. Bertello, R. Bouchakour
المصدر: 2009 10th Annual Non-Volatile Memory Technology Symposium (NVMTS).
مصطلحات موضوعية: Engineering, business.industry, Electrical engineering, NAND gate, Hardware_PERFORMANCEANDRELIABILITY, Flash memory, International Technology Roadmap for Semiconductors, Flash (photography), Logic gate, Hardware_INTEGRATEDCIRCUITS, Electronic engineering, Microelectronics, Node (circuits), Process simulation, business
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b7631316646ce640d8fcc3eda6c0bc0b
https://doi.org/10.1109/nvmt.2009.5429787 -
6
المؤلفون: B. Bertello, R. Bouchakour, F. Lalande, F. Jeuland, Jérémy Postel-Pellerin, B. Villard, P. Canet
المصدر: 2009 International Conference on Simulation of Semiconductor Processes and Devices.
مصطلحات موضوعية: Flash (photography), Materials science, Parasitic capacitance, business.industry, Electric field, Phase (waves), Electronic engineering, NAND gate, Optoelectronics, business, Flash memory, Degradation (telecommunications), Communication channel
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::8c3264d41fbf5fd81e1539529971afab
https://doi.org/10.1109/sispad.2009.5290208 -
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المؤلفون: J. Postel-Pellerin, P. Canet, F. Lalande, R. Bouchakour, F. Jeuland, B. Bertello, B. Villard
المصدر: 2008 9th Annual Non-Volatile Memory Technology Symposium (NVMTS).
مصطلحات موضوعية: Flash (photography), Engineering, Hardware_MEMORYSTRUCTURES, Reliability (semiconductor), Coupling (computer programming), business.industry, Electronic engineering, NAND gate, business, Capacitance, Flash memory, Degradation (telecommunications), Communication channel
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b4f04f8c45318098a2256aa82c2a5f80
https://doi.org/10.1109/nvmt.2008.4731200 -
8
المؤلفون: A. Poncet, F. Jeuland, G. Lormand, Ph. Normandon, A. Boudou
المصدر: 1991 Proceedings Eighth International IEEE VLSI Multilevel Interconnection Conference.
مصطلحات موضوعية: Materials science, Condensed matter physics, Line (geometry), Thermal, Electronic engineering, Thermal effect, Current density, Electromigration, Electrical conductor, Grain size, Material flow
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::9d0373e076413476ce6a1bf735ceb68b
https://doi.org/10.1109/vmic.1991.153037 -
9دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل. -
10دورية أكاديمية
لا يتم عرض هذه النتيجة على الضيوف.
تسجيل الدخول للوصول الكامل.