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المؤلفون: Faiz Dahmani, P. Blaise, G. Rodriguez, J. Liebault, B. De Salvo, D. Bretegnier, E. Souchier, C. Cagli, E. Vianello, C. Carabasse, Vincent Jousseaume, F. Longnos, P. Verrier, G. Molas
المصدر: Solid-State Electronics. 84:155-159
مصطلحات موضوعية: Materials science, business.industry, Programmable metallization cell, Doping, Nanotechnology, Electrolyte, Condensed Matter Physics, Electronic, Optical and Magnetic Materials, Resistive random-access memory, Reliability (semiconductor), Materials Chemistry, Optoelectronics, Electrical and Electronic Engineering, Data retention, business, Electrical conductor, Voltage
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المؤلفون: J. Guy, Giorgio Palma, G. Molas, E. Vianello, L. Perniola, F. Longnos, Marinela Barci, P. Blaise, B. De Salvo
المصدر: Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials.
مصطلحات موضوعية: Engineering, Reliability (semiconductor), Programmable metallization cell, business.industry, Structural engineering, business, Electrical conductor, Bridge (interpersonal)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::932ee749b2b102a7aead373d6b20db99
https://doi.org/10.7567/ssdm.2015.o-1-1 -
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المؤلفون: G. Molas, M. Reyboz, G. Suraci, T. Benoist, F. Longnos, N. Jovanovic, Olivier P. Thomas, E. Vianello, Alexandre Levisse, B. De Salvo, L. Perniola
المصدر: 2014 14th Annual Non-Volatile Memory Technology Symposium (NVMTS).
مصطلحات موضوعية: Robust design, Matrix (mathematics), Engineering, Range (mathematics), Programmable metallization cell, business.industry, Memory window, Electronic engineering, business, Simulation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::6b8491b09597a79ba6d7cd99b7d9e8ee
https://doi.org/10.1109/nvmts.2014.7060850 -
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المؤلفون: G. Molas, M. Reyboz, F. Clermidy, Santhosh Onkaraiah, E. Vianello, N. Jovanovic, Ch. Muller, J-M. Portal, F. Longnos, Olivier P. Thomas
المصدر: 2014 IEEE 6th International Memory Workshop (IMW).
مصطلحات موضوعية: Switching time, Engineering, Robust design, CMOS, business.industry, Programmable metallization cell, Robustness (computer science), Circuit design, Electronic engineering, business, Electrical conductor, Electronic circuit
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::fd3e2580caf78ab351e66d190ff58836
https://doi.org/10.1109/imw.2014.6849371 -
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المؤلفون: J. Cluzel, G. Molas, J. Guy, A. Roule, A. Toffoli, Mathieu Bernard, P. Dorion, H. Grampeix, C. Carabasse, L. Perniola, O. Cueto, E. Souchier, B. De Salvo, P. Blaise, Sylvain Maitrejean, S. Blanc, F. Longnos, J. F. Nodin, E. Vianello, T. Cabout, V. Balan, P. Brianceau
المصدر: 2013 IEEE International Electron Devices Meeting.
مصطلحات موضوعية: Protein filament, Work (thermodynamics), Materials science, Nanoelectronics, Programmable metallization cell, Trench, Nano, Nanotechnology, Composite material, Electrical conductor, Instability
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::3c7d3c347872f4bb3c38b5eb70cafa57
https://doi.org/10.1109/iedm.2013.6724722 -
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المؤلفون: Mathieu Bernard, J. Liebault, F. Longnos, B. De Salvo, E. Vianello, D. Bretegnier, G. Molas, E. Souchier, C. Carabasse, Giorgio Palma
المصدر: 2013 5th IEEE International Memory Workshop.
مصطلحات موضوعية: Materials science, business.industry, Programmable metallization cell, Kinetics, Electrode, Doping, Electrical engineering, Optoelectronics, Large range, business, Reset (computing), Electrical conductor, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::395282682d8914100ace8a8ce40dadfc
https://doi.org/10.1109/imw.2013.6582107 -
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المؤلفون: G. Molas, Mathieu Bernard, G. Rodriguez, J. Liebault, Vincent Delaye, M. Reyboz, Sylvain Maitrejean, Faiz Dahmani, B. De Salvo, C. Carabasse, P. Blaise, F. Longnos, P. Verrier, G. Reimbold, E. Vianello, E. Souchier, C. Cagli, Vincent Jousseaume, J. Guy, A. Roule, D. Bretegnier, Giorgio Palma
المصدر: 2012 International Electron Devices Meeting.
مصطلحات موضوعية: Materials science, Programmable metallization cell, business.industry, Chalcogenide, Doping, Electrolyte, chemistry.chemical_compound, chemistry, Soldering, Electronic engineering, Optoelectronics, Thermal stability, Electrical measurements, business, Electrical conductor
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::5f616e133f0e53c273a97417b5a127a6
https://doi.org/10.1109/iedm.2012.6479145 -
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المؤلفون: Mathieu Bernard, E. Vianello, Faiz Dahmani, J. Guy, G. Molas, Giorgio Palma, M. Reyboz, F. Longnos, C. Carabasse, D. Bretegnier, C. Cagli, J. Liebault, B. De Salvo
المصدر: Extended Abstracts of the 2012 International Conference on Solid State Devices and Materials.
مصطلحات موضوعية: Materials science, Kinetics, Nanotechnology, Composite material, Bridge (interpersonal), Electrical conductor, Active layer
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::abae964a3ae274372cac6667d92569a0
https://doi.org/10.7567/ssdm.2012.b-4-2 -
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المؤلفون: E. Vianello, G. Molas, J. Liebault, B. De Salvo, G. Rodriguez, D. Bretegnier, P. Verrier, P. Blaise, F. Longnos, Faiz Dahmani, C. Carabasse, E. Souchier, C. Cagli, Vincent Jousseaume
المصدر: ESSDERC
مصطلحات موضوعية: Reliability (semiconductor), Materials science, Programmable metallization cell, business.industry, Doping, Electronic engineering, Optoelectronics, Electrolyte, Active electrode, business, Electrical conductor, Voltage
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::b774910710d7bebb50d06de9c3501c91
https://doi.org/10.1109/essderc.2012.6343387 -
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المؤلفون: E. Vianello, C. Cagli, Giorgio Palma, F. Longnos, B. De Salvo, Faiz Dahmani, P. Blaise, G. Molas, M. Reyboz
المصدر: 2012 4th IEEE International Memory Workshop.
مصطلحات موضوعية: Germanium compounds, Bridging (networking), Computer science, Programmable metallization cell, Electronic engineering, Experimental data, Electrical conductor, Quasistatic process, Data modeling
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::af14b158a4e78bbc89004a36bf729290
https://doi.org/10.1109/imw.2012.6213680