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1مؤتمر
المؤلفون: Liu, Shitao, Bi, Yu, Yi, Bi
المصدر: 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa) Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa), 2024 IEEE Joint International Symposium on. :190-193 May, 2024
Relation: 2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal & Power Integrity: EMC Japan / Asia-Pacific International Symposium on Electromagnetic Compatibility (EMC Japan/APEMC Okinawa)
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2دورية أكاديمية
المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 24(3):2491-2499 Feb, 2024
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3دورية أكاديمية
المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 73:1-9 2024
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4دورية أكاديميةPotentiometric MgO Film pH Sensor Measurement Analysis and Integrated Flexible Printed Circuit Board
المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 12:74-82 2024
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5دورية أكاديمية
المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(1):790-796 Jan, 2024
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6دورية أكاديمية
المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 23(23):28587-28596 Dec, 2023
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7دورية أكاديمية
المؤلفون: Lim, R., Damalerio, M.R.N.B., Sikkandhar, M., Wee, J.Y.V., Park, E.J., Lim, R.Y., Bae, I.H., Cheng, M.
المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 23(20):25401-25410 Oct, 2023
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8دورية أكاديمية
المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 23(9):9086-9092 May, 2023
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9دورية أكاديمية
المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 23(3):1809-1817 Feb, 2023
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10دورية أكاديمية
المصدر: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 72:1-8 2023