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1دورية أكاديمية
المؤلفون: Munir Abu-Helalah, Asma’a Al-Mnayyis, Hamed Alzoubi, Ruba Al-Abdallah, Hussein Jdaitawi, Omar Nafi, Kamel Abu-Sal, Alaa Altawalbeh, Alia Khlaifat, Enas Al-Zayadneh, Ihsan Almaaitah, Ibrahim Borghol, Fadi Batarseh, Omar Okkeh, Abdallah Dalal, Ahmad Alhendi, Mohammad Almaaitah, Adnan Al-Lahham, Mahmoud Gazo, Faisal Abu Ekteish, Ziad Elnasser
المصدر: Vaccines, Vol 11, Iss 9, p 1396 (2023)
مصطلحات موضوعية: Streptococcus pneumoniae, serotype, Jordan, invasive pneumococcal disease, pediatrics, Medicine
وصف الملف: electronic resource
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المصدر: DTCO and Computational Patterning II.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::e3e70f40fbc60432a3b543006f2901ca
https://doi.org/10.1117/12.2659397 -
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المؤلفون: Lynn T. N. Wang, Klaus-Peter Johnsen, Ivan Tanev, Fadi Batarseh, Chang Su, Pouya Rezaeifakhr, Uwe Paul Schroeder
المصدر: DTCO and Computational Patterning II.
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::ea2ee437179c5938d9cd6e589f249426
https://doi.org/10.1117/12.2658646 -
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المؤلفون: Piyush Pathak, Uwe Paul Schroeder, Fadi Batarseh, Philippe Hurat, Jeffrey E. Nelson, Sriram Madhavan, Ya-Chieh Lai
المصدر: Design-Process-Technology Co-optimization XV.
مصطلحات موضوعية: Similarity (network science), Computer science, Metric (mathematics), Pattern matching, Semi-supervised learning, Approximate string matching, Physical design, Cluster analysis, Algorithm, Ranking (information retrieval)
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::40d43d18d5b04c9fb948289250bf8f06
https://doi.org/10.1117/12.2586112 -
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المؤلفون: Neerja Bawaskar, Fadi Batarseh, Davide Pacifico, Atul Chittora, Shenghua Song, Monisa Ramesh Babu, Shobhit Malik, Janam Bakshi
المصدر: International Symposium for Testing and Failure Analysis.
مصطلحات موضوعية: Computer science, business.industry, Pattern analysis, Pattern recognition, Artificial intelligence, business, Fault detection and isolation
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::1eb74727b7dd90ec74ef311d74d9c631
https://doi.org/10.31399/asm.cp.istfa2020p0352 -
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المؤلفون: Janam Bakshi, Fadi Batarseh, Uwe Paul Schroeder, Ahmed Mounir Elsemary
المصدر: Design-Process-Technology Co-optimization for Manufacturability XIV.
مصطلحات موضوعية: Router, Matching (statistics), Mode (computer interface), Computer science, Distributed computing, Retargeting, Point (geometry), State (computer science), Pattern matching, Place and route
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::37412d3d5eddf5922624aab96d714c04
https://doi.org/10.1117/12.2551739 -
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المؤلفون: Fadi Batarseh, Joshua J. Daspit, John M. Usher
المصدر: Journal of Knowledge Management. 21:1342-1361
مصطلحات موضوعية: Knowledge management, Computer science, business.industry, Strategy and Management, 05 social sciences, Sample (statistics), Field survey, Survey methodology, Absorptive capacity, Management of Technology and Innovation, 0502 economics and business, 050211 marketing, business, Practical implications, 050203 business & management, Diversity (business)
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المؤلفون: Fadi Batarseh, Joshua J. Daspit, John M. Usher
المصدر: International Journal of Management Science and Engineering Management. 13:1-10
مصطلحات موضوعية: Information Systems and Management, Knowledge management, business.industry, Strategy and Management, Mechanical Engineering, 05 social sciences, 050109 social psychology, Management Science and Operations Research, Functional diversity, Absorptive capacity, 0502 economics and business, 0501 psychology and cognitive sciences, Business, Engineering (miscellaneous), 050203 business & management
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المؤلفون: Fadi Batarseh, Mohamed Ismail, Uwe Paul Schroeder, Janam Bakshi, Nishant Shah, Jason P. Cain, Ahmed Mohyeldin, Ahmed Mounir Elsemary, Moutaz Fakhry
المصدر: Design-Process-Technology Co-optimization for Manufacturability XII.
مصطلحات موضوعية: Bar (music), Computer science, business.industry, Flow (psychology), 02 engineering and technology, 021001 nanoscience & nanotechnology, 020202 computer hardware & architecture, Design for manufacturability, 0202 electrical engineering, electronic engineering, information engineering, Redundancy (engineering), 0210 nano-technology, business, Lithography, Computer hardware
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::f80133cabf9ca3ab15181d9527aac3d2
https://doi.org/10.1117/12.2297499 -
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المؤلفون: Pietro Babighian, Muhammed Pallachali, Nicolai Petrov, Tamer Desouky, Teck Jung Tang, Fadi Batarseh, Deborah Ryan, Shweta Shokale, Mark Terry, Haizhou Yin, Rohan Deshpande, Jiechang Hou, Yixiao Zhang, Sang-Kee Eah, Rao Desineni, Feng Wang, Ahmed Khalil
المصدر: Photomask Technology.
مصطلحات موضوعية: Engineering, Engineering drawing, Yield (engineering), Silicon, business.industry, chemistry.chemical_element, Edge (geometry), chemistry, Electronic engineering, Process control, Process window, Upstream (networking), Wafer, business, Aerial image
URL الوصول: https://explore.openaire.eu/search/publication?articleId=doi_________::379ffba485daca644e6c71206a0b34f3
https://doi.org/10.1117/12.2280568