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1دورية أكاديمية
المؤلفون: Fagerlind, M., Booker, I., Bergman, P., Janzen, E., Zirath, H., Rorsman, N.
المصدر: IEEE Transactions on Device and Materials Reliability IEEE Trans. Device Mater. Relib. Device and Materials Reliability, IEEE Transactions on. 12(3):538-546 Sep, 2012
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2دورية أكاديمية
المؤلفون: Thorsell, M., Andersson, K., Fagerlind, M., Sudow, M., Nilsson, P.-A., Rorsman, N.
المصدر: IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 57(1):19-26 Jan, 2009
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3دورية أكاديمية
المؤلفون: Sudow, M., Andersson, K., Fagerlind, M., Thorsell, M., Nilsson, P.-Å., Rorsman, N.
المصدر: IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 56(10):2201-2206 Oct, 2008
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4دورية أكاديمية
المؤلفون: Sudow, M., Fagerlind, M., Thorsell, M., Andersson, K., Billstrom, N., Nilsson, P.-Å., Rorsman, N.
المصدر: IEEE Transactions on Microwave Theory and Techniques IEEE Trans. Microwave Theory Techn. Microwave Theory and Techniques, IEEE Transactions on. 56(8):1827-1833 Aug, 2008
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5دورية أكاديمية
المؤلفون: Felbinger, J. G., Fagerlind, M., Axelsson, O., Rorsman, N., Gao, X., Guo, S., Schaff, W. J., Eastman, L. F.
المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 32(7):889-891 Jul, 2011
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6دورية أكاديمية
المؤلفون: Thorsell, M., Fagerlind, M., Andersson, K., Billstrom, N., Rorsman, N.
المصدر: IEEE Microwave and Wireless Components Letters IEEE Microw. Wireless Compon. Lett. Microwave and Wireless Components Letters, IEEE. 20(1):55-57 Jan, 2010
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7مؤتمر
المؤلفون: Thorsell, M., Andersson, K., Fagerlind, M., Sudow, M., Nilsson, P-A., Rorsman, N.
المصدر: 2008 Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits Integrated Nonlinear Microwave and Millimetre-Wave Circuits, 2008. INMMIC 2008. Workshop on. :17-20 Nov, 2008
Relation: 2008 Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits (INMMIC)
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8مؤتمر
المؤلفون: Dammann, M., Pletschen, W., Waltereit, P., Bronner, W., Quay, R., Muller, S., Mikulla, M., Ambacher, O., van der Wel , P.J., Murad, S., Rodle, T., Behtash, R., Bourgeois, F., Riepe, K., Fagerlind, M., Sveinbjornsson, E.O.
المصدر: 2008 ROCS Workshop [Reliability of Compound Semiconductors Workshop] ROCS Workshop, 2008 [Reliability of Compound Semiconductors Workshop]. :25-44 Oct, 2008
Relation: 2008 Reliability of Compound Semiconductors Workshop (ROCS)
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9مؤتمر
المؤلفون: Thorsell, M., Andersson, K., Fagerlind, M., Sudow, M., Nilsson, P.-A., Rorsman, N.
المصدر: 2008 IEEE MTT-S International Microwave Symposium Digest Microwave Symposium Digest, 2008 IEEE MTT-S International. :463-466 Jun, 2008
Relation: 2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008
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10دورية أكاديمية
المؤلفون: Dammann, M., Baeumler, M., Brückner, P., Bronner, W., Maroldt, S., Konstanzer, H., Wespel, M., Quay, R., Mikulla, M., Graff, A., Lorenzini, M., Fagerlind, M., van der Wel, P.J., Roedle, T.
المصدر: In Microelectronics Reliability August-September 2015 55(9-10):1667-1671
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