المؤلفون: CAI, M., FAN, S., XIAO, G., HU, K.

المصدر: Advances in Electrical and Computer Engineering, Vol 23, Iss 2, Pp 101-108 (2023)

مصطلحات موضوعية: adaptive exploration, deep reinforcement learning, markov decision process, path planning, reward function, Electrical engineering. Electronics. Nuclear engineering, TK1-9971, Computer engineering. Computer hardware, TK7885-7895

وصف الملف: electronic resource

Relation: https://doaj.org/toc/1582-7445; https://doaj.org/toc/1844-7600

URL الوصول: https://doaj.org/article/bbe295e6c9234856aa90a1e6349e12c7

المؤلفون: Fan, S., Guo, S., He, J., Wei, J., Wen, L.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 24(17):28363-28372 Sep, 2024

المؤلفون: Fan, S., Wang, T., Qin, C., Qiu, J., Li, M.

المصدر: IEEE Transactions on Fuzzy Systems IEEE Trans. Fuzzy Syst. Fuzzy Systems, IEEE Transactions on. 32(9):5248-5258 Sep, 2024

المؤلفون: Fan, S., Ni, J., Tian, H.

المصدر: IEEE Internet of Things Journal IEEE Internet Things J. Internet of Things Journal, IEEE. 11(17):28555-28565 Sep, 2024

المؤلفون: Fan, S., Li, Z., Yu, C., Li, D., Zhang, Y., Wen, D., Shao, Z.

المصدر: IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 39(9):10675-10681 Sep, 2024

المؤلفون: Fan, S., Xu, W., Xie, R., Jin, S., Ng, D.W.K., Al-Dhahir, N.

المصدر: IEEE Transactions on Communications IEEE Trans. Commun. Communications, IEEE Transactions on. 72(9):5564-5580 Sep, 2024

المؤلفون: Tang, Q., Deng, C., Wang, Y., Guo, F., Fan, S.

المصدر: IEEE Transactions on Smart Grid IEEE Trans. Smart Grid Smart Grid, IEEE Transactions on. 15(5):4744-4753 Sep, 2024

المؤلفون: Huang, M., Han, X., Zhao, L., Fan, S., Xia, Y., Qiao, Z., Li, W., Gao, Y., Yang, P., Chen, S., Cui, Z., Zhang, C., Li, Z., Hou, X.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 24(16):25476-25485 Aug, 2024

المؤلفون: Khuntia, S., Fan, S., Juan, P., Liou, C., Huang, Y., Singh, K., Ogwo, C., Tai, L.

المصدر: IEEE Sensors Journal IEEE Sensors J. Sensors Journal, IEEE. 24(16):25911-25919 Aug, 2024

المؤلفون: Sun, W., Yu, J., Dong, D., Zheng, X., Lai, J., Fan, S., Wang, H., Gao, J., Liu, J., Xu, X.

المصدر: IEEE Electron Device Letters IEEE Electron Device Lett. Electron Device Letters, IEEE. 45(8):1445-1448 Aug, 2024