المؤلفون: Dunne, S., Soulat, F., Caparrini, M., Germain, O., Farres, E., Barroso, X., Ruffini, G.

المصدر: Europe Oceans 2005 Oceans 2005 Oceans 2005 - Europe. 2:1351-1356 Vol. 2 2005

Relation: Oceans 2005 - Europe

المؤلفون: Ruffini, G., Dunne, S., Farres, E., Cester, I., Watts, P.C.P., Ravi, S., Silva, P., Grau, C., Fuentemilla, L., Marco-Pallares, J., Vandecasteele, B.

المصدر: 2007 29th Annual International Conference of the IEEE Engineering in Medicine and Biology Society Engineering in Medicine and Biology Society, 2007. EMBS 2007. 29th Annual International Conference of the IEEE. :6689-6693 Aug, 2007

Relation: 2007 29th Annual International Conference of the IEEE Engineering in Medicine and Biology Society

المؤلفون: Caparrini, M., Egido, A., Soulat, F., Germain, O., Farres, E., Dunne, S., Ruffini, G.

المصدر: 2007 IEEE International Geoscience and Remote Sensing Symposium Geoscience and Remote Sensing Symposium, 2007. IGARSS 2007. IEEE International. :5080-5083 Jul, 2007

Relation: 2007 IEEE International Geoscience and Remote Sensing Symposium

المؤلفون: Ruffini, G., Dunne, S., Fuentemilla, L., Grau, C., Farres, E., Marco-Pallares, J., Watts, P. C. P., Silva, S. R. P.

مصطلحات موضوعية: Physics - Medical Physics, Physics - Instrumentation and Detectors

URL الوصول: http://arxiv.org/abs/physics/0701159

المؤلفون: Barniol, N., Sune, J., Farres, E., Placencia, I., Aymerich, X.

المصدر: Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Conduction and Breakdown in Solid Dielectrics, 1989., Proceedings of the 3rd International Conference on. :168-172 1989

Relation: Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics

المؤلفون: Sune, J., Placencia, I., Farres, E., Barniol, N., Aymerich, X.

المصدر: Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics Conduction and Breakdown in Solid Dielectrics, 1989., Proceedings of the 3rd International Conference on. :364-368 1989

Relation: Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics

المؤلفون: Farres, E.^Aff2, Serra-Graells, F.^Aff2, Uranga, A.^Aff3, Barniol, N.^Aff3

المساهمون: Mouthaan, Ton J., editor^Aff1, Salm, Cora, editor^Aff1

المصدر: Microelectronics Education : Proceedings of the 2nd European Workshop held in Noordwijkerhout, The Netherlands, 14–15 May 1998. :173-176

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المؤلفون: Ruffini, G., Dunne, S., Farres, E., Watts, P.C.P., Mendoza, E., Silva, S.R.P., Grau, C., Marco-Pallares, J., Fuentemilla, L., Vandecasteele, B.

المصدر: 2006 International Conference of the IEEE Engineering in Medicine & Biology Society; 2006, p1826-1829, 4p