يعرض 1 - 10 نتائج من 329 نتيجة بحث عن '"Fathipour, M."', وقت الاستعلام: 1.23s تنقيح النتائج
  1. 1
    مؤتمر
    The transport and optical sensing properties of blue phosphorene: A first-principles study

    المؤلفون: Safari, F., Moradinasab, M., Fathipour, M., Schwalke, U.

    المصدر: 2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS) Design & Technology of Integrated Systems In Nanoscale Era (DTIS), 2019 14th International Conference on. :1-4 Apr, 2019

    Relation: 2019 14th International Conference on Design & Technology of Integrated Systems In Nanoscale Era (DTIS)

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  2. 2
    دورية أكاديمية
    Negative Capacitance Double-Gate Junctionless FETs: A Charge-Based Modeling Investigation of Swing, Overdrive and Short Channel Effect

    المؤلفون: Rassekh, A., Sallese, J., Jazaeri, F., Fathipour, M., Ionescu, A.M.

    المصدر: IEEE Journal of the Electron Devices Society IEEE J. Electron Devices Soc. Electron Devices Society, IEEE Journal of the. 8:939-947 2020

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  3. 3
    دورية أكاديمية
    Modeling Interface Charge Traps in Junctionless FETs, Including Temperature Effects

    المؤلفون: Rassekh, A., Jazaeri, F., Fathipour, M., Sallese, J.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(11):4653-4659 Nov, 2019

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  4. 4
    دورية أكاديمية
    An Analytical Drain Current Model for the Cylindrical Channel Gate-All-Around Heterojunction Tunnel FETs

    المؤلفون: Keighobadi, D., Mohammadi, S., Fathipour, M.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 66(8):3646-3651 Aug, 2019

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  5. 5
    دورية أكاديمية
    A Numerical Analysis of Electronic and Optical Properties of the Zigzag MoS2 Nanoribbon Under Uniaxial Strain

    المؤلفون: Nayeri, M., Fathipour, M.

    المصدر: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(5):1988-1994 May, 2018

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  6. 6
    مؤتمر
    Modelling the effect of 1 MeV electron irradiation on the performance degradation of a single junction AlxGa1−xAs/GaAs solar cell

    المؤلفون: Elahidoost, A., Fathipour, M., Mojab, A.

    المصدر: 20th Iranian Conference on Electrical Engineering (ICEE2012) Electrical Engineering (ICEE), 2012 20th Iranian Conference on. :113-117 May, 2012

    Relation: 2012 20th Iranian Conference on Electrical Engineering (ICEE)

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  7. 7
    مؤتمر
    Leakage current reduction in domino logic

    المؤلفون: Mohammadzamani, M. J., Tabatabaei, S. M., Fathipour, M.

    المصدر: 20th Iranian Conference on Electrical Engineering (ICEE2012) Electrical Engineering (ICEE), 2012 20th Iranian Conference on. :198-201 May, 2012

    Relation: 2012 20th Iranian Conference on Electrical Engineering (ICEE)

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  8. 8
    مؤتمر
    Analysis of a source hetrojunction LDMOS device with strained silicon channel

    المؤلفون: Fathipour, V., Malakoutian, M. A., Fathipour, S., Fathipour, M.

    المصدر: 2011 19th Iranian Conference on Electrical Engineering Electrical Engineering (ICEE), 2011 19th Iranian Conference on. :1-5 May, 2011

    Relation: 2011 19th Iranian Conference on Electrical Engineering (ICEE)

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  9. 9
    مؤتمر
    On the role of line-edge roughness on the diffusion and localization in GNRs

    المؤلفون: Pourfath, M., Yazdanpanah, A., Fathipour, M., Kosina, H.

    المصدر: 2010 14th International Workshop on Computational Electronics Computational Electronics (IWCE), 2010 14th International Workshop on. :1-4 Oct, 2010

    Relation: 2010 International Workshop on Computational Electronics (IWCE)

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  10. 10
    مؤتمر
    The influence of the stacked and double material gate structures on the short channel effects in SOI MOSFETs

    المؤلفون: Behnam, A., Fathi, E., Hashemi, P., Esfandiarpoor, B., Fathipour, M.

    المصدر: Proceedings. The 16th International Conference on Microelectronics, 2004. ICM 2004. Microelectronics Microelectronics, 2004. ICM 2004 Proceedings. The 16th International Conference on. :68-71 2004

    Relation: The 16th International Conference on Microelectronics

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