المؤلفون: Traynor, Stephen, Ramesh, Saidapet, Hernandez, Maryfe, Herr, Lawrence, Chen, Scott

المصدر: 2024 IEEE 42nd VLSI Test Symposium (VTS) VLSI Test Symposium (VTS), 2024 IEEE 42nd. :1-5 Apr, 2024

Relation: 2024 IEEE 42nd VLSI Test Symposium (VTS)

المؤلفون: Huang, Y., Lin, L., Xu, L., Hsieh, S.

المصدر: IEEE Transactions on Reliability IEEE Trans. Rel. Reliability, IEEE Transactions on. 73(1):279-289 Mar, 2024

المؤلفون: Nabhan, Roukoz, Dutertre, Jean-Max, Rigaud, Jean-Baptiste, Danger, Jean-Luc, Sauvage, Laurent

المصدر: 2023 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) FDTC Fault Detection and Tolerance in Cryptography (FDTC), 2023 Workshop on. :1-12 Sep, 2023

Relation: 2023 Workshop on Fault Detection and Tolerance in Cryptography (FDTC)

المؤلفون: Li, Yong, Li, Huixin, Chen, Xiangwen, Wang, Yingying, Chen, Lei, Yang, Man, Tang, Jingguang

المصدر: 2023 2nd Asian Conference on Frontiers of Power and Energy (ACFPE) Frontiers of Power and Energy (ACFPE), 2023 2nd Asian Conference on. :426-432 Oct, 2023

Relation: 2023 2nd Asian Conference on Frontiers of Power and Energy (ACFPE)

المؤلفون: Ota, Natsuki, Hosokawa, Toshinori, Yamazaki, Koji, Yamauchi, Yukari, Arai, Masayuki

المصدر: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2023 IEEE International Symposium on. :1-6 Oct, 2023

Relation: 2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)

المؤلفون: Hong, Hao-Chiao, Chen, Chien-Hung, Chen, Yu-Wun

المصدر: 2023 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2023 IEEE International. :1-5 Sep, 2023

Relation: 2023 IEEE International Test Conference in Asia (ITC-Asia)

المؤلفون: Chancel, G., Galliere, J.-M., Maurine, P.

المصدر: 2023 Workshop on Fault Detection and Tolerance in Cryptography (FDTC) FDTC Fault Detection and Tolerance in Cryptography (FDTC), 2023 Workshop on. :48-59 Sep, 2023

Relation: 2023 Workshop on Fault Detection and Tolerance in Cryptography (FDTC)

المؤلفون: Zhang, J., Ji, X., Wang, J., Li, J., Wang, N.

المصدر: IEEE Transactions on Intelligent Transportation Systems IEEE Trans. Intell. Transport. Syst. Intelligent Transportation Systems, IEEE Transactions on. 24(11):12900-12911 Nov, 2023

المؤلفون: Qin, Y., Li, G., Jia, C., Mckeever, P.

المصدر: IEEE Transactions on Industrial Electronics IEEE Trans. Ind. Electron. Industrial Electronics, IEEE Transactions on. 70(11):10981-10991 Nov, 2023

المؤلفون: Behravan, Ali, Kiamanesh, Bahareh, Bhandari, Siddharth, Obermaisser, Roman

المصدر: 2023 Congress in Computer Science, Computer Engineering, & Applied Computing (CSCE) CSCE Computer Science, Computer Engineering, & Applied Computing (CSCE), 2023 Congress in. :937-944 Jul, 2023

Relation: 2023 Congress in Computer Science, Computer Engineering, & Applied Computing (CSCE)