المؤلفون: Veronesi, A., Dall'Occo, F., Bertozzi, D., Favalli, M., Krstic, M.

المصدر: 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS) Design and Diagnostics of Electronic Circuits and Systems (DDECS), 2022 25th International Symposium on. :142-147 Apr, 2022

Relation: 2022 25th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)

المؤلفون: Bevilacqua, A.^{Aff1, IDs00445024017419_cor1}, Nannipieri, L., Favalli, M., Fornaciai, A.

المصدر: Bulletin of Volcanology: Official Journal of the International Association of Volcanology and Chemistry of the Earth`s Interior (IAVCEI). 86(5)

المؤلفون: Miorandi, G., Celin, A., Favalli, M., Bertozzi, D.

المصدر: 2016 Tenth IEEE/ACM International Symposium on Networks-on-Chip (NOCS) Networks-on-Chip (NOCS), 2016 Tenth IEEE/ACM International Symposium on. :1-8 Sep, 2016

Relation: 2016 Tenth IEEE/ACM International Symposium on Networks-on-Chip (NOCS)

المؤلفون: Kolzenburg, S., Favalli, M., Fornaciai, A., Isola, I., Harris, A.J.L., Nannipieri, L., Giordano, D.

المصدر: IEEE Transactions on Geoscience and Remote Sensing IEEE Trans. Geosci. Remote Sensing Geoscience and Remote Sensing, IEEE Transactions on. 54(11):6687-6699 Nov, 2016

المؤلفون: Colini, L., Spinetti, C., Doumaz, F., Amici, S., Ananasso, C., Buongiorno, M. F., Cafaro, P., Caltabiano, T., Curci, G., D'Andrea, S., Favalli, M., Giammanco, S., Isola, I., La Spina, A., Lombardo, V., Mancini, M., Mazzarini, F., Musacchio, M., Neri, M., Puglisi, G., Salerno, G., Sarli, V., Silvestri, M., Teggi, S.

المصدر: 2013 IEEE International Geoscience and Remote Sensing Symposium - IGARSS Geoscience and Remote Sensing Symposium (IGARSS), 2013 IEEE International. :4427-4430 Jul, 2013

Relation: IGARSS 2013 - 2013 IEEE International Geoscience and Remote Sensing Symposium

المؤلفون: Strano, A., Gomez, C., Ludovici, D., Favalli, M., Gomez, M. E., Bertozzi, D.

المصدر: 2011 Design, Automation & Test in Europe Design, Automation & Test in Europe Conference & Exhibition (DATE), 2011. :1-6 Mar, 2011

Relation: 2011 Design, Automation & Test in Europe Conference & Exhibition (DATE 2011)

المؤلفون: Favalli, M.

المصدر: 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. Defect and Fault Tolerance in VLSI Systems Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on. :191-199 2004

Relation: Proceedings. 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

المؤلفون: Favalli, M.

المصدر: 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. Defect and Fault Tolerance in VLSI Systems Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on. :366-376 2004

Relation: Proceedings. 19th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems

المؤلفون: Favalli, M., Metra, C.

المصدر: Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition Design, automation and test in Europe conference Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings. :612-617 2002

Relation: Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition

المؤلفون: Metra, C., Schiano, L., Favalli, M., Ricco, B.

المصدر: Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition Design, automation and test in Europe conference Design, Automation and Test in Europe Conference and Exhibition, 2002. Proceedings. :832-836 2002

Relation: Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition